Visualization of Defects on a Cultured Cell Layer by Utilizing Chemical Imaging Sensor

The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance (in SPIM mode) inthe sample. In this study, a novel wound-healing assay is proposed, in which the chemical imaging sensor operated in SPIM mo...

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Vydané v:Procedia engineering Ročník 120; s. 936 - 939
Hlavní autori: Miyamoto, Ko-ichiro, Bing, Yu, Wagner, Torsten, Yoshinobu, Tatsuo, Schöning, Michael J.
Médium: Journal Article
Jazyk:English
Vydavateľské údaje: Elsevier Ltd 2015
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ISSN:1877-7058, 1877-7058
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Abstract The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance (in SPIM mode) inthe sample. In this study, a novel wound-healing assay is proposed, in which the chemical imaging sensor operated in SPIM mode is applied to monitor the defect of a cell layer brought into proximity of the sensing surface.A reduced impedance inside the defect, which was artificially formed ina cell layer, was successfully visualized in a photocurrent image.
AbstractList The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance (in SPIM mode) inthe sample. In this study, a novel wound-healing assay is proposed, in which the chemical imaging sensor operated in SPIM mode is applied to monitor the defect of a cell layer brought into proximity of the sensing surface.A reduced impedance inside the defect, which was artificially formed ina cell layer, was successfully visualized in a photocurrent image.
Author Bing, Yu
Miyamoto, Ko-ichiro
Yoshinobu, Tatsuo
Schöning, Michael J.
Wagner, Torsten
Author_xml – sequence: 1
  givenname: Ko-ichiro
  surname: Miyamoto
  fullname: Miyamoto, Ko-ichiro
  email: k-miya@ecei.tohoku.ac.jp
  organization: Department of Electronic Engineering, Tohoku University, 6-6-05 Aramaki-aza-Aoba, Aoba-ku, Sendai, 980-8579, Japan
– sequence: 2
  givenname: Yu
  surname: Bing
  fullname: Bing, Yu
  organization: Department of Electronic Engineering, Tohoku University, 6-6-05 Aramaki-aza-Aoba, Aoba-ku, Sendai, 980-8579, Japan
– sequence: 3
  givenname: Torsten
  surname: Wagner
  fullname: Wagner, Torsten
  organization: Institute of Nano- and Biotechnologies, Aachen University of Applied Sciences, Jülich, 52428, Germany
– sequence: 4
  givenname: Tatsuo
  surname: Yoshinobu
  fullname: Yoshinobu, Tatsuo
  organization: Department of Electronic Engineering, Tohoku University, 6-6-05 Aramaki-aza-Aoba, Aoba-ku, Sendai, 980-8579, Japan
– sequence: 5
  givenname: Michael J.
  surname: Schöning
  fullname: Schöning, Michael J.
  organization: Institute of Nano- and Biotechnologies, Aachen University of Applied Sciences, Jülich, 52428, Germany
BookMark eNqFkN9OwyAUh4mZiXPuDbzgBVqhHS31wsTUf0uWeKHbLaH0dLJ0sAAzmU8vdV4YL_TccDjh-4XznaORsQYQuqQkpYQWV5t05yyYdZoRylLCU06KEzSmvCyTkjA--tGfoan3GzJUSTJGx2i10n4ve_0hg7YG2w7fQQcqeBxvEtf7PuwdtLiGvscLeQCHmwNeBh0Rbda4foOtVrLH861cD4MXMN66C3Tayd7D9PucoOXD_Wv9lCyeH-f17SJRM85D0kGWFfFzWTNjeSnjAhXnUDSF6hhnLIesbVgTJ0RWvM1JWTQVlRSyirUyvs8naHbMVc5676ATO6e30h0EJWLQIzbiqEcMegThIuqJ2PUvTOnwZSA4qfv_4JsjDHGxdw1OeKXBKGi1i-ZEa_XfAZ9Bg4Vs
CitedBy_id crossref_primary_10_1002_pssa_201800766
crossref_primary_10_1002_pssa_202100147
Cites_doi 10.1016/S0013-4686(02)00088-9
10.1371/journal.pone.0055775
10.1126/science.3375810
10.1016/0925-4005(93)01199-E
ContentType Journal Article
Copyright 2015 The Authors
Copyright_xml – notice: 2015 The Authors
DBID 6I.
AAFTH
AAYXX
CITATION
DOI 10.1016/j.proeng.2015.08.806
DatabaseName ScienceDirect Open Access Titles
Elsevier:ScienceDirect:Open Access
CrossRef
DatabaseTitle CrossRef
DatabaseTitleList
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1877-7058
EndPage 939
ExternalDocumentID 10_1016_j_proeng_2015_08_806
S1877705815024698
GroupedDBID --K
0R~
0SF
1B1
4.4
457
5VS
6I.
71M
AACTN
AAEDT
AAEDW
AAFTH
AAFWJ
AAIKJ
AALRI
AAQFI
AAXUO
ABMAC
ACGFS
ADBBV
ADEZE
ADMUD
AEXQZ
AFTJW
AGHFR
AITUG
ALMA_UNASSIGNED_HOLDINGS
AMRAJ
E3Z
EBS
EJD
EP3
FDB
FEDTE
FNPLU
HVGLF
HZ~
IXB
KQ8
M41
M~E
NCXOZ
O-L
O9-
OK1
OZT
P2P
RIG
ROL
SES
SSZ
XH2
9DU
AAYWO
AAYXX
ABWVN
ACRPL
ACVFH
ADCNI
ADNMO
ADVLN
AEUPX
AFPUW
AIGII
AKBMS
AKRWK
AKYEP
CITATION
~HD
ID FETCH-LOGICAL-c488t-fe2268772b4537a015988e6b6cf58553e2db5b8e60a98d3076b91a1e295da7a03
ISICitedReferencesCount 2
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000380499300216&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN 1877-7058
IngestDate Sat Nov 29 05:44:11 EST 2025
Tue Nov 18 22:34:49 EST 2025
Fri Feb 23 02:24:18 EST 2024
IsDoiOpenAccess true
IsOpenAccess true
IsPeerReviewed true
IsScholarly true
Keywords chemical imaging sensor
impedance
wound-healing assay
SPIM
Language English
License http://creativecommons.org/licenses/by-nc-nd/4.0
LinkModel OpenURL
MergedId FETCHMERGED-LOGICAL-c488t-fe2268772b4537a015988e6b6cf58553e2db5b8e60a98d3076b91a1e295da7a03
OpenAccessLink https://dx.doi.org/10.1016/j.proeng.2015.08.806
PageCount 4
ParticipantIDs crossref_primary_10_1016_j_proeng_2015_08_806
crossref_citationtrail_10_1016_j_proeng_2015_08_806
elsevier_sciencedirect_doi_10_1016_j_proeng_2015_08_806
PublicationCentury 2000
PublicationDate 2015
2015-00-00
PublicationDateYYYYMMDD 2015-01-01
PublicationDate_xml – year: 2015
  text: 2015
PublicationDecade 2010
PublicationTitle Procedia engineering
PublicationYear 2015
Publisher Elsevier Ltd
Publisher_xml – name: Elsevier Ltd
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SSID ssj0000070251
Score 1.9881021
Snippet The chemical imaging sensor is a field-effect sensor which is able to visualize both the distribution of ions (in LAPS mode) and the distribution of impedance...
SourceID crossref
elsevier
SourceType Enrichment Source
Index Database
Publisher
StartPage 936
SubjectTerms chemical imaging sensor
impedance
SPIM
wound-healing assay
Title Visualization of Defects on a Cultured Cell Layer by Utilizing Chemical Imaging Sensor
URI https://dx.doi.org/10.1016/j.proeng.2015.08.806
Volume 120
WOSCitedRecordID wos000380499300216&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVHPJ
  databaseName: ROAD: Directory of Open Access Scholarly Resources (ISSN International Center)
  customDbUrl:
  eissn: 1877-7058
  dateEnd: 20181231
  omitProxy: false
  ssIdentifier: ssj0000070251
  issn: 1877-7058
  databaseCode: M~E
  dateStart: 20090101
  isFulltext: true
  titleUrlDefault: https://road.issn.org
  providerName: ISSN International Centre
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwtV1Jb9QwFLaGwgEOiFWUTT5wq4wSO_FyRCwCIVVInVbtKbIzDqQakmomU7UcuPG_ebbjJNCKTeISJZ44mbz36fn501sQesYXmdI044QKy0lWsQWRViuSMDjVOpO5Nb7ZhNjdlYeH6sNs9i3mwpwuRdPIszN18l9VDWOgbJc6-xfqHh4KA3AOSocjqB2Of6T4g3rtEiW_DL7gK9uHbDQ7ui-h6WndpaOwweN2Huh-V8MUHwMQKwi8-xwaGO3BRrddTZ1Yn1wAuNqxYzHDQXH1uQbtewL2fUvq8lO9akcmPliWo83I43_sM27mLfihY17aUeu4sdZs_G-6W2_aKUERkjMDXxZzZsYAJWdipRBEJKFg-3N7yVi0yzSZWFbF-GSRVqEC0gX7H6iIY7f6gAhc5F7uKrTK5Kdy234B33OvdW8Fp5i6TppX0FUqYIflIkC_jlSdK4lEfSPP4X_GJEwfKXjxZZc7ORPHZX4L3ex3HPhFQMptNLPNHXRjUofyLjr4ATO4rXCPGQxXGkfMYIcZ7DGDzTkeMIMjZnCPGRwwcw_tv3k9f_mW9A03SAl2vCOVBWccPpGaLGdCw_coKS03vKxgV5kzSxcmNzCSaCUXsDpwo1KdWqryhYb72X201bSNfYAwEyWveJqWjIvMKmM0TStqbSpSVZZMbCMWJVSUfTV61xRlWcSww-MiyLVwci0SWYBctxEZZp2Eaiy_uV9E4Re9Rxk8xQIA88uZD_955iN03V0Fmu4x2upWG_sEXStPu3q9euqR9R2FsJ5m
linkProvider ISSN International Centre
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Visualization+of+Defects+on+a+Cultured+Cell+Layer+by+Utilizing+Chemical+Imaging+Sensor&rft.jtitle=Procedia+engineering&rft.au=Miyamoto%2C+Ko-ichiro&rft.au=Bing%2C+Yu&rft.au=Wagner%2C+Torsten&rft.au=Yoshinobu%2C+Tatsuo&rft.date=2015&rft.pub=Elsevier+Ltd&rft.issn=1877-7058&rft.eissn=1877-7058&rft.volume=120&rft.spage=936&rft.epage=939&rft_id=info:doi/10.1016%2Fj.proeng.2015.08.806&rft.externalDocID=S1877705815024698
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1877-7058&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1877-7058&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1877-7058&client=summon