Fugel, M., Jayatilaka, D., Hupf, E., Overgaard, J., Hathwar, V. R., Macchi, P., . . . Grabowsky, S. (2018). Probing the accuracy and precision of Hirshfeld atom refinement with HARt interfaced with Olex2. IUCrJ, 5(1), 32-44. https://doi.org/10.1107/S2052252517015548
Citace podle Chicago (17th ed.)Fugel, Malte, et al. "Probing the Accuracy and Precision of Hirshfeld Atom Refinement with HARt Interfaced with Olex2." IUCrJ 5, no. 1 (2018): 32-44. https://doi.org/10.1107/S2052252517015548.
Citace podle MLA (9th ed.)Fugel, Malte, et al. "Probing the Accuracy and Precision of Hirshfeld Atom Refinement with HARt Interfaced with Olex2." IUCrJ, vol. 5, no. 1, 2018, pp. 32-44, https://doi.org/10.1107/S2052252517015548.
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