Electron and X-Ray Methods of Ultrafast Structural Dynamics: Advances and Applications

In this contribution, we highlight the state of the art in the determination of structures with ultrafast electrons and X‐rays. We provide our perspectives and reflections on the principles, techniques and methods, and on applications from different disciplines, with some focus on physical, chemical...

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Veröffentlicht in:Chemphyschem Jg. 10; H. 1; S. 28 - 43
Hauptverfasser: Chergui, Majed, Zewail, Ahmed H.
Format: Journal Article
Sprache:Englisch
Veröffentlicht: Weinheim WILEY-VCH Verlag 12.01.2009
WILEY‐VCH Verlag
Wiley
Schlagworte:
ISSN:1439-4235, 1439-7641, 1439-7641
Online-Zugang:Volltext
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Zusammenfassung:In this contribution, we highlight the state of the art in the determination of structures with ultrafast electrons and X‐rays. We provide our perspectives and reflections on the principles, techniques and methods, and on applications from different disciplines, with some focus on physical, chemical and biological structures. Although this article is not a survey of all the work done with these techniques, it provides a comprehensive referencing to current research. State of the art techniques: Ultrafast electron microscopy and X‐ray diffraction methods (see figure) unravel structural dynamics with atomic‐scale resolution in systems ranging from small molecules to crystals and from materials to biological assemblies. The applications span structures in the gas phase and at interfaces as well as in the condensed phase.
Bibliographie:ark:/67375/WNG-1DKF74R6-V
ArticleID:CPHC200800667
istex:386800D531C462177ECF5B7939F6567004242B33
ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
ObjectType-Review-3
content type line 23
ISSN:1439-4235
1439-7641
1439-7641
DOI:10.1002/cphc.200800667