A Mathematical Model for Determining Carbon Coating Thickness and Its Application in Electron Probe Microanalysis

In electron probe microanalysis where materials are coated with a thin conductive carbon coat before analysis, the X-ray intensity detected from a specimen may be affected to various degrees by the thickness of the carbon coating. Differences in the carbon film thickness between specimens and standa...

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Vydáno v:	Microscopy and microanalysis Ročník 22; číslo 6; s. 1374 - 1380
Hlavní autoři:	Zhang, Ruo-Xi, Yang, Shui-Yuan
Médium:	Journal Article
Jazyk:	angličtina
Vydáno:	New York, USA Cambridge University Press 01.12.2016 Oxford University Press
Témata:	Carbon Crystal oscillators Electrons Instrumentation and Software Techniques Mathematical models Quartz X-rays United States > US Japan film thickness calculation electron probe microanalysis film thickness variation carbon coating
ISSN:	1431-9276, 1435-8115, 1435-8115
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