py4DSTEM: A Software Package for Four-Dimensional Scanning Transmission Electron Microscopy Data Analysis

Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full two-dimensional (2D) image of the diffracted electron b...

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Vydáno v:	Microscopy and microanalysis Ročník 27; číslo 4; s. 712 - 743
Hlavní autoři:	Savitzky, Benjamin H., Zeltmann, Steven E., Hughes, Lauren A., Brown, Hamish G., Zhao, Shiteng, Pelz, Philipp M., Pekin, Thomas C., Barnard, Edward S., Donohue, Jennifer, Rangel DaCosta, Luis, Kennedy, Ellis, Xie, Yujun, Janish, Matthew T., Schneider, Matthew M., Herring, Patrick, Gopal, Chirranjeevi, Anapolsky, Abraham, Dhall, Rohan, Bustillo, Karen C., Ercius, Peter, Scott, Mary C., Ciston, Jim, Minor, Andrew M., Ophus, Colin
Médium:	Journal Article
Jazyk:	angličtina
Vydáno:	New York, USA Cambridge University Press 01.08.2021 Oxford University Press Microscopy Society of America (MSA)
Témata:	4D-STEM Application programming interface Calibration Computer applications Data analysis Datasets Diffraction Electromagnetic fields Electron beams Experiments Geometry INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY Material properties open source Open source software Programming languages Reproducibility Scanning electron microscopy Scanning transmission electron microscopy Sensors Software and Instrumentation Source code Spectroscopy STEM Transmission electron microscopy 4D-STEM open source diffraction calibration STEM
ISSN:	1431-9276, 1435-8115, 1435-8115
On-line přístup:	Získat plný text
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