Design, deployment and functional tests of the online event filter for the ATLAS experiment at LHC

The Event Filter (EF) selection stage is a fundamental component of the ATLAS Trigger and Data Acquisition architecture. Its primary function is the reduction of data flow and rate to values acceptable by the mass storage operations and by the subsequent offline data reconstruction and analysis step...

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Bibliographic Details
Published in:	IEEE transactions on nuclear science Vol. 52; no. 6; pp. 2846 - 2852
Main Authors:	Armstrong, S., dos Anjos, A., Baines, J.T.M., Bee, C.P., Biglietti, M., Bogaerts, J.A., Boisvert, V., Bosman, M., Caron, B., Casado, P., Cataldi, G., Cavalli, D., Cervetto, M., Comune, G., Muino, P.C., De Santo, A., Gomez, M.D., Dosil, M., Ellis, N., Emeliyanov, D., Epp, B., Etienne, F., Falciano, S., Farilla, A., George, S., Ghete, V., Gonzalez, S., Grothe, M., Kabana, S., Khomich, A., Kilvington, G., Konstantinidis, N., Kootz, A., Lowe, A., Luminari, L., Maeno, T., Masik, J., di Mattia, A., Meessen, C., Mello, A.G., Merino, G., Moore, R., Morettini, P., Nikitin, N., Nisati, A., Padilla, C., Panikashvili, N., Parodi, F., Reale, V.P., Pinfold, J.L., Pinto, P., Qian, Z., Resconi, S., Rosati, S., Sanchez, C., Santamarina, C., Scannicchio, D.A., Schiavi, C., Segura, E., de Seixas, J.M., Sivoklokov, S., Soluk, R., Stefanidis, E., Sushkov, S., Sutton, M., Tapprogge, S., Thomas, E., Touchard, F., Pinto, B.V., Vercesi, V., Werner, P., Wheeler, S., Wickens, F.J., Wiedenmann, W., Wielers, M., Zobernig, G.
Format:	Journal Article
Language:	English
Published:	New York IEEE 01.12.2005 The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Institute of Electrical and Electronics Engineers
Subjects:	Algorithm design and analysis Algorithms Architecture Computer architecture Construction Data acquisition Data analysis data processing Design engineering Failure Filters High Energy Physics - Experiment Independent component analysis Instruments Large Hadron Collider Physics Reconstruction Reduction Security Switches Testing triggering Data acquisition data processing triggering
ISSN:	0018-9499, 1558-1578
Online Access:	Get full text
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