APA (7th ed.) Citation

Krivcov, A., Ehrler, J., Fuhrmann, M., Junkers, T., & Möbius, H. (2019). Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy. Beilstein journal of nanotechnology, 10(1), 1056-1064. https://doi.org/10.3762/bjnano.10.106

Chicago Style (17th ed.) Citation

Krivcov, Alexander, Jasmin Ehrler, Marc Fuhrmann, Tanja Junkers, and Hildegard Möbius. "Influence of Dielectric Layer Thickness and Roughness on Topographic Effects in Magnetic Force Microscopy." Beilstein Journal of Nanotechnology 10, no. 1 (2019): 1056-1064. https://doi.org/10.3762/bjnano.10.106.

MLA (9th ed.) Citation

Krivcov, Alexander, et al. "Influence of Dielectric Layer Thickness and Roughness on Topographic Effects in Magnetic Force Microscopy." Beilstein Journal of Nanotechnology, vol. 10, no. 1, 2019, pp. 1056-1064, https://doi.org/10.3762/bjnano.10.106.