Yan, H., Si, X., Liang, J., Duan, J., & Shi, T. (2024). Unsupervised Learning for Machinery Adaptive Fault Detection Using Wide-Deep Convolutional Autoencoder with Kernelized Attention Mechanism. Sensors (Basel, Switzerland), 24(24), 8053. https://doi.org/10.3390/s24248053
Chicago-Zitierstil (17. Ausg.)Yan, Hao, Xiangfeng Si, Jianqiang Liang, Jian Duan, und Tielin Shi. "Unsupervised Learning for Machinery Adaptive Fault Detection Using Wide-Deep Convolutional Autoencoder with Kernelized Attention Mechanism." Sensors (Basel, Switzerland) 24, no. 24 (2024): 8053. https://doi.org/10.3390/s24248053.
MLA-Zitierstil (9. Ausg.)Yan, Hao, et al. "Unsupervised Learning for Machinery Adaptive Fault Detection Using Wide-Deep Convolutional Autoencoder with Kernelized Attention Mechanism." Sensors (Basel, Switzerland), vol. 24, no. 24, 2024, p. 8053, https://doi.org/10.3390/s24248053.