Aberration correction in stimulated emission depletion microscopy to increase imaging depth in living brain tissue

Significance: Stimulated emission depletion (STED) microscopy enables nanoscale imaging of live samples, but it requires a specific spatial beam shaping that is highly sensitive to optical aberrations, limiting its depth penetration. Therefore, there is a need for methods to reduce optical aberratio...

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Vydané v:	Neurophotonics (Print) Ročník 8; číslo 3; s. 035001
Hlavní autori:	Bancelin, Stéphane, Mercier, Luc, Murana, Emanuele, Nägerl, U. Valentin
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	Bellingham Society of Photo-Optical Instrumentation Engineers 01.07.2021 S P I E - International Society for Society of Photo-optical Instrumentation Engineers (SPIE)
Predmet:	Approximation Astigmatism Brain slice preparation Engineering Sciences Lasers Microscopy Morphology Nanoparticles Neuroimaging Optics Photonic Photonics Polynomials Research Papers Spatial discrimination aberration correction stimulated emission depletion microscopy brain slice imaging
ISSN:	2329-423X, 2329-4248
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