Active Polarization Descattering
Vision in scattering media is important but challenging. Images suffer from poor visibility due to backscattering and attenuation. Most prior methods for scene recovery use active illumination scanners (structured and gated), which can be slow and cumbersome, while natural illumination is inapplicab...
Saved in:
| Published in: | IEEE transactions on pattern analysis and machine intelligence Vol. 31; no. 3; pp. 385 - 399 |
|---|---|
| Main Authors: | , |
| Format: | Journal Article |
| Language: | English |
| Published: |
Los Alamitos, CA
IEEE
01.03.2009
IEEE Computer Society The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subjects: | |
| ISSN: | 0162-8828, 1939-3539 |
| Online Access: | Get full text |
| Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
| Abstract | Vision in scattering media is important but challenging. Images suffer from poor visibility due to backscattering and attenuation. Most prior methods for scene recovery use active illumination scanners (structured and gated), which can be slow and cumbersome, while natural illumination is inapplicable to dark environments. The current paper addresses the need for a non-scanning recovery method, that uses active scene irradiance. We study the formation of images under widefield artificial illumination. Based on the formation model, the paper presents an approach for recovering the object signal. It also yields rough information about the 3D scene structure. The approach can work with compact, simple hardware, having active widefield, polychromatic polarized illumination. The camera is fitted with a polarization analyzer. Two frames of the scene are taken, with different states of the analyzer or polarizer. A recovery algorithm follows the acquisition. It allows both the backscatter and the object reflection to be partially polarized. It thus unifies and generalizes prior polarization-based methods, which had assumed exclusive polarization of either of these components. The approach is limited to an effective range, due to image noise and illumination falloff. Thus, the limits and noise sensitivity are analyzed. We demonstrate the approach in underwater field experiments. |
|---|---|
| AbstractList | Vision in scattering media is important but challenging. Images suffer from poor visibility due to backscattering and attenuation. Most prior methods for scene recovery use active illumination scanners (structured and gated), which can [abstract truncated by publisher]. Vision in scattering media is important but challenging. Images suffer from poor visibility due to backscattering and attenuation. Most prior methods for scene recovery use active illumination scanners (structured and gated), which can be slow and cumbersome, while natural illumination is inapplicable to dark environments. The current paper addresses the need for a non-scanning recovery method, that uses active scene irradiance. We study the formation of images under widefield artificial illumination. Based on the formation model, the paper presents an approach for recovering the object signal. It also yields rough information about the 3D scene structure. The approach can work with compact, simple hardware, having active widefield, polychromatic polarized illumination. The camera is fitted with a polarization analyzer. Two frames of the scene are taken, with different states of the analyzer or polarizer. A recovery algorithm follows the acquisition. It allows both the backscatter and the object reflection to be partially polarized. It thus unifies and generalizes prior polarization-based methods, which had assumed exclusive polarization of either of these components. The approach is limited to an effective range, due to image noise and illumination falloff. Thus, the limits and noise sensitivity are analyzed. We demonstrate the approach in underwater field experiments.Vision in scattering media is important but challenging. Images suffer from poor visibility due to backscattering and attenuation. Most prior methods for scene recovery use active illumination scanners (structured and gated), which can be slow and cumbersome, while natural illumination is inapplicable to dark environments. The current paper addresses the need for a non-scanning recovery method, that uses active scene irradiance. We study the formation of images under widefield artificial illumination. Based on the formation model, the paper presents an approach for recovering the object signal. It also yields rough information about the 3D scene structure. The approach can work with compact, simple hardware, having active widefield, polychromatic polarized illumination. The camera is fitted with a polarization analyzer. Two frames of the scene are taken, with different states of the analyzer or polarizer. A recovery algorithm follows the acquisition. It allows both the backscatter and the object reflection to be partially polarized. It thus unifies and generalizes prior polarization-based methods, which had assumed exclusive polarization of either of these components. The approach is limited to an effective range, due to image noise and illumination falloff. Thus, the limits and noise sensitivity are analyzed. We demonstrate the approach in underwater field experiments. Vision in scattering media is important but challenging. Images suffer from poor visibility due to backscattering and attenuation. Most prior methods for scene recovery use active illumination scanners (structured and gated), which can be slow and cumbersome, while natural illumination is inapplicable to dark environments. The current paper addresses the need for a non-scanning recovery method, that uses active scene irradiance. We study the formation of images under widefield artificial illumination. Based on the formation model, the paper presents an approach for recovering the object signal. It also yields rough information about the 3D scene structure. The approach can work with compact, simple hardware, having active widefield, polychromatic polarized illumination. The camera is fitted with a polarization analyzer. Two frames of the scene are taken, with different states of the analyzer or polarizer. A recovery algorithm follows the acquisition. It allows both the backscatter and the object reflection to be partially polarized. It thus unifies and generalizes prior polarization-based methods, which had assumed exclusive polarization of either of these components. The approach is limited to an effective range, due to image noise and illumination falloff. Thus, the limits and noise sensitivity are analyzed. We demonstrate the approach in underwater field experiments. The approach is limited to an effective range, due to image noise and illumination falloff. [...] the limits and noise sensitivity are analyzed. |
| Author | Treibitz, T. Schechner, Y.Y. |
| Author_xml | – sequence: 1 givenname: T. surname: Treibitz fullname: Treibitz, T. organization: Electr. Eng. Dept., Technion - Israel Inst. of Technol., Haifa – sequence: 2 givenname: Y.Y. surname: Schechner fullname: Schechner, Y.Y. organization: Electr. Eng. Dept., Technion - Israel Inst. of Technol., Haifa |
| BackLink | http://pascal-francis.inist.fr/vibad/index.php?action=getRecordDetail&idt=21270092$$DView record in Pascal Francis https://www.ncbi.nlm.nih.gov/pubmed/19147870$$D View this record in MEDLINE/PubMed |
| BookMark | eNqF0k1rFEEQBuBGEswmevQkyCJocpm1-rv6uMSPBCLmsPeht6dGOszOxO5ZQX-9Pdk1QsDk1Jen3qKr6pgd9ENPjL3isOAc3IfV9fLr5UIA4AL1MzbjTrpKaukO2Ay4ERWiwCN2nPMNAFca5HN2xB1XFi3M2HwZxviT5tdD51P87cc49POPlIMfR0qx__6CHba-y_Ry_56w1edPq_OL6urbl8vz5VUVlDNjRYE8l6VDUCKsW9tKjdC0jQ1WC8N9g8KvUZrGeBDEA3dotUPlg1lT6-UJO93F3qbhx5byWG9iDtR1vqdhm2sH0gjUTj4p0ZRYp2CS7x-VxmCZlhVPQqkUoBNT4tmjkNsyAhRWq0LfPqA3wzb1ZYQ1aqss144X9GaPtusNNfVtihufftV_91PAuz3wZSVdm3wfYr53ggsL4KYfVDsX0pBzovZfFNTTndR3d1JPd1L6Fy8f-BDHu-WPycfuv1Wvd1WRiO47KIXSOpR_AAr7xRY |
| CODEN | ITPIDJ |
| CitedBy_id | crossref_primary_10_1109_LSP_2018_2792050 crossref_primary_10_1109_TIP_2017_2759252 crossref_primary_10_1007_s41064_022_00206_y crossref_primary_10_1016_j_optlastec_2024_110864 crossref_primary_10_1007_s11042_025_20818_x crossref_primary_10_1038_s41598_024_80830_3 crossref_primary_10_1016_j_ifacol_2018_09_465 crossref_primary_10_1109_TIP_2022_3177129 crossref_primary_10_3389_fmars_2024_1457190 crossref_primary_10_1016_j_ijleo_2017_09_115 crossref_primary_10_1631_FITEE_1700744 crossref_primary_10_1631_FITEE_2000190 crossref_primary_10_1088_2040_8986_ac51b3 crossref_primary_10_1364_AO_424917 crossref_primary_10_1016_j_optlaseng_2020_106152 crossref_primary_10_1016_j_optlastec_2024_112375 crossref_primary_10_1109_TGRS_2023_3339216 crossref_primary_10_1016_j_optcom_2025_131848 crossref_primary_10_1109_ACCESS_2022_3221407 crossref_primary_10_1109_JPHOT_2018_2890771 crossref_primary_10_1016_j_optlaseng_2021_106777 crossref_primary_10_1364_AO_58_007367 crossref_primary_10_1364_PRJ_2_000038 crossref_primary_10_1016_j_heliyon_2023_e14442 crossref_primary_10_1109_TCSVT_2024_3512600 crossref_primary_10_1016_j_optcom_2017_01_012 crossref_primary_10_1016_j_optlaseng_2024_108333 crossref_primary_10_1016_j_optlaseng_2024_108575 crossref_primary_10_1016_j_neucom_2020_03_091 crossref_primary_10_1109_TCI_2022_3162259 crossref_primary_10_1364_AO_52_000997 crossref_primary_10_1117_1_JEI_33_4_043031 crossref_primary_10_1007_s11042_017_5518_8 crossref_primary_10_1073_pnas_1321368111 crossref_primary_10_1109_JDT_2011_2176917 crossref_primary_10_1016_j_optlaseng_2025_108826 crossref_primary_10_3390_photonics10020145 crossref_primary_10_1002_advs_202309998 crossref_primary_10_1109_JOE_2024_3463838 crossref_primary_10_1109_ACCESS_2020_3009161 crossref_primary_10_1016_j_optlaseng_2025_109233 crossref_primary_10_1016_j_optlaseng_2025_109113 crossref_primary_10_1109_JPHOT_2023_3326158 crossref_primary_10_1109_JSEN_2020_3027030 crossref_primary_10_3390_s22093159 crossref_primary_10_3390_app11072996 crossref_primary_10_3390_photonics11111069 crossref_primary_10_1016_j_image_2022_116684 crossref_primary_10_1155_2016_5985673 crossref_primary_10_1587_transinf_2019EDP7219 crossref_primary_10_1109_TIP_2019_2919947 crossref_primary_10_1016_j_imavis_2024_104995 crossref_primary_10_1007_s10043_024_00941_0 crossref_primary_10_1007_s44295_023_00009_w crossref_primary_10_1016_j_optlastec_2024_110549 crossref_primary_10_1038_s41377_019_0143_0 crossref_primary_10_1364_AO_563125 crossref_primary_10_1016_j_optlastec_2022_108584 crossref_primary_10_1109_ACCESS_2023_3322153 crossref_primary_10_1109_JPHOT_2025_3594762 crossref_primary_10_1117_1_JEI_33_2_023001 crossref_primary_10_1145_3656473 crossref_primary_10_1016_j_ijleo_2018_01_017 crossref_primary_10_1016_j_measurement_2022_111556 crossref_primary_10_1016_j_optlastec_2025_113810 crossref_primary_10_1016_j_displa_2022_102296 crossref_primary_10_1016_j_optlaseng_2024_108804 crossref_primary_10_1109_TCI_2025_3544065 crossref_primary_10_1109_TGRS_2021_3110575 crossref_primary_10_1016_j_optlaseng_2019_105871 crossref_primary_10_1016_j_optlaseng_2023_107550 crossref_primary_10_1016_j_optlaseng_2023_107796 crossref_primary_10_1016_j_optcom_2015_09_109 crossref_primary_10_1088_1361_6501_abaa1d crossref_primary_10_3788_PI_2025_R03 crossref_primary_10_1088_2040_8986_adda5e crossref_primary_10_1364_AO_505198 crossref_primary_10_1051_jnwpu_20193730471 crossref_primary_10_1109_ACCESS_2018_2875344 crossref_primary_10_1109_TIP_2012_2208978 crossref_primary_10_3788_AI_2025_20002 crossref_primary_10_1364_AO_57_004992 crossref_primary_10_1364_AO_56_006631 crossref_primary_10_1177_1729881419864468 crossref_primary_10_1364_AO_423184 crossref_primary_10_3390_rs16173286 crossref_primary_10_1016_j_knosys_2024_112651 crossref_primary_10_3390_s19071713 crossref_primary_10_1007_s11042_019_07922_5 crossref_primary_10_3390_rs15061540 crossref_primary_10_1007_s41064_022_00191_2 crossref_primary_10_1007_s11802_020_4003_6 crossref_primary_10_1109_JPHOT_2017_2698000 crossref_primary_10_1016_j_optlaseng_2024_108265 crossref_primary_10_1109_TCI_2024_3420881 crossref_primary_10_1016_j_optlastec_2023_110039 crossref_primary_10_1109_JSEN_2025_3540412 crossref_primary_10_1109_JPHOT_2018_2791517 crossref_primary_10_1364_AO_476003 crossref_primary_10_1016_j_optlastec_2024_111669 crossref_primary_10_1016_j_ijleo_2021_168381 crossref_primary_10_1016_j_optcom_2018_12_022 crossref_primary_10_1109_JOE_2018_2875574 crossref_primary_10_1109_ACCESS_2019_2959560 crossref_primary_10_1038_s41598_022_05852_1 crossref_primary_10_1186_s41074_018_0049_4 crossref_primary_10_1364_AO_54_008116 crossref_primary_10_1016_j_optlaseng_2020_106256 crossref_primary_10_1364_PRJ_7_000847 crossref_primary_10_1111_mice_13440 crossref_primary_10_3390_jmse12111955 crossref_primary_10_1109_TCI_2024_3404612 crossref_primary_10_1364_AO_55_008221 crossref_primary_10_3389_fphy_2022_815296 crossref_primary_10_3390_photonics10020204 crossref_primary_10_1088_2515_7647_ada997 crossref_primary_10_1016_j_optmat_2024_115274 crossref_primary_10_3390_s23218896 crossref_primary_10_1088_1742_6596_3023_1_012006 crossref_primary_10_1364_AO_437391 crossref_primary_10_1364_AO_54_003294 crossref_primary_10_1016_j_eswa_2025_126561 crossref_primary_10_1109_TPAMI_2018_2889088 crossref_primary_10_1364_AO_51_005633 crossref_primary_10_3390_s25030704 crossref_primary_10_1016_j_optlaseng_2021_106925 crossref_primary_10_1016_j_engappai_2023_107069 crossref_primary_10_1364_OE_551935 crossref_primary_10_1007_s11263_017_1025_7 crossref_primary_10_1364_AO_50_000F89 crossref_primary_10_3390_s23125594 crossref_primary_10_1038_srep09616 crossref_primary_10_3390_s23042169 crossref_primary_10_1109_JPHOT_2024_3523328 crossref_primary_10_1016_j_cviu_2016_03_002 crossref_primary_10_1016_j_optlastec_2025_112900 crossref_primary_10_1088_0256_307X_32_7_074201 crossref_primary_10_1587_transinf_2016EDP7486 crossref_primary_10_1016_j_optcom_2021_126892 crossref_primary_10_1016_j_optlaseng_2023_107934 crossref_primary_10_1109_JPHOT_2018_2890286 crossref_primary_10_1109_TED_2014_2299757 crossref_primary_10_1186_s43074_025_00185_4 crossref_primary_10_3390_s23177446 crossref_primary_10_1109_JPHOT_2021_3094359 crossref_primary_10_1109_TPAMI_2024_3403234 crossref_primary_10_1016_j_optlaseng_2024_108194 crossref_primary_10_1109_LSP_2020_3005045 crossref_primary_10_3389_fphy_2021_815360 crossref_primary_10_1109_ACCESS_2020_3040505 crossref_primary_10_1109_TPAMI_2016_2613862 crossref_primary_10_1109_ACCESS_2020_3045993 crossref_primary_10_1109_ACCESS_2020_2982910 crossref_primary_10_1049_iet_ipr_2017_0259 crossref_primary_10_3389_fphy_2022_813634 crossref_primary_10_1007_s12145_025_01913_x crossref_primary_10_1088_1361_6463_aab28f crossref_primary_10_1109_JPHOT_2020_3048007 crossref_primary_10_1002_lpor_202100097 crossref_primary_10_1109_TPAMI_2023_3299526 crossref_primary_10_3390_s17061425 crossref_primary_10_1016_j_neucom_2018_10_089 crossref_primary_10_1109_TPAMI_2019_2959304 crossref_primary_10_1016_j_heliyon_2023_e15849 crossref_primary_10_1016_j_imavis_2016_10_005 crossref_primary_10_1364_AO_564737 crossref_primary_10_1016_j_neunet_2023_11_008 crossref_primary_10_1364_OE_562111 crossref_primary_10_1016_j_ijleo_2023_171179 crossref_primary_10_1155_2010_746052 crossref_primary_10_1109_TCSVT_2019_2963772 crossref_primary_10_3390_s24206681 crossref_primary_10_3390_s17081726 crossref_primary_10_1109_ACCESS_2021_3086820 crossref_primary_10_1007_s00138_022_01337_3 crossref_primary_10_1109_TIM_2021_3120130 crossref_primary_10_1109_JOE_2025_3562630 crossref_primary_10_1109_TCSVT_2023_3297524 crossref_primary_10_1364_AO_510602 crossref_primary_10_1016_j_optcom_2017_12_025 crossref_primary_10_1016_j_optlaseng_2024_108414 crossref_primary_10_1007_s11431_023_2614_8 crossref_primary_10_3390_app14051769 crossref_primary_10_1016_j_optlastec_2025_113522 crossref_primary_10_1109_TIP_2014_2358882 crossref_primary_10_1007_s11042_017_5474_3 crossref_primary_10_1039_D1NH00465D crossref_primary_10_1109_JPHOT_2020_3047609 crossref_primary_10_1002_jsid_838 crossref_primary_10_1063_5_0282969 crossref_primary_10_3390_technologies13050210 crossref_primary_10_1080_01431161_2025_2555280 crossref_primary_10_1145_3478513_3480517 crossref_primary_10_1109_TGRS_2022_3227548 crossref_primary_10_1088_2040_8986_ac83d6 crossref_primary_10_1007_s11801_020_9135_9 crossref_primary_10_1063_1_4901244 crossref_primary_10_1016_j_optcom_2025_131695 crossref_primary_10_1109_TIP_2019_2955241 crossref_primary_10_1109_TPAMI_2011_105 crossref_primary_10_1364_AO_54_007316 crossref_primary_10_1016_j_optlaseng_2020_106088 crossref_primary_10_1016_j_optlaseng_2023_107737 crossref_primary_10_1007_s10489_022_03767_y crossref_primary_10_1016_j_optlaseng_2025_108865 crossref_primary_10_1364_AO_555392 crossref_primary_10_1080_09500340_2018_1429682 crossref_primary_10_3390_math12223553 crossref_primary_10_1364_AO_567237 crossref_primary_10_1049_ipr2_12041 crossref_primary_10_1109_JOE_2015_2469915 crossref_primary_10_1049_iet_ipr_2019_0117 crossref_primary_10_1038_ncomms6386 crossref_primary_10_3390_jmse11071476 crossref_primary_10_3390_app14188465 crossref_primary_10_1109_JPHOT_2022_3221726 crossref_primary_10_1016_j_optlaseng_2023_107721 crossref_primary_10_1016_j_optlaseng_2023_107963 crossref_primary_10_3390_app13042054 crossref_primary_10_1109_JOE_2022_3140563 crossref_primary_10_3390_s20154343 |
| Cites_doi | 10.1016/S0262-8856(96)01123-7 10.1242/jeb.01187 10.1145/1073204.1073309 10.1117/1.1484498 10.1364/JOSAA.16.002136 10.1145/1015706.1015806 10.1109/ICCV.2005.232 10.1109/CVPR.2005.275 10.1364/AO.37.007357 10.1109/TPAMI.2007.1141 10.1016/0042-6989(93)90166-T 10.1109/CVPR.2008.4587768 10.1109/CVPR.2006.71 10.1117/12.143954 10.1117/12.364201 10.1103/PhysRevB.40.9342 10.1109/IMTC.2004.1351080 10.1016/j.sigpro.2004.11.022 10.1109/CVPR.2005.195 10.1364/AO.35.001855 10.1145/1179352.1141977 10.1109/JOE.2005.850871 10.4031/002533205787442576 10.1109/CVPR.2007.383162 10.1364/AO.42.000511 10.1109/CVPR.1997.609419 10.1364/OE.7.000395 10.1117/12.49256 10.1364/JOSAA.17.000276 10.1109/TPAMI.2007.1151 10.1117/12.48880 10.1109/CVPR.2008.4587763 10.1364/OL.24.001044 10.1109/CVPR.2007.383262 10.1364/AO.6.000741 10.1109/CVPR.2000.855795 10.1364/AO.38.003399 10.1364/OL.21.000161 10.1109/CVPR.2006.155 10.1364/AO.38.003937 10.1109/CVPR.2004.1315078 10.1109/48.50695 10.1109/CVPR.2007.383209 10.1109/CVPR.2008.4587844 10.1109/IVS.2000.898404 10.1023/A:1016328200723 10.1117/1.1483318 10.1109/CVPR.2001.990493 |
| ContentType | Journal Article |
| Copyright | 2009 INIST-CNRS Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2009 |
| Copyright_xml | – notice: 2009 INIST-CNRS – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2009 |
| DBID | 97E RIA RIE AAYXX CITATION IQODW CGR CUY CVF ECM EIF NPM 7SC 7SP 8FD JQ2 L7M L~C L~D F28 FR3 7X8 7TN F1W H96 L.G |
| DOI | 10.1109/TPAMI.2008.85 |
| DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005–Present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Electronic Library (IEL) CrossRef Pascal-Francis Medline MEDLINE MEDLINE (Ovid) MEDLINE MEDLINE PubMed Computer and Information Systems Abstracts Electronics & Communications Abstracts Technology Research Database ProQuest Computer Science Collection Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Academic Computer and Information Systems Abstracts Professional ANTE: Abstracts in New Technology & Engineering Engineering Research Database MEDLINE - Academic Oceanic Abstracts ASFA: Aquatic Sciences and Fisheries Abstracts Aquatic Science & Fisheries Abstracts (ASFA) 2: Ocean Technology, Policy & Non-Living Resources Aquatic Science & Fisheries Abstracts (ASFA) Professional |
| DatabaseTitle | CrossRef MEDLINE Medline Complete MEDLINE with Full Text PubMed MEDLINE (Ovid) Technology Research Database Computer and Information Systems Abstracts – Academic Electronics & Communications Abstracts ProQuest Computer Science Collection Computer and Information Systems Abstracts Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Professional Engineering Research Database ANTE: Abstracts in New Technology & Engineering MEDLINE - Academic Aquatic Science & Fisheries Abstracts (ASFA) Professional Aquatic Science & Fisheries Abstracts (ASFA) 2: Ocean Technology, Policy & Non-Living Resources Oceanic Abstracts ASFA: Aquatic Sciences and Fisheries Abstracts |
| DatabaseTitleList | Technology Research Database MEDLINE - Academic Technology Research Database Technology Research Database Aquatic Science & Fisheries Abstracts (ASFA) Professional Technology Research Database MEDLINE |
| Database_xml | – sequence: 1 dbid: NPM name: PubMed url: http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed sourceTypes: Index Database – sequence: 2 dbid: RIE name: IEEE Electronic Library (IEL) url: https://ieeexplore.ieee.org/ sourceTypes: Publisher – sequence: 3 dbid: 7X8 name: MEDLINE - Academic url: https://search.proquest.com/medline sourceTypes: Aggregation Database |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering Computer Science Applied Sciences |
| EISSN | 1939-3539 |
| EndPage | 399 |
| ExternalDocumentID | 2295247711 19147870 21270092 10_1109_TPAMI_2008_85 4483798 |
| Genre | orig-research Research Support, Non-U.S. Gov't Journal Article |
| GroupedDBID | --- -DZ -~X .DC 0R~ 29I 4.4 53G 5GY 5VS 6IK 97E 9M8 AAJGR AARMG AASAJ AAWTH ABAZT ABFSI ABQJQ ABVLG ACGFO ACGFS ACIWK ACNCT ADRHT AENEX AETEA AETIX AGQYO AGSQL AHBIQ AI. AIBXA AKJIK AKQYR ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 E.L EBS EJD F5P FA8 HZ~ H~9 IBMZZ ICLAB IEDLZ IFIPE IFJZH IPLJI JAVBF LAI M43 MS~ O9- OCL P2P PQQKQ RIA RIE RNI RNS RXW RZB TAE TN5 UHB VH1 XJT ~02 AAYXX CITATION IQODW RIG CGR CUY CVF ECM EIF NPM 7SC 7SP 8FD JQ2 L7M L~C L~D F28 FR3 7X8 7TN F1W H96 L.G |
| ID | FETCH-LOGICAL-c496t-ecea13001c42cbf7f3580dfd7c75261ad82ab836d6a02e1c19875984ac6befa3 |
| IEDL.DBID | RIE |
| ISICitedReferencesCount | 383 |
| ISICitedReferencesURI | http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000262480200001&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| ISSN | 0162-8828 |
| IngestDate | Tue Sep 30 23:35:14 EDT 2025 Sun Sep 28 09:07:18 EDT 2025 Wed Oct 01 08:16:46 EDT 2025 Sat Sep 27 19:14:15 EDT 2025 Thu Oct 02 10:26:59 EDT 2025 Sun Nov 30 04:56:31 EST 2025 Mon Jul 21 06:09:15 EDT 2025 Mon Jul 21 09:13:58 EDT 2025 Tue Nov 18 21:24:08 EST 2025 Sat Nov 29 08:10:12 EST 2025 Tue Aug 26 16:47:39 EDT 2025 |
| IsPeerReviewed | true |
| IsScholarly | true |
| Issue | 3 |
| Keywords | Computer vision Modeling and recovery of physical attributes Color Scattering medium Polarization Scanner Light source image recovery Irradiance Modeling Light sources Imaging inverse problems Pattern analysis Fog modeling and recovery of physical attributes physics-based vision Image restoration scene analysis-color Color image Depth of field Inverse problem vision in scattering media Luminance Scene analysis Visibility Artificial intelligence |
| Language | English |
| License | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html CC BY 4.0 |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c496t-ecea13001c42cbf7f3580dfd7c75261ad82ab836d6a02e1c19875984ac6befa3 |
| Notes | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 content type line 23 ObjectType-Article-2 ObjectType-Feature-1 |
| PMID | 19147870 |
| PQID | 857471591 |
| PQPubID | 23500 |
| PageCount | 15 |
| ParticipantIDs | pubmed_primary_19147870 proquest_miscellaneous_34408923 pascalfrancis_primary_21270092 proquest_miscellaneous_903628593 crossref_citationtrail_10_1109_TPAMI_2008_85 proquest_miscellaneous_66819372 ieee_primary_4483798 proquest_miscellaneous_869849403 proquest_journals_857471591 crossref_primary_10_1109_TPAMI_2008_85 proquest_miscellaneous_1730082754 |
| PublicationCentury | 2000 |
| PublicationDate | 2009-03-01 |
| PublicationDateYYYYMMDD | 2009-03-01 |
| PublicationDate_xml | – month: 03 year: 2009 text: 2009-03-01 day: 01 |
| PublicationDecade | 2000 |
| PublicationPlace | Los Alamitos, CA |
| PublicationPlace_xml | – name: Los Alamitos, CA – name: United States – name: New York |
| PublicationTitle | IEEE transactions on pattern analysis and machine intelligence |
| PublicationTitleAbbrev | TPAMI |
| PublicationTitleAlternate | IEEE Trans Pattern Anal Mach Intell |
| PublicationYear | 2009 |
| Publisher | IEEE IEEE Computer Society The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher_xml | – name: IEEE – name: IEEE Computer Society – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| References | ref12 ref14 ref52 ref11 ref10 ref54 McGlamery (ref26); 208 ref17 ref16 ref19 ref18 ref51 ref50 ref46 ref45 ref48 ref47 ref42 ref41 ref44 ref43 ref49 ref8 ref7 ref9 ref4 ref3 ref6 ref5 ref40 Mobley (ref28) 1994 ref35 ref34 ref37 ref36 ref31 ref30 ref33 ref32 Wells (ref53) 2005; 41 ref2 ref1 ref39 ref38 ref24 ref23 ref25 ref20 ref21 ref27 Harvey (ref15) 1998; 32 ref29 (ref13) 1998 Kokhanovsky (ref22) 2004 |
| References_xml | – ident: ref54 doi: 10.1016/S0262-8856(96)01123-7 – ident: ref44 doi: 10.1242/jeb.01187 – ident: ref48 doi: 10.1145/1073204.1073309 – ident: ref16 doi: 10.1117/1.1484498 – ident: ref8 doi: 10.1364/JOSAA.16.002136 – ident: ref23 doi: 10.1145/1015706.1015806 – ident: ref31 doi: 10.1109/ICCV.2005.232 – volume-title: Light and Water: Radiative Transfer in Natural Waters year: 1994 ident: ref28 – ident: ref5 doi: 10.1109/CVPR.2005.275 – ident: ref19 doi: 10.1364/AO.37.007357 – ident: ref37 doi: 10.1109/TPAMI.2007.1141 – ident: ref18 doi: 10.1016/0042-6989(93)90166-T – ident: ref7 doi: 10.1109/CVPR.2008.4587768 – ident: ref45 doi: 10.1109/CVPR.2006.71 – ident: ref9 doi: 10.1117/12.143954 – ident: ref14 doi: 10.1117/12.364201 – volume: 208 start-page: 221 volume-title: Proc. SPIE ident: ref26 article-title: A Computer Model for Underwater Camera System – ident: ref25 doi: 10.1103/PhysRevB.40.9342 – ident: ref10 doi: 10.1109/IMTC.2004.1351080 – ident: ref46 doi: 10.1016/j.sigpro.2004.11.022 – ident: ref27 doi: 10.1109/CVPR.2005.195 – ident: ref52 doi: 10.1364/AO.35.001855 – ident: ref32 doi: 10.1145/1179352.1141977 – ident: ref39 doi: 10.1109/JOE.2005.850871 – ident: ref21 doi: 10.4031/002533205787442576 – ident: ref34 doi: 10.1109/CVPR.2007.383162 – ident: ref41 doi: 10.1364/AO.42.000511 – ident: ref4 doi: 10.1109/CVPR.1997.609419 – ident: ref29 doi: 10.1364/OE.7.000395 – ident: ref49 doi: 10.1117/12.49256 – start-page: 200. volume-title: Light Scattering Media Optics year: 2004 ident: ref22 – ident: ref43 doi: 10.1364/JOSAA.17.000276 – ident: ref42 doi: 10.1109/TPAMI.2007.1151 – ident: ref47 doi: 10.1117/12.48880 – ident: ref12 doi: 10.1109/CVPR.2008.4587763 – ident: ref35 doi: 10.1364/OL.24.001044 – ident: ref20 doi: 10.1109/CVPR.2007.383262 – ident: ref11 doi: 10.1364/AO.6.000741 – volume: 32 start-page: 3 issue: 2 year: 1998 ident: ref15 article-title: Calibration Stability of an Underwater Stereo-Video System: Implications for Measurement Accuracy and Precision publication-title: Marine Technology Soc. J. – ident: ref2 doi: 10.1109/CVPR.2000.855795 – ident: ref33 doi: 10.1364/AO.38.003399 – volume: 41 issue: 10 year: 2005 ident: ref53 article-title: MTF Provides an Image-Quality Metric publication-title: Laser Focus World – ident: ref6 doi: 10.1364/OL.21.000161 – ident: ref50 doi: 10.1109/CVPR.2006.155 – ident: ref24 doi: 10.1364/AO.38.003937 – ident: ref38 doi: 10.1109/CVPR.2004.1315078 – ident: ref17 doi: 10.1109/48.50695 – ident: ref3 doi: 10.1109/CVPR.2007.383209 – volume-title: Xenon Flash Lamps, Hamamatsu, Catalog TLSX1008E04 (Hamamatsu Photonics K.K., Electron Tube Center) year: 1998 ident: ref13 – ident: ref51 doi: 10.1109/CVPR.2008.4587844 – ident: ref1 doi: 10.1109/IVS.2000.898404 – ident: ref30 doi: 10.1023/A:1016328200723 – ident: ref36 doi: 10.1117/1.1483318 – ident: ref40 doi: 10.1109/CVPR.2001.990493 |
| SSID | ssj0014503 |
| Score | 2.4963841 |
| Snippet | Vision in scattering media is important but challenging. Images suffer from poor visibility due to backscattering and attenuation. Most prior methods for scene... The approach is limited to an effective range, due to image noise and illumination falloff. [...] the limits and noise sensitivity are analyzed. |
| SourceID | proquest pubmed pascalfrancis crossref ieee |
| SourceType | Aggregation Database Index Database Enrichment Source Publisher |
| StartPage | 385 |
| SubjectTerms | Algorithms Applied sciences Artificial Intelligence Attenuation Backscatter Backscattering Cameras Color Computer science; control theory; systems Computer vision Exact sciences and technology Illumination Image Enhancement - methods Image Interpretation, Computer-Assisted - methods Layout Light Light scattering Lighting Mathematical models Modeling and recovery of physical attributes Optical modulation Optical polarization Optical reflection Optical scattering Pattern Recognition, Automated - methods Pattern recognition. Digital image processing. Computational geometry Polarization Recovery Refractometry - methods Reproducibility of Results Scattering, Radiation Sensitivity and Specificity Three dimensional |
| Title | Active Polarization Descattering |
| URI | https://ieeexplore.ieee.org/document/4483798 https://www.ncbi.nlm.nih.gov/pubmed/19147870 https://www.proquest.com/docview/857471591 https://www.proquest.com/docview/1730082754 https://www.proquest.com/docview/34408923 https://www.proquest.com/docview/66819372 https://www.proquest.com/docview/869849403 https://www.proquest.com/docview/903628593 |
| Volume | 31 |
| WOSCitedRecordID | wos000262480200001&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVIEE databaseName: IEEE Electronic Library (IEL) customDbUrl: eissn: 1939-3539 dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0014503 issn: 0162-8828 databaseCode: RIE dateStart: 19790101 isFulltext: true titleUrlDefault: https://ieeexplore.ieee.org/ providerName: IEEE |
| link | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LT-MwEB4B4gAHnguERzcrrTiRJXEcP44VAoHEoh566C1yHFtaadUi2vL7mXHSABI5cIuSUWSNPfE3Gc_3AfzG2zVTzicI9qklR2SJxl0yyTyzVqg6rVxoFH6UT09qMtGjNbjqemGcc-HwmftDl6GWX8_skn6VXXOiP9dqHdalFE2vVlcx4EVQQUYEgxGOacQ7n-b1eDT8-9Acm1RBqUZnREmTftqKgrYKnYw0c3SOb1Qt-mFn2H7udr838D3YaWFmPGzWxT6suekB7K4kHOI2og9g-wMf4SHEw_D1i0eU77YNmjFmpjaQcKLJDxjf3Y5v7pNWQiGxXItF4qwzVLDKLGe28tJT1bP2tbSywNzJ1IqZSuWiFiZlLrP0C6LQihsrKudNfgQb09nUnUDMrUIk6SXhGZ6zWucV6RY7ro33uc4iuFo5s7QtvTipXPwvQ5qR6jJMQyN7qYoILjvz54ZXo8_wkPzZGbWujGDwaaa65yyU0jWL4Gw1dWUblnN8HeXgBY32V_cU44mKJGbqZst5mRGBv2Ky4BH87LHJSaYbkXG_hRCItHKJo4h7LJRAN2ue5v0mmtAF8dFFcNysvXdXtUv49GvvnMFWU_Wis3LnsLF4WboL2LSvi3_zlwGGz0QNQvi8Aaf8FIA |
| linkProvider | IEEE |
| linkToHtml | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1NT-MwEB3xJbEcYBdYCJ9BWu2J0MRxHPtYIRCIUvXQA7fIcWwJCbWItvv7d8ZJA0jkwC1KRpE19sRvMp73AP7g7YpJ6yIE-9SSI5JI4S4ZJY4ZI2QVl9Y3Cg_y4VA-PanRCly2vTDWWn_4zF7Rpa_lV1OzoF9lPU7050quwnrGOYvrbq22ZsAzr4OMGAZjHBOJd0bN3njUf7yvD05Kr1WjEiKliT9tRl5dhc5G6hm6x9W6Ft3A029AtzvfG_pP2G6AZtivV8YvWLGTXdhZijiETUzvwtYHRsI9CPv--xeOKONtWjRDzE2Np-FEk30Y396Mr--iRkQhMlyJeWSN1VSySgxnpnS5o7pn5arc5BlmT7qSTJcyFZXQMbOJoZ8QmZJcG1Fap9PfsDaZTuwhhNxIxJIuJ0TDU1aptCTlYsuVdi5VSQCXS2cWpiEYJ52Ll8InGrEq_DTUwpcyC-Bva_5aM2t0Ge6RP1ujxpUBnH2aqfY588V0xQI4Xk5d0QTmDF9HWXhGo71on2JEUZlET-x0MSsSovCXLM94AOcdNikJdSM27rYQArFWmuMowg4LKdDNisdpt4kifEGMdAEc1Gvv3VXNEj762jvnsHk3fhwUg_vhwzH8qGtgdHLuBNbmbwt7Chvm3_x59nbmg-g_ojwW3w |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Active+Polarization+Descattering&rft.jtitle=IEEE+transactions+on+pattern+analysis+and+machine+intelligence&rft.au=TREIBITZ%2C+Tali&rft.au=SCHECHNER%2C+Yoav+Y&rft.date=2009-03-01&rft.pub=IEEE+Computer+Society&rft.issn=0162-8828&rft.volume=31&rft.issue=3&rft.spage=385&rft.epage=399&rft_id=info:doi/10.1109%2FTPAMI.2008.85&rft.externalDBID=n%2Fa&rft.externalDocID=21270092 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0162-8828&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0162-8828&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0162-8828&client=summon |