Li, C., Cheng, J., Zhu, H., Wen, B., Zhao, X., & Kang, W. (2025). Degradation modeling and remaining useful life prediction for electronic device under multiple stress influences. Scientific reports, 15(1), 19117-16. https://doi.org/10.1038/s41598-025-03786-y
Citace podle Chicago (17th ed.)Li, Changjun, Jinjun Cheng, Haizhen Zhu, Bincheng Wen, Xin Zhao, a Weijie Kang. "Degradation Modeling and Remaining Useful Life Prediction for Electronic Device Under Multiple Stress Influences." Scientific Reports 15, no. 1 (2025): 19117-16. https://doi.org/10.1038/s41598-025-03786-y.
Citace podle MLA (9th ed.)Li, Changjun, et al. "Degradation Modeling and Remaining Useful Life Prediction for Electronic Device Under Multiple Stress Influences." Scientific Reports, vol. 15, no. 1, 2025, pp. 19117-16, https://doi.org/10.1038/s41598-025-03786-y.