Nanoparticle Recognition on Scanning Probe Microscopy Images Using Computer Vision and Deep Learning

Identifying, counting and measuring particles is an important component of many research studies. Images with particles are usually processed by hand using a software ruler. Automated processing, based on conventional image processing methods (edge detection, segmentation, etc.) are not universal, c...

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Bibliographic Details
Published in:	Nanomaterials (Basel, Switzerland) Vol. 10; no. 7; p. 1285
Main Authors:	Okunev, Alexey G., Mashukov, Mikhail Yu, Nartova, Anna V., Matveev, Andrey V.
Format:	Journal Article
Language:	English
Published:	Basel MDPI AG 30.06.2020 MDPI
Subjects:	Annotations Artificial neural networks Computer programs Computer vision Datasets Deep learning deep neural networks Edge detection Ground truth Image detection Image processing Image quality Image segmentation Machine learning Microscopy Nanoparticles Neural networks Noise Object recognition particle recognition particles Pyrolytic graphite Quality Quantum dots Research methodology Scanning probe microscopy Scanning tunneling microscopy Software Verification Web services United States > US
ISSN:	2079-4991, 2079-4991
Online Access:	Get full text
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