Visualization of Defects on a Cultured Cell Layer by Utilizing Chemical Imaging Sensor

The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance (in SPIM mode) inthe sample. In this study, a novel wound-healing assay is proposed, in which the chemical imaging sensor operated in SPIM mo...

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Vydáno v:Procedia engineering Ročník 120; s. 936 - 939
Hlavní autoři: Miyamoto, Ko-ichiro, Bing, Yu, Wagner, Torsten, Yoshinobu, Tatsuo, Schöning, Michael J.
Médium: Journal Article
Jazyk:angličtina
Vydáno: Elsevier Ltd 2015
Témata:
chemical imaging sensor
impedance
SPIM
wound-healing assay
chemical imaging sensor
impedance
wound-healing assay
SPIM
ISSN:1877-7058, 1877-7058
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Shrnutí:The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance (in SPIM mode) inthe sample. In this study, a novel wound-healing assay is proposed, in which the chemical imaging sensor operated in SPIM mode is applied to monitor the defect of a cell layer brought into proximity of the sensing surface.A reduced impedance inside the defect, which was artificially formed ina cell layer, was successfully visualized in a photocurrent image.
ISSN:1877-7058
1877-7058
DOI:10.1016/j.proeng.2015.08.806