A Mathematical Model for Determining Carbon Coating Thickness and Its Application in Electron Probe Microanalysis

In electron probe microanalysis where materials are coated with a thin conductive carbon coat before analysis, the X-ray intensity detected from a specimen may be affected to various degrees by the thickness of the carbon coating. Differences in the carbon film thickness between specimens and standa...

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Veröffentlicht in:	Microscopy and microanalysis Jg. 22; H. 6; S. 1374 - 1380
Hauptverfasser:	Zhang, Ruo-Xi, Yang, Shui-Yuan
Format:	Journal Article
Sprache:	Englisch
Veröffentlicht:	New York, USA Cambridge University Press 01.12.2016 Oxford University Press
Schlagworte:	Carbon Crystal oscillators Electrons Instrumentation and Software Techniques Mathematical models Quartz X-rays United States > US Japan film thickness calculation electron probe microanalysis film thickness variation carbon coating
ISSN:	1431-9276, 1435-8115, 1435-8115
Online-Zugang:	Volltext
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