APA (7th ed.) Citation

Li, C., Cheng, J., Zhu, H., Wen, B., Zhao, X., & Kang, W. (2025). Degradation modeling and remaining useful life prediction for electronic device under multiple stress influences. Scientific reports, 15(1), 19117-16. https://doi.org/10.1038/s41598-025-03786-y

Chicago Style (17th ed.) Citation

Li, Changjun, Jinjun Cheng, Haizhen Zhu, Bincheng Wen, Xin Zhao, and Weijie Kang. "Degradation Modeling and Remaining Useful Life Prediction for Electronic Device Under Multiple Stress Influences." Scientific Reports 15, no. 1 (2025): 19117-16. https://doi.org/10.1038/s41598-025-03786-y.

MLA (9th ed.) Citation

Li, Changjun, et al. "Degradation Modeling and Remaining Useful Life Prediction for Electronic Device Under Multiple Stress Influences." Scientific Reports, vol. 15, no. 1, 2025, pp. 19117-16, https://doi.org/10.1038/s41598-025-03786-y.