distect : automatic sample-position tracking for X-ray experiments using computer vision algorithms

Soft X-ray spectroscopy is an important technique for measuring the fundamental properties of materials. However, for measurements of samples in the sub-millimetre range, many experimental setups show limitations. Position drifts on the order of hundreds of micrometres during thermal stabilization o...

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Veröffentlicht in:Journal of synchrotron radiation Jg. 31; H. 6; S. 1514 - 1524
Hauptverfasser: Berg, Michael, Furrer, Dirk, Thominet, Vincent, Wang, Xiaoqiang, Zeugin, Stefan, Grabner, Helmut, Stockinger, Kurt, Piamonteze, Cinthia
Format: Journal Article
Sprache:Englisch
Veröffentlicht: United States John Wiley & Sons, Inc 01.11.2024
International Union of Crystallography
Schlagworte:
Absorption spectra
Algorithms
Computer vision
computer vision algorithms
High vacuum
Material properties
Position measurement
Research Papers
sample-position accuracy
sample-position tracking
soft x-ray absorption spectroscopy
Spectrum analysis
Tracking
Vacuum chambers
variable temperature inserts
Vertical orientation
computer vision algorithms
sample-position tracking
variable temperature inserts
sample-position accuracy
soft X-ray absorption spectroscopy
ISSN:1600-5775, 0909-0495, 1600-5775
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Zusammenfassung:Soft X-ray spectroscopy is an important technique for measuring the fundamental properties of materials. However, for measurements of samples in the sub-millimetre range, many experimental setups show limitations. Position drifts on the order of hundreds of micrometres during thermal stabilization of the system can last for hours of expensive beam time. To compensate for drifts, sample tracking and feedback systems must be used. However, in complex sample environments where sample access is very limited, many existing solutions cannot be applied. In this work, we apply a robust computer vision algorithm to automatically track and readjust the sample position in the dozens of micrometres range. Our approach is applied in a complex sample environment, where the sample is in an ultra-high vacuum chamber, surrounded by cooled thermal shields to reach sample temperatures down to 2.5 K and in the center of a superconducting split coil. Our implementation allows sample-position tracking and adjustment in the vertical direction since this is the dimension where drifts occur during sample temperature change in our setup. The approach can be easily extended to 2D. The algorithm enables a factor of ten improvement in the overlap of a series of X-ray absorption spectra in a sample with a vertical size down to 70 µm. This solution can be used in a variety of experimental stations, where optical access is available and sample access by other means is reduced.
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ISSN:1600-5775
0909-0495
1600-5775
DOI:10.1107/S1600577524009536