Nanoparticle Recognition on Scanning Probe Microscopy Images Using Computer Vision and Deep Learning

Identifying, counting and measuring particles is an important component of many research studies. Images with particles are usually processed by hand using a software ruler. Automated processing, based on conventional image processing methods (edge detection, segmentation, etc.) are not universal, c...

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Vydáno v:	Nanomaterials (Basel, Switzerland) Ročník 10; číslo 7; s. 1285
Hlavní autoři:	Okunev, Alexey G., Mashukov, Mikhail Yu, Nartova, Anna V., Matveev, Andrey V.
Médium:	Journal Article
Jazyk:	angličtina
Vydáno:	Basel MDPI AG 30.06.2020 MDPI
Témata:	Annotations Artificial neural networks Computer programs Computer vision Datasets Deep learning deep neural networks Edge detection Ground truth Image detection Image processing Image quality Image segmentation Machine learning Microscopy Nanoparticles Neural networks Noise Object recognition particle recognition particles Pyrolytic graphite Quality Quantum dots Research methodology Scanning probe microscopy Scanning tunneling microscopy Software Verification Web services United States > US
ISSN:	2079-4991, 2079-4991
On-line přístup:	Získat plný text
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