Proliferation of Faulty Materials Data Analysis in the Literature

As a group of subject matter experts in X-ray photoelectron spectroscopy (XPS), we write this letter to raise awareness of the epidemic of poor and incorrect materials data analysis in the Literature. This is a chronic and growing problem with very undesirable consequences. This issue may contribute...

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Vydané v:	Microscopy and microanalysis Ročník 26; číslo 1; s. 1 - 2
Hlavní autori:	Linford, Matthew R., Smentkowski, Vincent S., Grant, John T., Brundle, C. Richard, Sherwood, Peter M.A., Biesinger, Mark C., Terry, Jeff, Artyushkova, Kateryna, Herrera-Gómez, Alberto, Tougaard, Sven, Skinner, William, Pireaux, Jean-Jacques, McConville, Christopher F., Easton, Christopher D., Gengenbach, Thomas R., Major, George H., Dietrich, Paul, Thissen, Andreas, Engelhard, Mark, Powell, Cedric J., Gaskell, Karen J., Baer, Donald R.
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	United States Oxford University Press 01.02.2020 Microscopy Society of America (MSA)
Predmet:	Data analysis Data collection Experts materials analysis Materials information MATERIALS SCIENCE reproducibility Researchers X ray photoelectron spectroscopy XPS United States > US
ISSN:	1431-9276, 1435-8115, 1435-8115
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