Soft X‐ray nanospectroscopy for quantification of X‐ray linear dichroism on powders

X‐ray linear dichroism (XLD) is a fundamental property of many ordered materials that can for instance provide information on the origin of magnetic properties and the existence of differently ordered domains. Conventionally, measurements of XLD are performed on single crystals, crystalline thin fil...

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Vydané v:	Journal of synchrotron radiation Ročník 28; číslo 4; s. 1090 - 1099
Hlavní autori:	Hageraats, Selwin, Thoury, Mathieu, Stanescu, Stefan, Keune, Katrien
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	5 Abbey Square, Chester, Cheshire CH1 2HU, England International Union of Crystallography 01.07.2021 John Wiley & Sons, Inc
Predmet:	Absorption Crystallites Dichroism Dipole moments Fresnel zones Magnetic properties Mathematical models Parameters Physics Research Papers Single crystals soft X‐rays STXM Thin films XLD Zinc oxide ZnO Zone plates STXM XLD ZnO soft X-rays Soft X-rays
ISSN:	1600-5775, 0909-0495, 1600-5775
On-line prístup:	Získať plný text
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