Four-Dimensional Scanning Transmission Electron Microscopy (4D-STEM): From Scanning Nanodiffraction to Ptychography and Beyond

Scanning transmission electron microscopy (STEM) is widely used for imaging, diffraction, and spectroscopy of materials down to atomic resolution. Recent advances in detector technology and computational methods have enabled many experiments that record a full image of the STEM probe for many probe...

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Vydáno v:	Microscopy and microanalysis Ročník 25; číslo 3; s. 563 - 582
Hlavní autor:	Ophus, Colin
Médium:	Journal Article
Jazyk:	angličtina
Vydáno:	New York, USA Cambridge University Press 01.06.2019 Oxford University Press
Témata:	Computer applications Datasets Diffraction Experiments Imaging Mapping Materials Applications Names Nanodiffraction Phase contrast Scanning electron microscopy Scanning transmission electron microscopy Sensors Spectroscopy Transmission electron microscopy transmission electron microscopy (TEM) nanobeam electron diffraction (NBED) four dimensional-scanning transmission electron microscopy (4D-STEM) scanning electron nanodiffraction (SEND)
ISSN:	1431-9276, 1435-8115, 1435-8115
On-line přístup:	Získat plný text
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