Intelligent Sensors for dc Fault Location Scheme Based on Optimized Intelligent Architecture for HVdc Systems

We develop a probabilistic model for determining the location of dc-link faults in MT-HVdc networks using discrete wavelet transforms (DWTs), Bayesian optimization, and multilayer artificial neural networks (ANNs) based on local information. Likewise, feedforward neural networks (FFNNs) are trained...

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Veröffentlicht in:	Sensors (Basel, Switzerland) Jg. 22; H. 24; S. 9936
Hauptverfasser:	Yousaf, Muhammad Zain, Tahir, Muhammad Faizan, Raza, Ali, Khan, Muhammad Ahmad, Badshah, Fazal
Format:	Journal Article
Sprache:	Englisch
Veröffentlicht:	Switzerland MDPI AG 16.12.2022 MDPI
Schlagworte:	Accuracy Algorithms Back propagation Bayes Theorem Bayesian optimization Bias Computer Simulation Electricity distribution Levenberg–Marquardt backpropagation Localization modular multilevel converter Neural networks Neural Networks, Computer Power protection sensor Sensors Signal processing Time Wavelet transforms modular multilevel converter Levenberg–Marquardt backpropagation protection sensor Bayesian optimization
ISSN:	1424-8220, 1424-8220
Online-Zugang:	Volltext
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