A Multiobjective Hybrid Genetic Algorithm for TFT-LCD Module Assembly Scheduling
The thin-film transistor-liquid crystal display (TFT-LCD) module assembly production is a flexible job-shop scheduling problem that is critical to satisfy the customer demands on time. On the module assembly shop floor, each workstation has identical and non-identical parallel machines that access t...
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| Vydáno v: | IEEE transactions on automation science and engineering Ročník 11; číslo 3; s. 692 - 705 |
|---|---|
| Hlavní autoři: | , , |
| Médium: | Journal Article |
| Jazyk: | angličtina |
| Vydáno: |
New York
IEEE
01.07.2014
The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
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| ISSN: | 1545-5955, 1558-3783 |
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| Abstract | The thin-film transistor-liquid crystal display (TFT-LCD) module assembly production is a flexible job-shop scheduling problem that is critical to satisfy the customer demands on time. On the module assembly shop floor, each workstation has identical and non-identical parallel machines that access the jobs at various processing velocities depending on the product families. To satisfy the various jobs, the machines need to be set up as the numerous tools to conduct consecutive products. This study aims to propose a novel approach to address the TFT-LCD module assembly scheduling problem by simultaneously considering the following multiple and often conflicting objectives such as the makespan, the weighted number of tardy jobs, and the total machine setup time, subject to the constraints of product families, non-identical parallel machines, and sequence-dependent setup times. In particular, we developed a multiobjective hybrid genetic algorithm (MO-HGA) that hybridizes with the variable neighborhood descent (VND) algorithm as a local search and TOPSIS evaluation technique to derive the best compromised solution. To estimate the validity of the proposed MO-HGA, experiments based on empirical data were conducted to compare the results with conventional approaches. The results have shown the validity of this approach. This study concludes with a discussion of future research directions. |
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| AbstractList | The thin-film transistor-liquid crystal display (TFT-LCD) module assembly production is a flexible job-shop scheduling problem that is critical to satisfy the customer demands on time. On the module assembly shop floor, each workstation has identical and non-identical parallel machines that access the jobs at various processing velocities depending on the product families. To satisfy the various jobs, the machines need to be set up as the numerous tools to conduct consecutive products. This study aims to propose a novel approach to address the TFT-LCD module assembly scheduling problem by simultaneously considering the following multiple and often conflicting objectives such as the makespan, the weighted number of tardy jobs, and the total machine setup time, subject to the constraints of product families, non-identical parallel machines, and sequence-dependent setup times. In particular, we developed a multiobjective hybrid genetic algorithm (MO-HGA) that hybridizes with the variable neighborhood descent (VND) algorithm as a local search and TOPSIS evaluation technique to derive the best compromised solution. To estimate the validity of the proposed MO-HGA, experiments based on empirical data were conducted to compare the results with conventional approaches. The results have shown the validity of this approach. This study concludes with a discussion of future research directions. |
| Author | Gen, Mitsuo Chen-Fu Chien Che-Wei Chou |
| Author_xml | – sequence: 1 surname: Che-Wei Chou fullname: Che-Wei Chou email: cfchien@mx.nthu.edu.tw organization: Dept. of Ind. Eng. & Eng. Manage., Nat. Tsing Hua Univ., Hsinchu, Taiwan – sequence: 2 surname: Chen-Fu Chien fullname: Chen-Fu Chien organization: Dept. of Ind. Eng. & Eng. Manage., Nat. Tsing Hua Univ., Hsinchu, Taiwan – sequence: 3 givenname: Mitsuo surname: Gen fullname: Gen, Mitsuo organization: Dept. of Ind. Eng. & Eng. Manage., Nat. Tsing Hua Univ., Hsinchu, Taiwan |
| BookMark | eNp9kM9LwzAYhoNM0E3_APES8OKlM7-bHsv8CRMF57m06VfN6JqZtML-e1MmHnbw8uUjPG_I-0zRpHMdIHRByZxSkt2s8re7OSNUzBmnimb8CJ1SKXXCU80n4y5kIjMpT9A0hDUhTOiMnKLXHD8PbW9dtQbT22_Aj7vK2xo_QAe9NThvP5y3_ecGN87j1f0qWS5u8bOrhxZwHgJsqnaH38wnxBvbfZyh46ZsA5z_njP0fn-3Wjwmy5eHp0W-TIxQrE84MKUo04YANSIlklWNAGMandI0TqI0q6GhpYQUOK9SKtKKKa7rWJLUJZ-h6_27W---Bgh9sbHBQNuWHbghFLF8ppSgWkf06gBdu8F38XeREoIRIslIpXvKeBeCh6Ywti-jma73pW0LSorRdDGaLkbTxa_pmKQHya23m9Lv_s1c7jMWAP54pSnRkvAfaoqJQQ |
| CODEN | ITASC7 |
| CitedBy_id | crossref_primary_10_1016_j_cie_2021_107782 crossref_primary_10_1016_j_cie_2017_04_016 crossref_primary_10_1016_j_cie_2018_08_030 crossref_primary_10_1016_j_cie_2022_108830 crossref_primary_10_1049_el_2018_0609 crossref_primary_10_1109_TASE_2018_2878653 crossref_primary_10_1007_s10700_014_9200_6 crossref_primary_10_1007_s11063_015_9467_9 crossref_primary_10_1109_TASE_2017_2770170 crossref_primary_10_1016_j_eswa_2022_117796 crossref_primary_10_1016_j_cie_2018_01_005 crossref_primary_10_1016_j_cie_2017_07_012 crossref_primary_10_1016_j_cie_2016_05_006 crossref_primary_10_1016_j_cie_2016_05_028 crossref_primary_10_1016_j_cie_2016_03_030 crossref_primary_10_1016_j_cie_2020_106462 crossref_primary_10_1080_00207543_2020_1777342 crossref_primary_10_1109_TFUZZ_2023_3245097 crossref_primary_10_1016_j_cie_2014_07_012 crossref_primary_10_1016_j_cie_2017_09_023 crossref_primary_10_1080_00207543_2016_1256507 crossref_primary_10_1109_TII_2024_3435539 crossref_primary_10_1109_TASE_2021_3069779 crossref_primary_10_1109_TASE_2023_3244331 crossref_primary_10_1016_j_cie_2016_12_045 crossref_primary_10_1016_j_cie_2022_108786 crossref_primary_10_1007_s10845_015_1149_y crossref_primary_10_1016_j_ijpe_2024_109412 crossref_primary_10_1016_j_cie_2019_02_035 crossref_primary_10_1016_j_compchemeng_2025_109380 crossref_primary_10_1080_00207543_2018_1437288 crossref_primary_10_1016_j_cie_2018_08_024 crossref_primary_10_1109_TSM_2022_3199856 crossref_primary_10_1109_TASE_2017_2651109 crossref_primary_10_1007_s10845_020_01711_w crossref_primary_10_1007_s10479_018_3034_5 crossref_primary_10_1109_TSM_2018_2792783 crossref_primary_10_1016_j_cie_2020_106375 crossref_primary_10_1016_j_asoc_2019_01_015 crossref_primary_10_1109_TNNLS_2022_3217318 crossref_primary_10_1109_TSM_2017_2758380 crossref_primary_10_3390_su151713012 crossref_primary_10_1016_j_cie_2019_106154 crossref_primary_10_1016_j_cie_2020_106297 crossref_primary_10_1016_j_cie_2025_110989 crossref_primary_10_1080_02533839_2017_1372220 |
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| ContentType | Journal Article |
| Copyright | Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jul 2014 |
| Copyright_xml | – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Jul 2014 |
| DBID | 97E RIA RIE AAYXX CITATION 7SC 7SP 7TB 8FD FR3 JQ2 L7M L~C L~D F28 |
| DOI | 10.1109/TASE.2014.2316193 |
| DatabaseName | IEEE All-Society Periodicals Package (ASPP) 2005–Present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Electronic Library (IEL) CrossRef Computer and Information Systems Abstracts Electronics & Communications Abstracts Mechanical & Transportation Engineering Abstracts Technology Research Database Engineering Research Database ProQuest Computer Science Collection Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Academic Computer and Information Systems Abstracts Professional ANTE: Abstracts in New Technology & Engineering |
| DatabaseTitle | CrossRef Technology Research Database Computer and Information Systems Abstracts – Academic Mechanical & Transportation Engineering Abstracts Electronics & Communications Abstracts ProQuest Computer Science Collection Computer and Information Systems Abstracts Engineering Research Database Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Professional ANTE: Abstracts in New Technology & Engineering |
| DatabaseTitleList | Technology Research Database Technology Research Database |
| Database_xml | – sequence: 1 dbid: RIE name: IEEE Electronic Library (IEL) url: https://ieeexplore.ieee.org/ sourceTypes: Publisher |
| DeliveryMethod | fulltext_linktorsrc |
| Discipline | Engineering |
| EISSN | 1558-3783 |
| EndPage | 705 |
| ExternalDocumentID | 3368196461 10_1109_TASE_2014_2316193 6810850 |
| Genre | orig-research Feature |
| GroupedDBID | -~X 0R~ 29I 4.4 5GY 5VS 6IK 97E AAJGR AARMG AASAJ AAWTH ABAZT ABQJQ ABVLG ACGFO ACGFS ACIWK AENEX AETIX AGQYO AGSQL AHBIQ AIBXA AKJIK AKQYR ALMA_UNASSIGNED_HOLDINGS ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 EBS EJD F5P HZ~ H~9 IFIPE IPLJI JAVBF LAI M43 O9- OCL PQQKQ RIA RIE RNS AAYXX CITATION 7SC 7SP 7TB 8FD FR3 JQ2 L7M L~C L~D F28 |
| ID | FETCH-LOGICAL-c462t-3e266128c0e1c47052bf4eccf8717cf80682def1a5e7e33b7147b2638d2010da3 |
| IEDL.DBID | RIE |
| ISICitedReferencesCount | 56 |
| ISICitedReferencesURI | http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000340101400006&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| ISSN | 1545-5955 |
| IngestDate | Thu Oct 02 06:14:57 EDT 2025 Sun Nov 09 08:07:00 EST 2025 Tue Nov 18 22:22:11 EST 2025 Sat Nov 29 04:12:44 EST 2025 Tue Aug 26 16:50:05 EDT 2025 |
| IsPeerReviewed | false |
| IsScholarly | true |
| Issue | 3 |
| Language | English |
| License | https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html |
| LinkModel | DirectLink |
| MergedId | FETCHMERGED-LOGICAL-c462t-3e266128c0e1c47052bf4eccf8717cf80682def1a5e7e33b7147b2638d2010da3 |
| Notes | SourceType-Scholarly Journals-1 ObjectType-Feature-1 content type line 14 ObjectType-Article-2 content type line 23 |
| PQID | 1544200508 |
| PQPubID | 27623 |
| PageCount | 14 |
| ParticipantIDs | crossref_citationtrail_10_1109_TASE_2014_2316193 proquest_miscellaneous_1559664188 crossref_primary_10_1109_TASE_2014_2316193 proquest_journals_1544200508 ieee_primary_6810850 |
| PublicationCentury | 2000 |
| PublicationDate | 2014-07-01 |
| PublicationDateYYYYMMDD | 2014-07-01 |
| PublicationDate_xml | – month: 07 year: 2014 text: 2014-07-01 day: 01 |
| PublicationDecade | 2010 |
| PublicationPlace | New York |
| PublicationPlace_xml | – name: New York |
| PublicationTitle | IEEE transactions on automation science and engineering |
| PublicationTitleAbbrev | TASE |
| PublicationYear | 2014 |
| Publisher | IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher_xml | – name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| References | ref35 ref13 ref34 ref12 ref37 ref15 ref36 ref14 ref30 ref33 ref11 ref32 ref10 ref2 ref1 ref39 ref17 ref38 ref16 ref19 ref18 ref24 ref23 ref25 ref20 ref42 ref41 ref22 ref44 ref21 ref43 ref28 ref27 hwang (ref31) 1981 ref29 ref8 ref7 ref9 ref4 ref3 ref6 ref5 ref40 gen (ref26) 2008 |
| References_xml | – ident: ref4 doi: 10.1109/TASE.2012.2192729 – ident: ref9 doi: 10.1016/S0378-4754(02)00019-8 – ident: ref39 doi: 10.1016/j.ijpe.2011.10.024 – ident: ref21 doi: 10.1080/00207543.2013.861949 – ident: ref42 doi: 10.1080/00207543.2013.847981 – ident: ref35 doi: 10.1016/0165-0114(78)90031-3 – ident: ref11 doi: 10.1016/S0305-0548(02)00059-X – ident: ref10 doi: 10.1109/TSMCC.2008.923888 – ident: ref20 doi: 10.1080/00207540802010807 – ident: ref14 doi: 10.1016/j.cor.2004.04.001 – ident: ref28 doi: 10.1016/j.cor.2007.02.014 – ident: ref3 doi: 10.1080/00207540410001708461 – ident: ref17 doi: 10.1080/00207540500380981 – ident: ref18 doi: 10.1007/s00170-007-1192-8 – ident: ref2 doi: 10.1007/s00291-006-0062-3 – ident: ref6 doi: 10.1109/TASE.2010.2040999 – ident: ref7 doi: 10.1016/S0360-8352(01)00041-9 – ident: ref38 doi: 10.1007/s10845-011-0572-y – ident: ref34 doi: 10.1287/mnsc.17.4.B141 – ident: ref13 doi: 10.1080/00207549508904839 – ident: ref29 doi: 10.1016/j.cor.2007.01.001 – ident: ref37 doi: 10.1016/j.ijpe.2006.11.028 – ident: ref41 doi: 10.1007/s10696-011-9113-4 – ident: ref15 doi: 10.1016/j.ejor.2006.06.060 – ident: ref32 doi: 10.1023/A:1023499201829 – ident: ref5 doi: 10.1080/00207543.2012.694488 – ident: ref23 doi: 10.1109/TASE.2007.906142 – ident: ref30 doi: 10.1109/4235.996017 – ident: ref43 doi: 10.1504/EJIE.2011.041616 – ident: ref19 doi: 10.1080/00207543.2013.810820 – ident: ref33 doi: 10.1007/s00500-008-0303-2 – year: 1981 ident: ref31 publication-title: Multiple attribute decision making methods and applications doi: 10.1007/978-3-642-48318-9 – ident: ref27 doi: 10.1109/TSMCC.2002.1009117 – ident: ref36 doi: 10.1016/0165-0114(87)90111-4 – ident: ref1 doi: 10.1016/j.cor.2005.11.011 – ident: ref22 doi: 10.1016/j.omega.2007.07.004 – ident: ref24 doi: 10.1016/j.ejor.2007.01.062 – ident: ref40 doi: 10.1007/s10845-011-0561-1 – year: 2008 ident: ref26 publication-title: Network Models And Optimization Multiple Objective Genetic Algorithm Approach – ident: ref8 doi: 10.1016/j.cie.2007.08.008 – ident: ref16 doi: 10.1016/j.ejor.2004.06.038 – ident: ref44 doi: 10.1016/j.cie.2011.11.020 – ident: ref12 doi: 10.1016/S0377-2217(03)00376-X – ident: ref25 doi: 10.1007/s10845-011-0570-0 |
| SSID | ssj0024890 |
| Score | 2.2790284 |
| Snippet | The thin-film transistor-liquid crystal display (TFT-LCD) module assembly production is a flexible job-shop scheduling problem that is critical to satisfy the... |
| SourceID | proquest crossref ieee |
| SourceType | Aggregation Database Enrichment Source Index Database Publisher |
| StartPage | 692 |
| SubjectTerms | Assembly Assembly lines Crystals Genetic algorithms Job shop scheduling Job shops LCDs Liquid crystal displays Machine shops Modules Molybdenum Multiobjective genetic algorithm Parallel machines Scheduling Setup times Thin film transistors Thin films thin-film transistor-liquid crystal display (TFT-LCD) TOPSIS variable neighborhood descent Work stations Workstations |
| Title | A Multiobjective Hybrid Genetic Algorithm for TFT-LCD Module Assembly Scheduling |
| URI | https://ieeexplore.ieee.org/document/6810850 https://www.proquest.com/docview/1544200508 https://www.proquest.com/docview/1559664188 |
| Volume | 11 |
| WOSCitedRecordID | wos000340101400006&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D |
| hasFullText | 1 |
| inHoldings | 1 |
| isFullTextHit | |
| isPrint | |
| journalDatabaseRights | – providerCode: PRVIEE databaseName: IEEE Electronic Library (IEL) customDbUrl: eissn: 1558-3783 dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0024890 issn: 1545-5955 databaseCode: RIE dateStart: 20040101 isFulltext: true titleUrlDefault: https://ieeexplore.ieee.org/ providerName: IEEE |
| link | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3dS8MwED_m8EEf_Jri_CKCT2I1bZMmfRzq8EGH4IS9leajfjBXmZvgf28u7aagCL6UQpM25NdL7nJ3vwM44lxqqxQPnHocBSxSTqSYzoOEURWHxlDDlC82IXo9ORiktw04mefCWGt98Jk9xVvvyzelnuJR2RlyZ0k00BeEEFWu1hevnvTnKagRBDzlvPZghjQ963fuLjGIi506ZSbxPuZve5AvqvJjJfbbS3f1fwNbg5VajSSdCvd1aNjRBix_IxdswW2H-OzaUj1Xixq5-sD0LIJM064b6QwfyvHT5PGFOMWV9Lv94Pr8gtyUZjq0BJ3BL2r4Qe4cqgbD1R824b572T-_Cur6CYFmSTQJYou7byQ1taFmgvJIFcxBVjgjSbgrTWRkbBHm3Aobx0qETKjICaRBF7nJ4y1ojsqR3QZiU-nsNJnERVKwPI3TXPFcJxKrdhSa0TbQ2YxmuiYXxxoXw8wbGTTNEIQMQchqENpwPO_yWjFr_NW4hbM-b1hPeBv2ZrBltey9ZcgvhGdlVLbhcP7YSQ26QvKRLafYhjs7j4VS7vz-5l1Ywu9Xgbl70JyMp3YfFvX75OltfOB_vU_U8dPz |
| linkProvider | IEEE |
| linkToHtml | http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3dS8MwED9EBfXBb3F-RvBJrEvbpE0fhzomziFYwbfSfNQP5ipzE_zvzaV1CorgSyk0KSG_XHKXu_sdwCHnQhkpuWfV48BjgbQixVTuRYzK0NeaaiZdsYm41xN3d8n1FBxPcmGMMS74zJzgq_Pl61KN8aqsidxZAg30Gc5Y4FfZWl_MesLdqKBO4PGE89qH6dOkmbZuzjGMi51YdSZyXuZvp5Arq_JjL3YHTHvpf0NbhsVakSStCvkVmDKDVVj4Ri-4Btct4vJrS_lUbWuk844JWgS5pm030urfl8PH0cMzsaorSdup1z09I1elHvcNQXfws-y_kxuLq8aA9ft1uG2fp6cdr66g4CkWBSMvNHj-BkJR4ysWUx7IglnQCmsmxfZJIxFoU_g5N7EJQxn7LJaBFUmNTnKdhxswPSgHZhOISYS11EQUFlHB8iRMcslzFQms21EoRhtAP2c0UzW9OFa56GfOzKBJhiBkCEJWg9CAo0mXl4pb46_Gazjrk4b1hDdg5xO2rJa-1wwZhvC2jIoGHEw-W7lBZ0g-MOUY23Br6TFfiK3f_7wPc530qpt1L3qX2zCPY6nCdHdgejQcm12YVW-jx9fhnluGHwXE1zo |
| openUrl | ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=A+Multiobjective+Hybrid+Genetic+Algorithm+for+TFT-LCD+Module+Assembly+Scheduling&rft.jtitle=IEEE+transactions+on+automation+science+and+engineering&rft.au=Chou%2C+Che-Wei&rft.au=Chien%2C+Chen-Fu&rft.au=Gen%2C+Mitsuo&rft.date=2014-07-01&rft.issn=1545-5955&rft.eissn=1558-3783&rft.volume=11&rft.issue=3&rft.spage=692&rft.epage=705&rft_id=info:doi/10.1109%2FTASE.2014.2316193&rft.externalDBID=n%2Fa&rft.externalDocID=10_1109_TASE_2014_2316193 |
| thumbnail_l | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1545-5955&client=summon |
| thumbnail_m | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1545-5955&client=summon |
| thumbnail_s | http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1545-5955&client=summon |