Simplified inelastic electron tunneling spectroscopy based on low-noise derivatives

A standard experimental setup for Inelastic Electron Tunneling Spectroscopy (IETS) performs the measurement of the second derivative of the current with respect to the voltage ( d 2 I / d V 2 ) using a small AC signal and a lock-in based second harmonic detection. This avoids noise arising from dire...

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Veröffentlicht in:Scientific reports Jg. 12; H. 1; S. 19216 - 10
Hauptverfasser: Kesarwani, Shankar, Misra, Shobhna, Saha, Dipankar, Della Rocca, Maria Luisa, Roy, Indrajit, Ganguly, Swaroop, Mahajan, Ashutosh
Format: Journal Article
Sprache:Englisch
Veröffentlicht: London Nature Publishing Group UK 10.11.2022
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639/166/987
639/766/930/12
639/925/927/356
639/925/930/12
Algorithms
Humanities and Social Sciences
Mathematical models
multidisciplinary
Numerical analysis
Science
Science (multidisciplinary)
Spectroscopy
Spectrum analysis
Voltage
ISSN:2045-2322, 2045-2322
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Zusammenfassung:A standard experimental setup for Inelastic Electron Tunneling Spectroscopy (IETS) performs the measurement of the second derivative of the current with respect to the voltage ( d 2 I / d V 2 ) using a small AC signal and a lock-in based second harmonic detection. This avoids noise arising from direct differentiation of the current-voltage characteristics (I–V) by standard numerical methods. Here we demonstrate a noise-filtering algorithm based on Tikhonov Regularization to obtain IET spectra (i.e. d 2 I / d V 2 vs. V) from measured DC I–V curves. This leads to a simple and effective numerical method for IETS extraction. We apply the algorithm to I–V data from a molecular junction and a metal-insulator-semiconductor tunneling device, demonstrating that the computed first/second derivatives have a workable match with those obtained from our lock-in measurements; the computed IET spectral peaks also correlate well with reported experimental ones. Finally, we present a scheme for automated tuning of the algorithm parameters well-suited for the use of this numerical protocol in real applications.
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ISSN:2045-2322
2045-2322
DOI:10.1038/s41598-022-21302-4