An Overview on Time-Resolved Optical Analysis of HiPIMS Discharge

The progress in the time‐resolved characterization of HiPIMS discharges performed during the last decade in our group is overviewed. Optical emission and absorption spectroscopy, as well as laser‐induced fluorescence‐based techniques have been mainly utilized. The results covering such important asp...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Veröffentlicht in:Plasma processes and polymers Jg. 12; H. 9; S. 1010 - 1027
Hauptverfasser: Britun, Nikolay, Konstantinidis, Stephanos, Snyders, Rony
Format: Journal Article
Sprache:Englisch
Veröffentlicht: Weinheim Blackwell Publishing Ltd 01.09.2015
Wiley Subscription Services, Inc
Schlagworte:
ISSN:1612-8850, 1612-8869
Online-Zugang:Volltext
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
Abstract The progress in the time‐resolved characterization of HiPIMS discharges performed during the last decade in our group is overviewed. Optical emission and absorption spectroscopy, as well as laser‐induced fluorescence‐based techniques have been mainly utilized. The results covering such important aspects of the HiPIMS discharge as the density evolution of the discharge species, their ionization and excitation, propagation of secondary electrons in the discharge volume, dynamics of velocity distribution of the discharge species, gas rarefaction, etc. are discussed. The two‐dimensional distributions of Ti and Ti ion density as a typical example of sputtered particles in HiPIMS discharge. This figure demonstrates spatial complementarity of neutral and ionized sputtered atoms in the discharge volume at low pressure (5 mTorr). The paper mainly deals with temporal and spatial behavior of the ground state species in HiPIMS discharges.
AbstractList The progress in the time-resolved characterization of HiPIMS discharges performed during the last decade in our group is overviewed. Optical emission and absorption spectroscopy, as well as laser-induced fluorescence-based techniques have been mainly utilized. The results covering such important aspects of the HiPIMS discharge as the density evolution of the discharge species, their ionization and excitation, propagation of secondary electrons in the discharge volume, dynamics of velocity distribution of the discharge species, gas rarefaction, etc. are discussed.
The progress in the time-resolved characterization of HiPIMS discharges performed during the last decade in our group is overviewed. Optical emission and absorption spectroscopy, as well as laser-induced fluorescence-based techniques have been mainly utilized. The results covering such important aspects of the HiPIMS discharge as the density evolution of the discharge species, their ionization and excitation, propagation of secondary electrons in the discharge volume, dynamics of velocity distribution of the discharge species, gas rarefaction, etc. are discussed. The two-dimensional distributions of Ti and Ti ion density as a typical example of sputtered particles in HiPIMS discharge. This figure demonstrates spatial complementarity of neutral and ionized sputtered atoms in the discharge volume at low pressure (5 mTorr). The paper mainly deals with temporal and spatial behavior of the ground state species in HiPIMS discharges.
The progress in the time‐resolved characterization of HiPIMS discharges performed during the last decade in our group is overviewed. Optical emission and absorption spectroscopy, as well as laser‐induced fluorescence‐based techniques have been mainly utilized. The results covering such important aspects of the HiPIMS discharge as the density evolution of the discharge species, their ionization and excitation, propagation of secondary electrons in the discharge volume, dynamics of velocity distribution of the discharge species, gas rarefaction, etc. are discussed. The two‐dimensional distributions of Ti and Ti ion density as a typical example of sputtered particles in HiPIMS discharge. This figure demonstrates spatial complementarity of neutral and ionized sputtered atoms in the discharge volume at low pressure (5 mTorr). The paper mainly deals with temporal and spatial behavior of the ground state species in HiPIMS discharges.
Author Britun, Nikolay
Konstantinidis, Stephanos
Snyders, Rony
Author_xml – sequence: 1
  givenname: Nikolay
  surname: Britun
  fullname: Britun, Nikolay
  email: nikolay.britun@umons.ac.be
  organization: Chimie des Interactions Plasma-Surface (ChIPS), CIRMAP, Université de Mons, 23 Place du Parc, B-7000 Mons, Belgium
– sequence: 2
  givenname: Stephanos
  surname: Konstantinidis
  fullname: Konstantinidis, Stephanos
  organization: Chimie des Interactions Plasma-Surface (ChIPS), CIRMAP, Université de Mons, 23 Place du Parc, B-7000 Mons, Belgium
– sequence: 3
  givenname: Rony
  surname: Snyders
  fullname: Snyders, Rony
  organization: Chimie des Interactions Plasma-Surface (ChIPS), CIRMAP, Université de Mons, 23 Place du Parc, B-7000 Mons, Belgium
BookMark eNqFkMtOwzAQRS0EEqWwZR2JDZuUcRzHyTLi0VY8WvHeWSaZgEsaBztt6d-TqqhCSIjVzOKcq5m7R7YrUyEhhxR6FCA4qWtV9wKgHAA43SIdGtHAj-Mo2d7sHHbJnnMTAAY8hg5J08obzdHONS48U3n3eor-LTpTzjH3RnWjM1V6aaXKpdPOM4U30OPh9Z13pl32puwr7pOdQpUOD75nlzxcnN-fDvyrUX94ml75GQ9C6oc8T8IYOTCWsEihSEQeIsRBoULgRYTAw4DGOeQRL4oEXgQypqIQsgSEKijrkuN1bm3NxwxdI6ftCViWqkIzc5IKzjiLA5G06NEvdGJmtv1hRVEmGI1btEvCNZVZ45zFQma6UY02VWOVLiUFuepVrnqVm15brfdLq62eKrv8W0jWwkKXuPyHluNxOv7p-mtXuwY_N66y7zISTHD5dNOXg2f6eAlngbxkXyTqmUw
CitedBy_id crossref_primary_10_1016_j_surfcoat_2021_127638
crossref_primary_10_1088_2058_6272_aa9e48
crossref_primary_10_1088_1361_6595_ab8fbb
crossref_primary_10_1088_1361_6595_ac9c2b
crossref_primary_10_1063_1_4938250
crossref_primary_10_1063_5_0198423
crossref_primary_10_1063_5_0096128
crossref_primary_10_1116_1_5016241
crossref_primary_10_1063_5_0009380
crossref_primary_10_1016_j_tsf_2017_09_027
crossref_primary_10_1088_1361_6463_aba01e
crossref_primary_10_1116_1_5020151
crossref_primary_10_1063_5_0273474
crossref_primary_10_1088_1361_6463_aa7544
crossref_primary_10_1088_1361_6595_acc686
crossref_primary_10_1063_1_4977825
crossref_primary_10_1088_1361_6595_ab54e8
crossref_primary_10_1016_j_scriptamat_2023_115578
crossref_primary_10_1016_j_tsf_2019_137501
crossref_primary_10_1116_1_5121226
crossref_primary_10_1038_s41598_017_17846_5
crossref_primary_10_1063_1_4996186
crossref_primary_10_1088_1361_6463_aa560c
crossref_primary_10_1063_5_0006586
crossref_primary_10_1088_1757_899X_387_1_012029
crossref_primary_10_1063_1_4977819
Cites_doi 10.1088/0022-3727/47/22/224001
10.1063/1.4919006
10.1016/j.surfcoat.2014.04.015
10.1088/0963-0252/17/3/035021
10.1088/0022-3727/40/17/015
10.1063/1.3656446
10.1063/1.1729530
10.1063/1.2907505
10.1002/ppap.200600103
10.1109/TPS.2005.845022
10.1063/1.3000446
10.1088/0022-3727/46/8/084007
10.1016/j.tsf.2014.02.063
10.1088/0963-0252/18/2/025008
10.1134/S1063780X11060122
10.1016/j.vacuum.2009.12.022
10.1016/S0584-8547(02)00087-3
10.1088/0022-3727/38/18/015
10.1016/j.tsf.2006.03.033
10.1016/S0257-8972(99)00292-3
10.1088/0963-0252/18/4/045025
10.1116/1.572994
10.1016/j.surfcoat.2009.11.013
10.1088/0022-3727/33/9/201
10.1088/0022-3727/41/18/185201
10.1088/0963-0252/21/3/035017
10.1116/1.574104
10.1063/1.2162671
10.1088/0963-0252/14/2/021
10.1016/S0042-207X(98)00408-4
10.1088/0963-0252/18/4/045008
10.1002/ppap.200730806
10.1063/1.1646452
10.1016/j.surfcoat.2014.02.020
10.1016/j.surfcoat.2014.08.043
10.1016/j.sab.2005.01.004
10.1016/S0257-8972(03)00690-X
10.1063/1.2404583
10.1063/1.2035311
10.1016/j.tsf.2010.06.055
10.1088/0022-3727/43/12/124012
10.1016/j.sab.2015.02.016
10.1088/0963-0252/21/2/025010
10.1116/1.3691832
10.1016/0030-4018(80)90319-3
10.1364/OL.39.006146
10.1063/1.4812579
10.1088/0022-3727/42/18/185202
10.1016/S0042-207X(99)00189-X
10.1063/1.4919007
10.1088/0963-0252/19/2/025010
10.1063/1.2159555
10.1088/0963-0252/17/4/045013
10.1088/0022-3727/46/21/215201
10.1143/JJAP.44.L737
10.1063/1.4819835
10.1063/1.4821514
10.1016/j.surfcoat.2011.03.081
10.1016/j.surfcoat.2008.05.009
10.1016/j.tsf.2015.02.048
10.1088/0963-0252/18/4/045026
10.1088/0022-3727/46/17/175202
10.1016/0375-9601(83)90614-X
10.1007/978-94-009-5758-9
10.1088/0963-0252/22/1/013001
ContentType Journal Article
Copyright 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
Copyright_xml – notice: 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
DBID BSCLL
AAYXX
CITATION
7SR
8FD
JG9
DOI 10.1002/ppap.201500051
DatabaseName Istex
CrossRef
Engineered Materials Abstracts
Technology Research Database
Materials Research Database
DatabaseTitle CrossRef
Materials Research Database
Technology Research Database
Engineered Materials Abstracts
DatabaseTitleList Materials Research Database
Materials Research Database

DeliveryMethod fulltext_linktorsrc
Discipline Chemistry
EISSN 1612-8869
EndPage 1027
ExternalDocumentID 3811498281
10_1002_ppap_201500051
PPAP201500051
ark_67375_WNG_HX1VK0D2_K
Genre article
GroupedDBID .3N
.GA
.Y3
05W
0R~
10A
123
1L6
1OC
31~
33P
3SF
3WU
4.4
50Y
50Z
51W
51X
52M
52N
52O
52P
52S
52T
52U
52W
52X
5VS
66C
702
7PT
8-0
8-1
8-3
8-4
8-5
8UM
930
A03
AAESR
AAEVG
AAHQN
AAMMB
AAMNL
AANHP
AANLZ
AAONW
AASGY
AAXRX
AAYCA
AAZKR
ABCQN
ABCUV
ABEML
ABIJN
ABPVW
ACAHQ
ACBWZ
ACCZN
ACGFS
ACIWK
ACPOU
ACRPL
ACSCC
ACXBN
ACXQS
ACYXJ
ADBBV
ADEOM
ADIZJ
ADKYN
ADMGS
ADNMO
ADOZA
ADXAS
ADZMN
AEFGJ
AEIGN
AEIMD
AENEX
AEUYR
AEYWJ
AFBPY
AFFPM
AFGKR
AFWVQ
AFZJQ
AGHNM
AGQPQ
AGXDD
AGYGG
AHBTC
AIDQK
AIDYY
AITYG
AIURR
AJXKR
ALAGY
ALMA_UNASSIGNED_HOLDINGS
ALUQN
ALVPJ
AMBMR
AMYDB
ASPBG
ATUGU
AUFTA
AVWKF
AZBYB
AZFZN
AZVAB
BAFTC
BDRZF
BFHJK
BHBCM
BMNLL
BMXJE
BNHUX
BROTX
BRXPI
BSCLL
BY8
CS3
D-E
D-F
DCZOG
DPXWK
DR2
DRFUL
DRSTM
DU5
EBS
EJD
F00
F01
F04
F5P
FEDTE
G-S
G.N
GODZA
H.T
H.X
HBH
HF~
HGLYW
HVGLF
HZ~
IX1
J0M
JPC
KQQ
LATKE
LAW
LC2
LC3
LEEKS
LH4
LITHE
LOXES
LP6
LP7
LUTES
LW6
LYRES
MEWTI
MK4
MRFUL
MRSTM
MSFUL
MSSTM
MXFUL
MXSTM
N04
N05
N9A
NF~
O66
O9-
OIG
P2P
P2W
P2X
P4D
Q.N
Q11
QB0
QRW
R.K
ROL
RX1
SUPJJ
UB1
W8V
W99
WBKPD
WFSAM
WIH
WIK
WOHZO
WQJ
WXSBR
WYISQ
XG1
XV2
ZZTAW
~IA
~WT
AAHHS
ACCFJ
AEEZP
AEQDE
AEUQT
AFPWT
AIWBW
AJBDE
RWI
WRC
AAYXX
CITATION
O8X
7SR
8FD
JG9
ID FETCH-LOGICAL-c5241-45d948e5033936ae797d4e082fa405f6e054218d0d65ff90b7e33a640c907af13
IEDL.DBID DRFUL
ISICitedReferencesCount 28
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000363732000015&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN 1612-8850
IngestDate Sun Nov 09 09:34:04 EST 2025
Sun Jul 13 05:01:30 EDT 2025
Tue Nov 18 20:53:07 EST 2025
Sat Nov 29 02:40:13 EST 2025
Wed Jan 22 17:01:43 EST 2025
Sun Sep 21 06:19:25 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 9
Language English
License http://onlinelibrary.wiley.com/termsAndConditions#vor
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c5241-45d948e5033936ae797d4e082fa405f6e054218d0d65ff90b7e33a640c907af13
Notes ArticleID:PPAP201500051
istex:E0F3503B96CDB3027A007B8A47CADD364F25BF1F
ark:/67375/WNG-HX1VK0D2-K
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
content type line 23
PQID 1713731835
PQPubID 1036335
PageCount 18
ParticipantIDs proquest_miscellaneous_1753538279
proquest_journals_1713731835
crossref_citationtrail_10_1002_ppap_201500051
crossref_primary_10_1002_ppap_201500051
wiley_primary_10_1002_ppap_201500051_PPAP201500051
istex_primary_ark_67375_WNG_HX1VK0D2_K
PublicationCentury 2000
PublicationDate September 2015
PublicationDateYYYYMMDD 2015-09-01
PublicationDate_xml – month: 09
  year: 2015
  text: September 2015
PublicationDecade 2010
PublicationPlace Weinheim
PublicationPlace_xml – name: Weinheim
PublicationTitle Plasma processes and polymers
PublicationTitleAlternate Plasma Process. Polym
PublicationYear 2015
Publisher Blackwell Publishing Ltd
Wiley Subscription Services, Inc
Publisher_xml – name: Blackwell Publishing Ltd
– name: Wiley Subscription Services, Inc
References S. Konstantinidis, A. Ricard, M. Ganciu, J. P. Dauchot, C. Ranea, M. Hecq, J. Appl. Phys. 2004, 95, 2900.
K. B. Gylfason, J. Alami, U. Helmersson, J. T. Gudmundsson, J. Phys. D. Appl. Phys. 2005, 38, 3417.
A. Pajdarová, J. Vlček, P. Kudláček, J. Lukáš, Plasma Sources Sci. Technol. 2009, 18, 025008.
N. Britun, T. Minea, S. Konstantinidis, R. Snyders, J. Phys. D Appl. Phys. 2014, 47, 224001.
R; Payling, P. Larkins, Optical Emission Lines of the Elements (CD-ROM). Wiley & Sons, Inc, New York 2000.
J. T. Gudmundsson, N. Brenning, D. Lundin, U. Helmersson, J. Vac. Sci. Technol. A 2012, 30, 030801.
T. Godfroid, J. P. Dauchot, M. Hecq, Surf. Coatings Technol. 2003, 174-175, 1276.
J. T. Gudmundsson, Vacuum 2010, 84, 1360.
N. Britun, M. Palmucci, S. Konstantinidis, R. Snyders, J. Appl. Phys. 2015, 117, 163303.
U. Helmersson, M. Lattemann, J. Bohlmark, A. P. Ehiasarian, J. T. Gudmundsson, Thin Solid Films 2006, 513, 1.
K. Sarakinos, D. Magnfält, V. Elofsson, B. Lü, Surf. Coatings Technol. 2014, 257, 326.
A. Ehiasarian, A. Vetushka, A. Hecimovic, S. Konstantinidis, J. Appl. Phys. 2008, 104, 083305.
A. Anders, Surf. Coatings Technol. 2011, 205, S1.
C. Vitelaru, D. Lundin, N. Brenning, T. Minea, Appl. Phys. Lett. 2013, 103, 104105.
A. Fridman, L. A. Kennedy, Plasma Physics and Engineering. Taylor and Francis, New York 2011.
E. Kay, J. Appl. Phys. 1963, 34, 760.
B. Liebig, N. S. J. Braithwaite, P. J. Kelly, J. W. Bradley, Thin Solid Films 2010, 519, 1699.
N. Britun, J. G. Han, S.-G. Oh, Plasma Sources Sci. Technol. 2008, 17, 045013.
L. Li, A. Nikiforov, N. Britun, R. Snyders, C. Leys, Spectrochim. Acta Part B 2015, 107, 75.
J. Bohlmark, J. T. Gudmundsson, J. Alami, M. Latteman, U. Helmersson, IEEE Trans. Plasma Sci. 2005, 33, 346.
V. Linss, Spectrochim. Acta Part B At. Spectrosc. 2005, 60, 253.
N. Britun, M. Palmucci, S. Konstantinidis, R. Snyders, J. Appl. Phys. 2015, 117, 163302.
S. Mazouffre, Plasma Sources Sci. Technol. 2013, 22, 013001.
D. Ohebsian, N. Sadeghi, C. Trassy, J. M. Mermet, Opt. Comm. 1980, 32, 81.
D. Lundin, P. Larsson, E. Wallin, M. Lattemann, N. Brenning, U. Helmersson, Plasma Sources Sci. Technol. 2008, 17, 035021.
M. Palmucci, N. Britun, T. Silva, R. Snyders, S. Konstantinidis, J. Phys. D. Appl. Phys. 2013, 46, 215201.
R. W. B. Pearse, A. G. Gaydon, The Identification of Molecular Spectra, 4th ed., Chapman and Hall, London 1976.
N. Britun, M. Gaillard, J. G. Han, J. Phys. D. Appl. Phys. 2008, 41, 185201.
A. Plain, A. Ricard, Phys. Lett. A 1983, 95, 235.
P. J. Kelly, R. D. Arnell, Vacuum 2000, 56, 159.
K. Sarakinos, J. Alami, S. Konstantinidis, Surf. Coatings Technol. 2010, 204, 1661.
M. Palmucci, N. Britun, S. Konstantinidis, R. Snyders, J. Appl. Phys. 2013, 114, 113302.
A. V. Kozyrev, N. S. Sochugov, K. V. Oskomov, A. N. Zakharov, A. N. Odivanova, Plasma Phys. Rep. 2011, 37, 621.
A. Anders, Surf. Coatings Technol. 2014, 257, 308.
N. Britun, J. G. Han, S.-G. Oh, Appl. Phys. Lett. 2008, 92, 141503.
K. Sasaki, N. Nafarizal, J. Phys. D. Appl. Phys. 2010, 43, 124012.
M. Ganciu, S. Konstantinidis, Y. J. P. Paint, J. P. Dauchot, M. Hecq, L. de Poucques, P. Vašina, M. Meško, J. C. Imbert, J. Bretagne, M. J. Touzeau, Optoelec. Adv. Mat. 2005, 7, 2481.
N. Britun, M. Gaillard, S.-G. Oh, J. G. Han, J. Phys. D. Appl. Phys. 2007, 40, 5098.
N. Nafarizal, N. Takada, K. Shibagaki, K. Nakamura, Y. Sago, K. Sasaki, Jpn. J. Appl. Phys. 2005, 44, L737.
M. Ratova, G. T. West, P. J. Kelly, Surf. Coatings Technol. 2014, 250, 7.
N. Britun, M. Palmucci, S. Konstantinidis, M. Gaillard, R. Snyders, J. Appl. Phys. 2013, 114, 013301.
D. Benzeggouta, M. C. Hugon, J. Bretagne, M. Ganciu, Plasma Sources Sci. Technol. 2009, 18, 045025.
K. Sarakinos, J. Alami, C. Klever, M. Wuttig, Surf. Coatings Technol. 2008, 202, 5033.
G. F. Kirkbright, M. Sargent, Atomic Absorption and Fluorescence Spectroscopy. Academic Press, London 1974.
A. P. Ehiasarian, Y. A. Gonzalvo, T. D. Whitmore, Plasma Process. Polym. 2007, 4, S309.
D. W. Hoffman, J. Vac. Sci. Technol. A 1985, 3, 561.
D. Lundin, N. Brenning, D. Jädernäs, P. Larsson, E. Wallin, M. Lattemann, M. A. Raadu, U. Helmersson, Plasma Sources Sci. Technol. 2009, 18, 045008.
D. Depla, S. Heirwegh, S. Mahieu, J. Haemers, R. De Gryse, J. Appl. Phys. 2007, 101, 013301.
T. Kozák, A. Dagmar Pajdarová, J. Appl. Phys. 2011, 110, 103303.
J. Amorim, G. Baravian, J. Jolly, J. Phys. D. Appl. Phys. 2000, 33, R51.
A. C. Mitchell, M. W. Zemansky, Resonance Radiation and Excited Atoms. Plenum Press, Cambridge 1971.
D. Lundin, M. Stahl, H. Kersten, U. Helmersson, J. Phys. D. Appl. Phys. 2009, 42, 185202.
K. Niemi, V. Schulz-von der Gathen, H. F. Döbele, Plasma Sources Sci. Technol. 2005, 14, 375.
V. Kouznetsov, K. Macák, J. M. Schneider, U. Helmersson, I. Petrov, Surf. Coatings Technol. 1999, 122, 290.
A. N. Reed, P. J. Shamberger, J. J. Hu, C. Muratore, J. E. Bultman, A. A. Voevodin, Thin Solid Films 2015, 579, 30.
N. Britun, S. Ershov, A.-A. Mel, S. El Konstantinidis, A. Ricard, R. Snyders, J. Phys. D. Appl. Phys. 2013, 46, 175202.
G. J. Winter, A. Hecimovic, T. de los Arcos, M. Böke, V. Schulz-von der Gathen, J. Phys. D. Appl. Phys. 2013, 46, 084007.
R. Alvarez, A. Rodero, M. C. Quintero, Spectrochim. Acta Part B 2002, 57, 1665.
A. Hecimovic, T. de los Arcos, V. Schulz-von der Gathen, M. Böke, J. Winter, Plasma Sources Sci. Technol. 2012, 21, 035017.
I. K. Fetisov, A. A. Filippov, G. V. Khodachenko, D. V. Mozgrin, A. A. Pisarev, Vacuum 1999, 53, 133.
S. Berg, H. Blom, T. Larsson, C. Nender, J. Vac. Sci. Technol. A 1987, 5, 202.
D. V. Mozgrin, I. K. Fetisov, G. V Khodachenko, Plasma Phys. Rep. 1995, 21, 400.
K. Shibagaki, N. Nafarizal, K. Sasaki, J. Appl. Phys. 2005, 98, 043310.
S. Konstantinidis, J. P. Dauchot, M. Ganciu, M. Hecq, Appl. Phys. Lett. 2006, 88, 021501.
D. Benzeggouta, M. C. Hugon, J. Bretagne, Plasma Sources Sci. Technol. 2009, 18, 045026.
C. Vitelaru, D. Lundin, G. D. Stancu, N. Brenning, J. Bretagne, T. Minea, Plasma Sources Sci. Technol. 2012, 21, 025010.
P. Poolcharuansin, J. W. Bradley, Plasma Sources Sci. Technol. 2010, 19, 025010.
S. Berg, E. Särhammar, T. Nyberg, Thin Solid Films 2014, 565, 186.
T. Silva, N. Britun, T. Godfroid, R. Snyders, Opt. Lett. 2014, 39, 6146.
S. Konstantinidis, J. P. Dauchot, M. Ganciu, A. Ricard, M. Hecq, J. Appl. Phys. 2006, 99, 013307.
R. Snyders, J.-P. Dauchot, M. Hecq, Plasma Process. Polym. 2007, 4, 113.
2007; 101
2009; 42
2013; 22
2010; 19
2002; 57
1987; 5
1976
1974
1983; 95
2014; 250
1971
2008; 104
1999; 122
2003; 174–175
2005; 60
2015; 107
2014; 257
2011; 110
2010; 519
1963; 34
2011; 205
2000
2000; 56
1995; 21
1980; 32
2013; 114
1999; 53
2007; 4
2015; 579
2005; 38
2005; 33
2012; 21
2014; 565
2009; 18
2011
2010; 204
2013; 46
1985; 3
2006; 99
2008; 17
2014; 47
2013; 103
2008; 202
2011; 37
2008; 92
2006; 513
2005; 44
2010; 84
2012; 30
2010; 43
2004; 95
2006; 88
2000; 33
2005; 7
2005; 98
2015; 117
2008; 41
2007; 40
2014
2014; 39
2013
2005; 14
e_1_2_6_51_1
e_1_2_6_74_1
e_1_2_6_53_1
e_1_2_6_76_1
e_1_2_6_32_1
e_1_2_6_70_1
e_1_2_6_30_1
e_1_2_6_72_1
Mozgrin D. V. (e_1_2_6_3_1) 1995; 21
Ganciu M. (e_1_2_6_27_1) 2005; 7
Payling R (e_1_2_6_46_1) 2000
e_1_2_6_19_1
Mitchell A. C. (e_1_2_6_33_1) 1971
e_1_2_6_13_1
e_1_2_6_36_1
e_1_2_6_59_1
e_1_2_6_11_1
e_1_2_6_34_1
e_1_2_6_17_1
e_1_2_6_55_1
e_1_2_6_15_1
Kirkbright G. F. (e_1_2_6_24_1) 1974
e_1_2_6_38_1
e_1_2_6_57_1
e_1_2_6_62_1
e_1_2_6_64_1
e_1_2_6_43_1
e_1_2_6_20_1
e_1_2_6_41_1
e_1_2_6_9_1
e_1_2_6_5_1
e_1_2_6_7_1
e_1_2_6_1_1
e_1_2_6_49_1
e_1_2_6_22_1
e_1_2_6_66_1
e_1_2_6_28_1
e_1_2_6_45_1
e_1_2_6_26_1
e_1_2_6_47_1
e_1_2_6_68_1
e_1_2_6_52_1
e_1_2_6_73_1
e_1_2_6_54_1
e_1_2_6_75_1
e_1_2_6_10_1
e_1_2_6_31_1
e_1_2_6_50_1
e_1_2_6_71_1
e_1_2_6_14_1
e_1_2_6_35_1
e_1_2_6_12_1
e_1_2_6_18_1
e_1_2_6_39_1
e_1_2_6_56_1
e_1_2_6_16_1
e_1_2_6_37_1
e_1_2_6_58_1
e_1_2_6_63_1
e_1_2_6_42_1
e_1_2_6_65_1
e_1_2_6_21_1
e_1_2_6_40_1
e_1_2_6_61_1
Fridman A. (e_1_2_6_60_1) 2011
e_1_2_6_8_1
e_1_2_6_4_1
e_1_2_6_6_1
e_1_2_6_25_1
e_1_2_6_48_1
e_1_2_6_23_1
e_1_2_6_2_1
e_1_2_6_29_1
e_1_2_6_44_1
e_1_2_6_67_1
e_1_2_6_69_1
References_xml – reference: M. Ratova, G. T. West, P. J. Kelly, Surf. Coatings Technol. 2014, 250, 7.
– reference: R. Alvarez, A. Rodero, M. C. Quintero, Spectrochim. Acta Part B 2002, 57, 1665.
– reference: T. Kozák, A. Dagmar Pajdarová, J. Appl. Phys. 2011, 110, 103303.
– reference: V. Linss, Spectrochim. Acta Part B At. Spectrosc. 2005, 60, 253.
– reference: S. Mazouffre, Plasma Sources Sci. Technol. 2013, 22, 013001.
– reference: P. Poolcharuansin, J. W. Bradley, Plasma Sources Sci. Technol. 2010, 19, 025010.
– reference: T. Godfroid, J. P. Dauchot, M. Hecq, Surf. Coatings Technol. 2003, 174-175, 1276.
– reference: K. Sasaki, N. Nafarizal, J. Phys. D. Appl. Phys. 2010, 43, 124012.
– reference: A. V. Kozyrev, N. S. Sochugov, K. V. Oskomov, A. N. Zakharov, A. N. Odivanova, Plasma Phys. Rep. 2011, 37, 621.
– reference: K. Shibagaki, N. Nafarizal, K. Sasaki, J. Appl. Phys. 2005, 98, 043310.
– reference: R; Payling, P. Larkins, Optical Emission Lines of the Elements (CD-ROM). Wiley & Sons, Inc, New York 2000.
– reference: N. Britun, M. Palmucci, S. Konstantinidis, M. Gaillard, R. Snyders, J. Appl. Phys. 2013, 114, 013301.
– reference: D. Lundin, P. Larsson, E. Wallin, M. Lattemann, N. Brenning, U. Helmersson, Plasma Sources Sci. Technol. 2008, 17, 035021.
– reference: N. Britun, J. G. Han, S.-G. Oh, Plasma Sources Sci. Technol. 2008, 17, 045013.
– reference: V. Kouznetsov, K. Macák, J. M. Schneider, U. Helmersson, I. Petrov, Surf. Coatings Technol. 1999, 122, 290.
– reference: M. Palmucci, N. Britun, T. Silva, R. Snyders, S. Konstantinidis, J. Phys. D. Appl. Phys. 2013, 46, 215201.
– reference: A. N. Reed, P. J. Shamberger, J. J. Hu, C. Muratore, J. E. Bultman, A. A. Voevodin, Thin Solid Films 2015, 579, 30.
– reference: S. Berg, E. Särhammar, T. Nyberg, Thin Solid Films 2014, 565, 186.
– reference: R. Snyders, J.-P. Dauchot, M. Hecq, Plasma Process. Polym. 2007, 4, 113.
– reference: C. Vitelaru, D. Lundin, N. Brenning, T. Minea, Appl. Phys. Lett. 2013, 103, 104105.
– reference: R. W. B. Pearse, A. G. Gaydon, The Identification of Molecular Spectra, 4th ed., Chapman and Hall, London 1976.
– reference: S. Konstantinidis, A. Ricard, M. Ganciu, J. P. Dauchot, C. Ranea, M. Hecq, J. Appl. Phys. 2004, 95, 2900.
– reference: N. Nafarizal, N. Takada, K. Shibagaki, K. Nakamura, Y. Sago, K. Sasaki, Jpn. J. Appl. Phys. 2005, 44, L737.
– reference: A. Anders, Surf. Coatings Technol. 2014, 257, 308.
– reference: P. J. Kelly, R. D. Arnell, Vacuum 2000, 56, 159.
– reference: D. V. Mozgrin, I. K. Fetisov, G. V Khodachenko, Plasma Phys. Rep. 1995, 21, 400.
– reference: A. Anders, Surf. Coatings Technol. 2011, 205, S1.
– reference: B. Liebig, N. S. J. Braithwaite, P. J. Kelly, J. W. Bradley, Thin Solid Films 2010, 519, 1699.
– reference: J. T. Gudmundsson, Vacuum 2010, 84, 1360.
– reference: D. Ohebsian, N. Sadeghi, C. Trassy, J. M. Mermet, Opt. Comm. 1980, 32, 81.
– reference: M. Ganciu, S. Konstantinidis, Y. J. P. Paint, J. P. Dauchot, M. Hecq, L. de Poucques, P. Vašina, M. Meško, J. C. Imbert, J. Bretagne, M. J. Touzeau, Optoelec. Adv. Mat. 2005, 7, 2481.
– reference: D. Benzeggouta, M. C. Hugon, J. Bretagne, M. Ganciu, Plasma Sources Sci. Technol. 2009, 18, 045025.
– reference: A. Pajdarová, J. Vlček, P. Kudláček, J. Lukáš, Plasma Sources Sci. Technol. 2009, 18, 025008.
– reference: C. Vitelaru, D. Lundin, G. D. Stancu, N. Brenning, J. Bretagne, T. Minea, Plasma Sources Sci. Technol. 2012, 21, 025010.
– reference: N. Britun, M. Gaillard, J. G. Han, J. Phys. D. Appl. Phys. 2008, 41, 185201.
– reference: N. Britun, M. Palmucci, S. Konstantinidis, R. Snyders, J. Appl. Phys. 2015, 117, 163303.
– reference: L. Li, A. Nikiforov, N. Britun, R. Snyders, C. Leys, Spectrochim. Acta Part B 2015, 107, 75.
– reference: K. Sarakinos, J. Alami, C. Klever, M. Wuttig, Surf. Coatings Technol. 2008, 202, 5033.
– reference: G. F. Kirkbright, M. Sargent, Atomic Absorption and Fluorescence Spectroscopy. Academic Press, London 1974.
– reference: S. Konstantinidis, J. P. Dauchot, M. Ganciu, M. Hecq, Appl. Phys. Lett. 2006, 88, 021501.
– reference: K. Sarakinos, J. Alami, S. Konstantinidis, Surf. Coatings Technol. 2010, 204, 1661.
– reference: D. Lundin, M. Stahl, H. Kersten, U. Helmersson, J. Phys. D. Appl. Phys. 2009, 42, 185202.
– reference: E. Kay, J. Appl. Phys. 1963, 34, 760.
– reference: K. Niemi, V. Schulz-von der Gathen, H. F. Döbele, Plasma Sources Sci. Technol. 2005, 14, 375.
– reference: J. T. Gudmundsson, N. Brenning, D. Lundin, U. Helmersson, J. Vac. Sci. Technol. A 2012, 30, 030801.
– reference: S. Berg, H. Blom, T. Larsson, C. Nender, J. Vac. Sci. Technol. A 1987, 5, 202.
– reference: I. K. Fetisov, A. A. Filippov, G. V. Khodachenko, D. V. Mozgrin, A. A. Pisarev, Vacuum 1999, 53, 133.
– reference: N. Britun, M. Gaillard, S.-G. Oh, J. G. Han, J. Phys. D. Appl. Phys. 2007, 40, 5098.
– reference: S. Konstantinidis, J. P. Dauchot, M. Ganciu, A. Ricard, M. Hecq, J. Appl. Phys. 2006, 99, 013307.
– reference: N. Britun, J. G. Han, S.-G. Oh, Appl. Phys. Lett. 2008, 92, 141503.
– reference: M. Palmucci, N. Britun, S. Konstantinidis, R. Snyders, J. Appl. Phys. 2013, 114, 113302.
– reference: J. Amorim, G. Baravian, J. Jolly, J. Phys. D. Appl. Phys. 2000, 33, R51.
– reference: D. Depla, S. Heirwegh, S. Mahieu, J. Haemers, R. De Gryse, J. Appl. Phys. 2007, 101, 013301.
– reference: A. Fridman, L. A. Kennedy, Plasma Physics and Engineering. Taylor and Francis, New York 2011.
– reference: N. Britun, T. Minea, S. Konstantinidis, R. Snyders, J. Phys. D Appl. Phys. 2014, 47, 224001.
– reference: N. Britun, S. Ershov, A.-A. Mel, S. El Konstantinidis, A. Ricard, R. Snyders, J. Phys. D. Appl. Phys. 2013, 46, 175202.
– reference: A. C. Mitchell, M. W. Zemansky, Resonance Radiation and Excited Atoms. Plenum Press, Cambridge 1971.
– reference: N. Britun, M. Palmucci, S. Konstantinidis, R. Snyders, J. Appl. Phys. 2015, 117, 163302.
– reference: A. P. Ehiasarian, Y. A. Gonzalvo, T. D. Whitmore, Plasma Process. Polym. 2007, 4, S309.
– reference: A. Ehiasarian, A. Vetushka, A. Hecimovic, S. Konstantinidis, J. Appl. Phys. 2008, 104, 083305.
– reference: T. Silva, N. Britun, T. Godfroid, R. Snyders, Opt. Lett. 2014, 39, 6146.
– reference: A. Hecimovic, T. de los Arcos, V. Schulz-von der Gathen, M. Böke, J. Winter, Plasma Sources Sci. Technol. 2012, 21, 035017.
– reference: A. Plain, A. Ricard, Phys. Lett. A 1983, 95, 235.
– reference: U. Helmersson, M. Lattemann, J. Bohlmark, A. P. Ehiasarian, J. T. Gudmundsson, Thin Solid Films 2006, 513, 1.
– reference: D. Benzeggouta, M. C. Hugon, J. Bretagne, Plasma Sources Sci. Technol. 2009, 18, 045026.
– reference: D. W. Hoffman, J. Vac. Sci. Technol. A 1985, 3, 561.
– reference: D. Lundin, N. Brenning, D. Jädernäs, P. Larsson, E. Wallin, M. Lattemann, M. A. Raadu, U. Helmersson, Plasma Sources Sci. Technol. 2009, 18, 045008.
– reference: J. Bohlmark, J. T. Gudmundsson, J. Alami, M. Latteman, U. Helmersson, IEEE Trans. Plasma Sci. 2005, 33, 346.
– reference: G. J. Winter, A. Hecimovic, T. de los Arcos, M. Böke, V. Schulz-von der Gathen, J. Phys. D. Appl. Phys. 2013, 46, 084007.
– reference: K. B. Gylfason, J. Alami, U. Helmersson, J. T. Gudmundsson, J. Phys. D. Appl. Phys. 2005, 38, 3417.
– reference: K. Sarakinos, D. Magnfält, V. Elofsson, B. Lü, Surf. Coatings Technol. 2014, 257, 326.
– year: 2011
– volume: 18
  start-page: 025008
  year: 2009
  publication-title: Plasma Sources Sci. Technol.
– volume: 32
  start-page: 81
  year: 1980
  publication-title: Opt. Comm.
– volume: 250
  start-page: 7
  year: 2014
  publication-title: Surf. Coatings Technol.
– volume: 4
  start-page: 113
  year: 2007
  publication-title: Plasma Process. Polym.
– volume: 95
  start-page: 235
  year: 1983
  publication-title: Phys. Lett. A
– volume: 21
  start-page: 035017
  year: 2012
  publication-title: Plasma Sources Sci. Technol.
– volume: 33
  start-page: 346
  year: 2005
  publication-title: IEEE Trans. Plasma Sci.
– volume: 204
  start-page: 1661
  year: 2010
  publication-title: Surf. Coatings Technol.
– volume: 257
  start-page: 308
  year: 2014
  publication-title: Surf. Coatings Technol.
– volume: 519
  start-page: 1699
  year: 2010
  publication-title: Thin Solid Films
– volume: 110
  start-page: 103303
  year: 2011
  publication-title: J. Appl. Phys.
– volume: 95
  start-page: 2900
  year: 2004
  publication-title: J. Appl. Phys.
– volume: 46
  start-page: 175202
  year: 2013
  publication-title: J. Phys. D. Appl. Phys.
– volume: 107
  start-page: 75
  year: 2015
  publication-title: Spectrochim. Acta Part B
– volume: 33
  start-page: R51
  year: 2000
  publication-title: J. Phys. D. Appl. Phys.
– year: 1971
– volume: 117
  start-page: 163303
  year: 2015
  publication-title: J. Appl. Phys.
– volume: 41
  start-page: 185201
  year: 2008
  publication-title: J. Phys. D. Appl. Phys.
– volume: 18
  start-page: 045008
  year: 2009
  publication-title: Plasma Sources Sci. Technol.
– volume: 39
  start-page: 6146
  year: 2014
  publication-title: Opt. Lett.
– volume: 17
  start-page: 045013
  year: 2008
  publication-title: Plasma Sources Sci. Technol.
– year: 2014
– volume: 40
  start-page: 5098
  year: 2007
  publication-title: J. Phys. D. Appl. Phys.
– volume: 46
  start-page: 084007
  year: 2013
  publication-title: J. Phys. D. Appl. Phys.
– volume: 579
  start-page: 30
  year: 2015
  publication-title: Thin Solid Films
– volume: 88
  start-page: 021501
  year: 2006
  publication-title: Appl. Phys. Lett.
– volume: 18
  start-page: 045026
  year: 2009
  publication-title: Plasma Sources Sci. Technol.
– volume: 38
  start-page: 3417
  year: 2005
  publication-title: J. Phys. D. Appl. Phys.
– volume: 56
  start-page: 159
  year: 2000
  publication-title: Vacuum
– volume: 60
  start-page: 253
  year: 2005
  publication-title: Spectrochim. Acta Part B At. Spectrosc.
– volume: 22
  start-page: 013001
  year: 2013
  publication-title: Plasma Sources Sci. Technol.
– volume: 57
  start-page: 1665
  year: 2002
  publication-title: Spectrochim. Acta Part B
– volume: 34
  start-page: 760
  year: 1963
  publication-title: J. Appl. Phys.
– volume: 257
  start-page: 326
  year: 2014
  publication-title: Surf. Coatings Technol.
– volume: 103
  start-page: 104105
  year: 2013
  publication-title: Appl. Phys. Lett.
– volume: 37
  start-page: 621
  year: 2011
  publication-title: Plasma Phys. Rep.
– year: 1976
– volume: 565
  start-page: 186
  year: 2014
  publication-title: Thin Solid Films
– volume: 4
  start-page: S309
  year: 2007
  publication-title: Plasma Process. Polym.
– volume: 17
  start-page: 035021
  year: 2008
  publication-title: Plasma Sources Sci. Technol.
– volume: 18
  start-page: 045025
  year: 2009
  publication-title: Plasma Sources Sci. Technol.
– volume: 21
  start-page: 400
  year: 1995
  publication-title: Plasma Phys. Rep.
– volume: 513
  start-page: 1
  year: 2006
  publication-title: Thin Solid Films
– volume: 43
  start-page: 124012
  year: 2010
  publication-title: J. Phys. D. Appl. Phys.
– volume: 42
  start-page: 185202
  year: 2009
  publication-title: J. Phys. D. Appl. Phys.
– volume: 14
  start-page: 375
  year: 2005
  publication-title: Plasma Sources Sci. Technol.
– volume: 19
  start-page: 025010
  year: 2010
  publication-title: Plasma Sources Sci. Technol.
– volume: 44
  start-page: L737
  year: 2005
  publication-title: Jpn. J. Appl. Phys.
– volume: 84
  start-page: 1360
  year: 2010
  publication-title: Vacuum
– volume: 114
  start-page: 013301
  year: 2013
  publication-title: J. Appl. Phys.
– volume: 101
  start-page: 013301
  year: 2007
  publication-title: J. Appl. Phys.
– volume: 3
  start-page: 561
  year: 1985
  publication-title: J. Vac. Sci. Technol. A
– year: 2000
– volume: 122
  start-page: 290
  year: 1999
  publication-title: Surf. Coatings Technol.
– volume: 202
  start-page: 5033
  year: 2008
  publication-title: Surf. Coatings Technol.
– volume: 30
  start-page: 030801
  year: 2012
  publication-title: J. Vac. Sci. Technol. A
– volume: 99
  start-page: 013307
  year: 2006
  publication-title: J. Appl. Phys.
– volume: 205
  start-page: S1
  year: 2011
  publication-title: Surf. Coatings Technol.
– volume: 92
  start-page: 141503
  year: 2008
  publication-title: Appl. Phys. Lett.
– volume: 53
  start-page: 133
  year: 1999
  publication-title: Vacuum
– volume: 174–175
  start-page: 1276
  year: 2003
  publication-title: Surf. Coatings Technol.
– volume: 47
  start-page: 224001
  year: 2014
  publication-title: J. Phys. D Appl. Phys.
– volume: 21
  start-page: 025010
  year: 2012
  publication-title: Plasma Sources Sci. Technol.
– volume: 98
  start-page: 043310
  year: 2005
  publication-title: J. Appl. Phys.
– volume: 5
  start-page: 202
  year: 1987
  publication-title: J. Vac. Sci. Technol. A
– volume: 104
  start-page: 083305
  year: 2008
  publication-title: J. Appl. Phys.
– year: 1974
– volume: 7
  start-page: 2481
  year: 2005
  publication-title: Optoelec. Adv. Mat.
– volume: 117
  start-page: 163302
  year: 2015
  publication-title: J. Appl. Phys.
– volume: 46
  start-page: 215201
  year: 2013
  publication-title: J. Phys. D. Appl. Phys.
– volume: 114
  start-page: 113302
  year: 2013
  publication-title: J. Appl. Phys.
– year: 2013
– ident: e_1_2_6_15_1
  doi: 10.1088/0022-3727/47/22/224001
– ident: e_1_2_6_25_1
  doi: 10.1063/1.4919006
– ident: e_1_2_6_18_1
  doi: 10.1016/j.surfcoat.2014.04.015
– ident: e_1_2_6_65_1
  doi: 10.1088/0963-0252/17/3/035021
– volume-title: Atomic Absorption and Fluorescence Spectroscopy
  year: 1974
  ident: e_1_2_6_24_1
– ident: e_1_2_6_54_1
  doi: 10.1088/0022-3727/40/17/015
– ident: e_1_2_6_40_1
– ident: e_1_2_6_53_1
  doi: 10.1063/1.3656446
– ident: e_1_2_6_8_1
  doi: 10.1063/1.1729530
– volume-title: Resonance Radiation and Excited Atoms
  year: 1971
  ident: e_1_2_6_33_1
– volume-title: Plasma Physics and Engineering
  year: 2011
  ident: e_1_2_6_60_1
– ident: e_1_2_6_68_1
  doi: 10.1063/1.2907505
– ident: e_1_2_6_45_1
  doi: 10.1002/ppap.200600103
– ident: e_1_2_6_9_1
  doi: 10.1109/TPS.2005.845022
– ident: e_1_2_6_39_1
  doi: 10.1063/1.3000446
– ident: e_1_2_6_75_1
– ident: e_1_2_6_70_1
  doi: 10.1088/0022-3727/46/8/084007
– ident: e_1_2_6_61_1
  doi: 10.1016/j.tsf.2014.02.063
– ident: e_1_2_6_41_1
  doi: 10.1088/0963-0252/18/2/025008
– ident: e_1_2_6_71_1
  doi: 10.1134/S1063780X11060122
– ident: e_1_2_6_2_1
  doi: 10.1016/j.vacuum.2009.12.022
– ident: e_1_2_6_23_1
  doi: 10.1016/S0584-8547(02)00087-3
– ident: e_1_2_6_64_1
  doi: 10.1088/0022-3727/38/18/015
– ident: e_1_2_6_6_1
  doi: 10.1016/j.tsf.2006.03.033
– ident: e_1_2_6_5_1
  doi: 10.1016/S0257-8972(99)00292-3
– ident: e_1_2_6_12_1
  doi: 10.1088/0963-0252/18/4/045025
– ident: e_1_2_6_37_1
  doi: 10.1116/1.572994
– ident: e_1_2_6_10_1
  doi: 10.1016/j.surfcoat.2009.11.013
– ident: e_1_2_6_30_1
  doi: 10.1088/0022-3727/33/9/201
– ident: e_1_2_6_52_1
  doi: 10.1088/0022-3727/41/18/185201
– ident: e_1_2_6_22_1
  doi: 10.1088/0963-0252/21/3/035017
– ident: e_1_2_6_62_1
  doi: 10.1116/1.574104
– ident: e_1_2_6_38_1
  doi: 10.1063/1.2162671
– ident: e_1_2_6_73_1
  doi: 10.1088/0963-0252/14/2/021
– ident: e_1_2_6_4_1
  doi: 10.1016/S0042-207X(98)00408-4
– volume-title: Optical Emission Lines of the Elements (CD‐ROM)
  year: 2000
  ident: e_1_2_6_46_1
– ident: e_1_2_6_44_1
  doi: 10.1088/0963-0252/18/4/045008
– ident: e_1_2_6_13_1
  doi: 10.1002/ppap.200730806
– ident: e_1_2_6_31_1
  doi: 10.1063/1.1646452
– ident: e_1_2_6_20_1
  doi: 10.1016/j.surfcoat.2014.02.020
– ident: e_1_2_6_16_1
  doi: 10.1016/j.surfcoat.2014.08.043
– ident: e_1_2_6_55_1
  doi: 10.1016/j.sab.2005.01.004
– ident: e_1_2_6_26_1
– ident: e_1_2_6_47_1
  doi: 10.1016/S0257-8972(03)00690-X
– ident: e_1_2_6_59_1
  doi: 10.1063/1.2404583
– ident: e_1_2_6_69_1
  doi: 10.1063/1.2035311
– ident: e_1_2_6_21_1
  doi: 10.1016/j.tsf.2010.06.055
– ident: e_1_2_6_51_1
  doi: 10.1088/0022-3727/43/12/124012
– ident: e_1_2_6_74_1
– ident: e_1_2_6_35_1
  doi: 10.1016/j.sab.2015.02.016
– ident: e_1_2_6_43_1
  doi: 10.1088/0963-0252/21/2/025010
– ident: e_1_2_6_7_1
  doi: 10.1116/1.3691832
– ident: e_1_2_6_49_1
  doi: 10.1016/0030-4018(80)90319-3
– ident: e_1_2_6_57_1
  doi: 10.1364/OL.39.006146
– ident: e_1_2_6_76_1
  doi: 10.1063/1.4812579
– ident: e_1_2_6_66_1
  doi: 10.1088/0022-3727/42/18/185202
– ident: e_1_2_6_1_1
  doi: 10.1016/S0042-207X(99)00189-X
– ident: e_1_2_6_32_1
  doi: 10.1063/1.4919007
– volume: 7
  start-page: 2481
  year: 2005
  ident: e_1_2_6_27_1
  publication-title: Optoelec. Adv. Mat.
– ident: e_1_2_6_42_1
  doi: 10.1088/0963-0252/19/2/025010
– ident: e_1_2_6_36_1
  doi: 10.1063/1.2159555
– ident: e_1_2_6_67_1
  doi: 10.1088/0963-0252/17/4/045013
– ident: e_1_2_6_48_1
  doi: 10.1088/0022-3727/46/21/215201
– ident: e_1_2_6_29_1
  doi: 10.1063/1.4812579
– ident: e_1_2_6_50_1
  doi: 10.1143/JJAP.44.L737
– volume: 21
  start-page: 400
  year: 1995
  ident: e_1_2_6_3_1
  publication-title: Plasma Phys. Rep.
– ident: e_1_2_6_72_1
  doi: 10.1063/1.4819835
– ident: e_1_2_6_28_1
  doi: 10.1063/1.4821514
– ident: e_1_2_6_14_1
  doi: 10.1016/j.surfcoat.2011.03.081
– ident: e_1_2_6_17_1
  doi: 10.1016/j.surfcoat.2008.05.009
– ident: e_1_2_6_19_1
  doi: 10.1016/j.tsf.2015.02.048
– ident: e_1_2_6_11_1
  doi: 10.1088/0963-0252/18/4/045026
– ident: e_1_2_6_34_1
  doi: 10.1088/0022-3727/46/17/175202
– ident: e_1_2_6_56_1
  doi: 10.1016/0375-9601(83)90614-X
– ident: e_1_2_6_58_1
  doi: 10.1007/978-94-009-5758-9
– ident: e_1_2_6_63_1
  doi: 10.1088/0963-0252/22/1/013001
SSID ssj0030580
Score 2.220448
SecondaryResourceType review_article
Snippet The progress in the time‐resolved characterization of HiPIMS discharges performed during the last decade in our group is overviewed. Optical emission and...
The progress in the time-resolved characterization of HiPIMS discharges performed during the last decade in our group is overviewed. Optical emission and...
SourceID proquest
crossref
wiley
istex
SourceType Aggregation Database
Enrichment Source
Index Database
Publisher
StartPage 1010
SubjectTerms Absorption spectroscopy
Density
Discharge
Excitation
Ground state
HiPIMS
Ionization
LIF
LIF imaging
Plasma
plasma diagnostics
Rarefaction
resonant absorption
Titanium
Velocity distribution
Title An Overview on Time-Resolved Optical Analysis of HiPIMS Discharge
URI https://api.istex.fr/ark:/67375/WNG-HX1VK0D2-K/fulltext.pdf
https://onlinelibrary.wiley.com/doi/abs/10.1002%2Fppap.201500051
https://www.proquest.com/docview/1713731835
https://www.proquest.com/docview/1753538279
Volume 12
WOSCitedRecordID wos000363732000015&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVWIB
  databaseName: Wiley Online Library - Journals
  customDbUrl:
  eissn: 1612-8869
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0030580
  issn: 1612-8850
  databaseCode: DRFUL
  dateStart: 20040101
  isFulltext: true
  titleUrlDefault: https://onlinelibrary.wiley.com
  providerName: Wiley-Blackwell
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwpV1bb9MwFD6CFgleuCPCNmQkBE_RHCeO68eqXSna6CJgo2-WHdtSxZRW7VZ45CfwG_dLsJ0L6wNCgjdHOYmsc_Pn23cAXhOijJtz0VgrQ-OMlTqWzLWYJLzkVvEklE44P2Gz2WA-58WNW_w1P0S34OYjI-RrH-BSbQ5_k4auVtLzTSY0wJDb0CfOeWkP-uOPk7OTNhs7dw7V0xywcZE_oLglbsTkcPcPOwNT3-v4-w7qvIldw-AzefD_3X4I9xvgiYa1pzyCW6Z6DHdHbb23JzAaVuh061OH-YaWFfKXQ65__PTr-xdbo9HpKix7o5bGBC0tmi6K9x8-ofFiExiXzFM4mxx9Hk3jpsRCXFI3dscZ1TwbGL-XydNcGsaZzoyDBVY6JGdz4xCdAwEa65xay7FiJk1lnuHSGVjaJH0GvWpZmeeAjFYDXuLcWjfJ0UpJkycKy6zkDuJgwyKIW_2KsuEf92UwLkTNnEyEV43oVBPB205-VTNv_FHyTTBXJybXX_15NUbFl9k7MZ0n58d4TMRxBPutPUUTqhuRuGk685mNRvCqe-1073dOZGWWV16Gpm5kIIxHQIJ1_9IlURTDont68S8f7cE9367Ps-1D73J9ZQ7gTrm9XGzWLxs3_wXFtfui
linkProvider Wiley-Blackwell
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwrV1LbxMxEB5Bg1QuLU-xpYCREJxW9T68jo9RQkiVNF1BW3KzvLu2FFFtoqQNHPkJ_Y39JR17H5ADQkLc9jG7suZhfx7b3wC8C8NM45yL-UWmmR_zvPAVxyuuQpELk4nAlU64mPDptDubibTeTWjPwlT8EG3CzUaG669tgNuE9NEv1tDlUlnCyYA5HHIfOjH6Ejp5Z_B5eD5pumP0Z1c-DZENhn6X0Ya5kYZH23_YGpk6Vsk_tmDn7-DVjT7D_f_Q7kewV0NP0qt85THc0-UT2O03Fd-eQr9XktON7Tz0d7IoiT0ecvvzxmb4Lze6IKdLl_gmDZEJWRgymqfHJ1_IYL52nEv6GZwPP571R35dZMHPGY7efswKEXe1Xc0UUaI0F7yINQIDoxDLmUQjpkMYUNAiYcYImnEdRSqJaY4mViaInsNOuSj1CyC6yLoip4kxOM0pskzpJMioinOBIIdq7oHfKFjmNQO5LYRxKSvu5FBa1chWNR58aOWXFffGHyXfO3u1Ymr1ze5Y40x-nX6So1lwMaaDUI49OGwMKutgXcsAJ-rc9m3Mg7fta9S9XTtRpV5cWxkW4dgQcuFB6Mz7lybJNO2l7d3Bv3z0BnZHZycTOTmejl_CQ_u82t12CDtXq2v9Ch7km6v5evW69vk75O7_kg
linkToPdf http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwrV1Lj9MwEB5Bi2AvvNEGFjASglO0eTmuj1VL6aqlGwG79GY58ViqWKVRu1s48hP4jfwSbOcBPSAkxC2PSWTNeGY-v74BeBlFOZoxF_VVjtRPWKF8ycwVkxEvuM556EonnM_ZYjFYLnnW7Ca0Z2Fqfohuws16hovX1sGxUvr4F2toVUlLOBlSh0OuQz-xlWR60B-_n5zN23Bs-rMrn2aQjXH9AQ1a5sYgOt7_w15m6lslf92Dnb-DV5d9Jnf-Q7vvwu0GepJh3VfuwTUs78OtUVvx7QGMhiU53dnggV_IuiT2eMiPb9_tDP_FDhU5rdzEN2mJTMhak-kqO3n3gYxXW8e5hA_hbPLm42jqN0UW_IKa7O0nVPFkgHY1k8epRMaZStAAAy0NltMpGkxnYIAKVEq15kHOMI5lmgSFMbHUYfwIeuW6xEMgqPIBL4JUazPMUXkuMQ3zQCYFNyAnQOaB3ypYFA0DuS2EcSFq7uRIWNWITjUevO7kq5p744-Sr5y9OjG5-Wx3rDEqPi3eiukyPJ8F40jMPDhqDSoaZ92K0AzUmY1t1IMX3Wuje7t2IktcX1kZGpvcEDHuQeTM-5cmiSwbZt3d43_56DnczMYTMT9ZzJ7AgX1cb247gt7l5gqfwo1id7nabp41Xf4nbrf_DQ
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=An+Overview+on+Time%E2%80%90Resolved+Optical+Analysis+of+HiPIMS+Discharge&rft.jtitle=Plasma+processes+and+polymers&rft.au=Britun%2C+Nikolay&rft.au=Konstantinidis%2C+Stephanos&rft.au=Snyders%2C+Rony&rft.date=2015-09-01&rft.issn=1612-8850&rft.eissn=1612-8869&rft.volume=12&rft.issue=9&rft.spage=1010&rft.epage=1027&rft_id=info:doi/10.1002%2Fppap.201500051&rft.externalDBID=n%2Fa&rft.externalDocID=10_1002_ppap_201500051
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1612-8850&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1612-8850&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1612-8850&client=summon