APA (7th ed.) Citation

Krause, L., Tolborg, K., Grønbech, T. B. E., Sugimoto, K., Iversen, B. B., & Overgaard, J. (2020). Accurate high‐resolution single‐crystal diffraction data from a Pilatus3 X CdTe detector. Journal of applied crystallography, 53(3), 635-649. https://doi.org/10.1107/S1600576720003775

Chicago Style (17th ed.) Citation

Krause, Lennard, Kasper Tolborg, Thomas Bjørn Egede Grønbech, Kunihisa Sugimoto, Bo Brummerstedt Iversen, and Jacob Overgaard. "Accurate High‐resolution Single‐crystal Diffraction Data from a Pilatus3 X CdTe Detector." Journal of Applied Crystallography 53, no. 3 (2020): 635-649. https://doi.org/10.1107/S1600576720003775.

MLA (9th ed.) Citation

Krause, Lennard, et al. "Accurate High‐resolution Single‐crystal Diffraction Data from a Pilatus3 X CdTe Detector." Journal of Applied Crystallography, vol. 53, no. 3, 2020, pp. 635-649, https://doi.org/10.1107/S1600576720003775.