Matching Forensic Sketches to Mug Shot Photos
The problem of matching a forensic sketch to a gallery of mug shot images is addressed in this paper. Previous research in sketch matching only offered solutions to matching highly accurate sketches that were drawn while looking at the subject (viewed sketches). Forensic sketches differ from viewed...
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| Veröffentlicht in: | IEEE transactions on pattern analysis and machine intelligence Jg. 33; H. 3; S. 639 - 646 |
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| Hauptverfasser: | , , |
| Format: | Journal Article |
| Sprache: | Englisch |
| Veröffentlicht: |
Los Alamitos, CA
IEEE
01.03.2011
IEEE Computer Society The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Schlagworte: | |
| ISSN: | 0162-8828, 1939-3539, 1939-3539 |
| Online-Zugang: | Volltext |
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| Zusammenfassung: | The problem of matching a forensic sketch to a gallery of mug shot images is addressed in this paper. Previous research in sketch matching only offered solutions to matching highly accurate sketches that were drawn while looking at the subject (viewed sketches). Forensic sketches differ from viewed sketches in that they are drawn by a police sketch artist using the description of the subject provided by an eyewitness. To identify forensic sketches, we present a framework called local feature-based discriminant analysis (LFDA). In LFDA, we individually represent both sketches and photos using SIFT feature descriptors and multiscale local binary patterns (MLBP). Multiple discriminant projections are then used on partitioned vectors of the feature-based representation for minimum distance matching. We apply this method to match a data set of 159 forensic sketches against a mug shot gallery containing 10,159 images. Compared to a leading commercial face recognition system, LFDA offers substantial improvements in matching forensic sketches to the corresponding face images. We were able to further improve the matching performance using race and gender information to reduce the target gallery size. Additional experiments demonstrate that the proposed framework leads to state-of-the-art accuracys when matching viewed sketches. |
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| Bibliographie: | ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 ObjectType-Article-2 ObjectType-Feature-1 content type line 23 |
| ISSN: | 0162-8828 1939-3539 1939-3539 |
| DOI: | 10.1109/TPAMI.2010.180 |