Oddershede, J., Schmidt, S., Poulsen, H. F., Sørensen, H. O., Wright, J., & Reimers, W. (2010). Determining grain resolved stresses in polycrystalline materials using three-dimensional X-ray diffraction. Journal of applied crystallography, 43(3), 539-549. https://doi.org/10.1107/S0021889810012963
Citace podle Chicago (17th ed.)Oddershede, Jette, Søren Schmidt, Henning Friis Poulsen, Henning Osholm Sørensen, Jonathan Wright, a Walter Reimers. "Determining Grain Resolved Stresses in Polycrystalline Materials Using Three-dimensional X-ray Diffraction." Journal of Applied Crystallography 43, no. 3 (2010): 539-549. https://doi.org/10.1107/S0021889810012963.
Citace podle MLA (9th ed.)Oddershede, Jette, et al. "Determining Grain Resolved Stresses in Polycrystalline Materials Using Three-dimensional X-ray Diffraction." Journal of Applied Crystallography, vol. 43, no. 3, 2010, pp. 539-549, https://doi.org/10.1107/S0021889810012963.