Krivcov, A., Ehrler, J., Fuhrmann, M., Junkers, T., & Möbius, H. (2019). Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy. Beilstein journal of nanotechnology, 10(1), 1056-1064. https://doi.org/10.3762/bjnano.10.106
Citácia podle Chicago (17th ed.)Krivcov, Alexander, Jasmin Ehrler, Marc Fuhrmann, Tanja Junkers, a Hildegard Möbius. "Influence of Dielectric Layer Thickness and Roughness on Topographic Effects in Magnetic Force Microscopy." Beilstein Journal of Nanotechnology 10, no. 1 (2019): 1056-1064. https://doi.org/10.3762/bjnano.10.106.
Citácia podľa MLA (8th ed.)Krivcov, Alexander, et al. "Influence of Dielectric Layer Thickness and Roughness on Topographic Effects in Magnetic Force Microscopy." Beilstein Journal of Nanotechnology, vol. 10, no. 1, 2019, pp. 1056-1064, https://doi.org/10.3762/bjnano.10.106.