Stanchu, H., Kladko, V., Kuchuk, A. V., Safriuk, N., Belyaev, A., Wierzbicka, A., . . . Zytkiewicz, Z. R. (2015). High-resolution X-ray diffraction analysis of strain distribution in GaN nanowires on Si(111) substrate. Nanoscale research letters, 10(1), 51. https://doi.org/10.1186/s11671-015-0766-x
Citace podle Chicago (17th ed.)Stanchu, Hryhorii, Vasyl Kladko, Andrian V. Kuchuk, Nadiia Safriuk, Alexander Belyaev, Aleksandra Wierzbicka, Marta Sobanska, Kamil Klosek, a Zbigniew R. Zytkiewicz. "High-resolution X-ray Diffraction Analysis of Strain Distribution in GaN Nanowires on Si(111) Substrate." Nanoscale Research Letters 10, no. 1 (2015): 51. https://doi.org/10.1186/s11671-015-0766-x.
Citace podle MLA (9th ed.)Stanchu, Hryhorii, et al. "High-resolution X-ray Diffraction Analysis of Strain Distribution in GaN Nanowires on Si(111) Substrate." Nanoscale Research Letters, vol. 10, no. 1, 2015, p. 51, https://doi.org/10.1186/s11671-015-0766-x.