A Mathematical Model for Determining Carbon Coating Thickness and Its Application in Electron Probe Microanalysis

In electron probe microanalysis where materials are coated with a thin conductive carbon coat before analysis, the X-ray intensity detected from a specimen may be affected to various degrees by the thickness of the carbon coating. Differences in the carbon film thickness between specimens and standa...

Full description

Bibliographic Details

Published in:	Microscopy and microanalysis Vol. 22; no. 6; pp. 1374 - 1380
Main Authors:	Zhang, Ruo-Xi, Yang, Shui-Yuan
Format:	Journal Article
Language:	English
Published:	New York, USA Cambridge University Press 01.12.2016 Oxford University Press
Subjects:	Carbon Crystal oscillators Electrons Instrumentation and Software Techniques Mathematical models Quartz X-rays United States > US Japan film thickness calculation electron probe microanalysis film thickness variation carbon coating
ISSN:	1431-9276, 1435-8115, 1435-8115
Online Access:	Get full text
Tags:	Add Tag No Tags, Be the first to tag this record!