Jin, L., Tang, Y., Wu, Y., Coole, J. B., Tan, M. T., Zhao, X., . . . Veeraraghavan, A. (2020). Deep learning extended depth-of-field microscope for fast and slide-free histology. Proceedings of the National Academy of Sciences - PNAS, 117(52), 33051. https://doi.org/10.1073/pnas.2013571117
Citace podle Chicago (17th ed.)Jin, Lingbo, et al. "Deep Learning Extended Depth-of-field Microscope for Fast and Slide-free Histology." Proceedings of the National Academy of Sciences - PNAS 117, no. 52 (2020): 33051. https://doi.org/10.1073/pnas.2013571117.
Citace podle MLA (9th ed.)Jin, Lingbo, et al. "Deep Learning Extended Depth-of-field Microscope for Fast and Slide-free Histology." Proceedings of the National Academy of Sciences - PNAS, vol. 117, no. 52, 2020, p. 33051, https://doi.org/10.1073/pnas.2013571117.