Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy
Magnetic force microscopy (MFM) has become a widely used tool for the characterization of magnetic properties. However, the magnetic signal can be overlapped by additional forces acting on the tip such as electrostatic forces. In this work the possibility to reduce capacitive coupling effects betwee...
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| Vydáno v: | Beilstein journal of nanotechnology Ročník 10; číslo 1; s. 1056 - 1064 |
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| Jazyk: | angličtina |
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Germany
Beilstein-Institut zur Föerderung der Chemischen Wissenschaften
2019
Beilstein-Institut |
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| ISSN: | 2190-4286, 2190-4286 |
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| Abstract | Magnetic force microscopy (MFM) has become a widely used tool for the characterization of magnetic properties. However, the magnetic signal can be overlapped by additional forces acting on the tip such as electrostatic forces. In this work the possibility to reduce capacitive coupling effects between tip and substrate is discussed in relation to the thickness of a dielectric layer introduced in the system. Single superparamagnetic iron oxide nanoparticles (SPIONs) are used as a model system, because their magnetic signal is contrariwise to the signal due to capacitive coupling so that it is possible to distinguish between magnetic and electric force contributions. Introducing a dielectric layer between substrate and nanoparticle the capacitive coupling can be tuned and minimized for thick layers. Using the theory of capacitive coupling and the magnetic point dipole–dipole model we could theoretically explain and experimentally prove the phase signal for single superparamagnetic nanoparticles as a function of the layer thickness of the dielectric layer. Tuning the capacitive coupling by variation of the dielectric layer thickness between nanoparticle and substrate allows the distinction between the electric and the magnetic contributions to the MFM signal. The theory also predicts decreasing topographic effects in MFM signals due to surface roughness of dielectric films with increasing film thickness. |
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| AbstractList | Magnetic force microscopy (MFM) has become a widely used tool for the characterization of magnetic properties. However, the magnetic signal can be overlapped by additional forces acting on the tip such as electrostatic forces. In this work the possibility to reduce capacitive coupling effects between tip and substrate is discussed in relation to the thickness of a dielectric layer introduced in the system. Single superparamagnetic iron oxide nanoparticles (SPIONs) are used as a model system, because their magnetic signal is contrariwise to the signal due to capacitive coupling so that it is possible to distinguish between magnetic and electric force contributions. Introducing a dielectric layer between substrate and nanoparticle the capacitive coupling can be tuned and minimized for thick layers. Using the theory of capacitive coupling and the magnetic point dipole–dipole model we could theoretically explain and experimentally prove the phase signal for single superparamagnetic nanoparticles as a function of the layer thickness of the dielectric layer. Tuning the capacitive coupling by variation of the dielectric layer thickness between nanoparticle and substrate allows the distinction between the electric and the magnetic contributions to the MFM signal. The theory also predicts decreasing topographic effects in MFM signals due to surface roughness of dielectric films with increasing film thickness. Magnetic force microscopy (MFM) has become a widely used tool for the characterization of magnetic properties. However, the magnetic signal can be overlapped by additional forces acting on the tip such as electrostatic forces. In this work the possibility to reduce capacitive coupling effects between tip and substrate is discussed in relation to the thickness of a dielectric layer introduced in the system. Single superparamagnetic iron oxide nanoparticles (SPIONs) are used as a model system, because their magnetic signal is contrariwise to the signal due to capacitive coupling so that it is possible to distinguish between magnetic and electric force contributions. Introducing a dielectric layer between substrate and nanoparticle the capacitive coupling can be tuned and minimized for thick layers. Using the theory of capacitive coupling and the magnetic point dipole-dipole model we could theoretically explain and experimentally prove the phase signal for single superparamagnetic nanoparticles as a function of the layer thickness of the dielectric layer. Tuning the capacitive coupling by variation of the dielectric layer thickness between nanoparticle and substrate allows the distinction between the electric and the magnetic contributions to the MFM signal. The theory also predicts decreasing topographic effects in MFM signals due to surface roughness of dielectric films with increasing film thickness.Magnetic force microscopy (MFM) has become a widely used tool for the characterization of magnetic properties. However, the magnetic signal can be overlapped by additional forces acting on the tip such as electrostatic forces. In this work the possibility to reduce capacitive coupling effects between tip and substrate is discussed in relation to the thickness of a dielectric layer introduced in the system. Single superparamagnetic iron oxide nanoparticles (SPIONs) are used as a model system, because their magnetic signal is contrariwise to the signal due to capacitive coupling so that it is possible to distinguish between magnetic and electric force contributions. Introducing a dielectric layer between substrate and nanoparticle the capacitive coupling can be tuned and minimized for thick layers. Using the theory of capacitive coupling and the magnetic point dipole-dipole model we could theoretically explain and experimentally prove the phase signal for single superparamagnetic nanoparticles as a function of the layer thickness of the dielectric layer. Tuning the capacitive coupling by variation of the dielectric layer thickness between nanoparticle and substrate allows the distinction between the electric and the magnetic contributions to the MFM signal. The theory also predicts decreasing topographic effects in MFM signals due to surface roughness of dielectric films with increasing film thickness. |
| Author | Junkers, Tanja Möbius, Hildegard Krivcov, Alexander Ehrler, Jasmin Fuhrmann, Marc |
| AuthorAffiliation | 1 Department of Computer Sciences/Micro Systems Technology, University of Applied Sciences Kaiserslautern, Amerikastr. 1, 66482 Zweibrücken, Germany 3 Institute for Materials Research, Hasselt University, Martelarenlaan 42, 3500 Hasselt, Belgium 2 Polymer Reaction Design group, School of Chemistry, Monash University, Clayton VIC 3800, Australia |
| AuthorAffiliation_xml | – name: 1 Department of Computer Sciences/Micro Systems Technology, University of Applied Sciences Kaiserslautern, Amerikastr. 1, 66482 Zweibrücken, Germany – name: 3 Institute for Materials Research, Hasselt University, Martelarenlaan 42, 3500 Hasselt, Belgium – name: 2 Polymer Reaction Design group, School of Chemistry, Monash University, Clayton VIC 3800, Australia |
| Author_xml | – sequence: 1 givenname: Alexander orcidid: 0000-0001-7741-6571 surname: Krivcov fullname: Krivcov, Alexander – sequence: 2 givenname: Jasmin orcidid: 0000-0002-6335-5867 surname: Ehrler fullname: Ehrler, Jasmin – sequence: 3 givenname: Marc surname: Fuhrmann fullname: Fuhrmann, Marc – sequence: 4 givenname: Tanja orcidid: 0000-0002-6825-5777 surname: Junkers fullname: Junkers, Tanja – sequence: 5 givenname: Hildegard orcidid: 0000-0003-2725-9752 surname: Möbius fullname: Möbius, Hildegard |
| BackLink | https://www.ncbi.nlm.nih.gov/pubmed/31165032$$D View this record in MEDLINE/PubMed |
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| Cites_doi | 10.1088/0957-4484/21/30/305706 10.1002/smll.200700116 10.4161/biom.29507 10.1002/9780470027318.a9155 10.1006/jcis.2002.8345 10.1063/1.4922566 10.1039/c5nr04424c 10.1038/srep22467 10.1063/1.1627940 10.1021/ac900369v 10.1063/1.3077151 10.1119/1.4973409 10.1088/2399-6528/aad3a4 10.1063/1.1757029 10.1038/srep26293 10.1021/nn203464g 10.1016/s1748-0132(08)70013-6 10.1038/srep00202 10.3762/bjnano.2.59 10.1016/0375-9601(89)90229-6 10.1088/0022-3727/47/23/235403 10.1002/smll.201200420 10.1002/pssa.201800753 |
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| Copyright | Copyright © 2019, Krivcov et al.; licensee Beilstein-Institut. This work is published under http://creativecommons.org/licenses/by/4.0 (the “License”). Notwithstanding the ProQuest Terms and Conditions, you may use this content in accordance with the terms of the License. Copyright © 2019, Krivcov et al. 2019 Krivcov et al. |
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| Keywords | magnetic force microscopy capacitive coupling nanoparticles electrostatic effects superparamagnetic iron oxide nanoparticle (SPION) |
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| SubjectTerms | Bias capacitive coupling Coupling Dielectrics Dipoles electrostatic effects Film thickness Full Research Paper Iron oxides Magnetic fields Magnetic force microscopy Magnetic properties Magnetic signals Microscopy Nanoparticles Nanoscience Nanotechnology Substrates superparamagnetic iron oxide nanoparticle (SPION) Surface roughness Topography |
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| Title | Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy |
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