Krivcov, A., Ehrler, J., Fuhrmann, M., Junkers, T., & Möbius, H. (2019). Influence of dielectric layer thickness and roughness on topographic effects in magnetic force microscopy. Beilstein journal of nanotechnology, 10(1), 1056-1064. https://doi.org/10.3762/bjnano.10.106
Chicago-Zitierstil (17. Ausg.)Krivcov, Alexander, Jasmin Ehrler, Marc Fuhrmann, Tanja Junkers, und Hildegard Möbius. "Influence of Dielectric Layer Thickness and Roughness on Topographic Effects in Magnetic Force Microscopy." Beilstein Journal of Nanotechnology 10, no. 1 (2019): 1056-1064. https://doi.org/10.3762/bjnano.10.106.
MLA-Zitierstil (9. Ausg.)Krivcov, Alexander, et al. "Influence of Dielectric Layer Thickness and Roughness on Topographic Effects in Magnetic Force Microscopy." Beilstein Journal of Nanotechnology, vol. 10, no. 1, 2019, pp. 1056-1064, https://doi.org/10.3762/bjnano.10.106.