Perceptual Quality Assessment for Multi-Exposure Image Fusion

Multi-exposure image fusion (MEF) is considered an effective quality enhancement technique widely adopted in consumer electronics, but little work has been dedicated to the perceptual quality assessment of multi-exposure fused images. In this paper, we first build an MEF database and carry out a sub...

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Vydané v:	IEEE transactions on image processing Ročník 24; číslo 11; s. 3345 - 3356
Hlavní autori:	Ma, Kede, Kai Zeng, Zhou Wang
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	United States IEEE 01.11.2015 The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Predmet:	Algorithms Computational modeling Computer vision Defense industry Image edge detection Image fusion Image processing Image quality image quality assessment Image sequences luminance consistency Mathematical models Matlab Multi-exposure image fusion (MEF) perceptual image processing Prediction algorithms Quality Quality assessment structural similarity subjective evaluations structural similarity perceptual image processing image quality assessment luminance consistency subjective evaluations Multi-exposure image fusion (MEF)
ISSN:	1057-7149, 1941-0042, 1941-0042
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Abstract	Multi-exposure image fusion (MEF) is considered an effective quality enhancement technique widely adopted in consumer electronics, but little work has been dedicated to the perceptual quality assessment of multi-exposure fused images. In this paper, we first build an MEF database and carry out a subjective user study to evaluate the quality of images generated by different MEF algorithms. There are several useful findings. First, considerable agreement has been observed among human subjects on the quality of MEF images. Second, no single state-of-the-art MEF algorithm produces the best quality for all test images. Third, the existing objective quality models for general image fusion are very limited in predicting perceived quality of MEF images. Motivated by the lack of appropriate objective models, we propose a novel objective image quality assessment (IQA) algorithm for MEF images based on the principle of the structural similarity approach and a novel measure of patch structural consistency. Our experimental results on the subjective database show that the proposed model well correlates with subjective judgments and significantly outperforms the existing IQA models for general image fusion. Finally, we demonstrate the potential application of the proposed model by automatically tuning the parameters of MEF algorithms. 1
AbstractList	Multi-exposure image fusion (MEF) is considered an effective quality enhancement technique widely adopted in consumer electronics, but little work has been dedicated to the perceptual quality assessment of multi-exposure fused images. In this paper, we first build an MEF database and carry out a subjective user study to evaluate the quality of images generated by different MEF algorithms. There are several useful findings. First, considerable agreement has been observed among human subjects on the quality of MEF images. Second, no single state-of-the-art MEF algorithm produces the best quality for all test images. Third, the existing objective quality models for general image fusion are very limited in predicting perceived quality of MEF images. Motivated by the lack of appropriate objective models, we propose a novel objective image quality assessment (IQA) algorithm for MEF images based on the principle of the structural similarity approach and a novel measure of patch structural consistency. Our experimental results on the subjective database show that the proposed model well correlates with subjective judgments and significantly outperforms the existing IQA models for general image fusion. Finally, we demonstrate the potential application of the proposed model by automatically tuning the parameters of MEF algorithms.Multi-exposure image fusion (MEF) is considered an effective quality enhancement technique widely adopted in consumer electronics, but little work has been dedicated to the perceptual quality assessment of multi-exposure fused images. In this paper, we first build an MEF database and carry out a subjective user study to evaluate the quality of images generated by different MEF algorithms. There are several useful findings. First, considerable agreement has been observed among human subjects on the quality of MEF images. Second, no single state-of-the-art MEF algorithm produces the best quality for all test images. Third, the existing objective quality models for general image fusion are very limited in predicting perceived quality of MEF images. Motivated by the lack of appropriate objective models, we propose a novel objective image quality assessment (IQA) algorithm for MEF images based on the principle of the structural similarity approach and a novel measure of patch structural consistency. Our experimental results on the subjective database show that the proposed model well correlates with subjective judgments and significantly outperforms the existing IQA models for general image fusion. Finally, we demonstrate the potential application of the proposed model by automatically tuning the parameters of MEF algorithms. Multi-exposure image fusion (MEF) is considered an effective quality enhancement technique widely adopted in consumer electronics, but little work has been dedicated to the perceptual quality assessment of multi-exposure fused images. In this paper, we first build an MEF database and carry out a subjective user study to evaluate the quality of images generated by different MEF algorithms. There are several useful findings. First, considerable agreement has been observed among human subjects on the quality of MEF images. Second, no single state-of-the-art MEF algorithm produces the best quality for all test images. Third, the existing objective quality models for general image fusion are very limited in predicting perceived quality of MEF images. Motivated by the lack of appropriate objective models, we propose a novel objective image quality assessment (IQA) algorithm for MEF images based on the principle of the structural similarity approach and a novel measure of patch structural consistency. Our experimental results on the subjective database show that the proposed model well correlates with subjective judgments and significantly outperforms the existing IQA models for general image fusion. Finally, we demonstrate the potential application of the proposed model by automatically tuning the parameters of MEF algorithms. 1 The subjective database and the MATLAB code of the proposed model will be made available online. Preliminary results of Section III were presented at the 6th International Workshop on Quality of Multimedia Experience , Singapore, 2014. Multi-exposure image fusion (MEF) is considered an effective quality enhancement technique widely adopted in consumer electronics, but little work has been dedicated to the perceptual quality assessment of multi-exposure fused images. In this paper, we first build an MEF database and carry out a subjective user study to evaluate the quality of images generated by different MEF algorithms. There are several useful findings. First, considerable agreement has been observed among human subjects on the quality of MEF images. Second, no single state-of-the-art MEF algorithm produces the best quality for all test images. Third, the existing objective quality models for general image fusion are very limited in predicting perceived quality of MEF images. Motivated by the lack of appropriate objective models, we propose a novel objective image quality assessment (IQA) algorithm for MEF images based on the principle of the structural similarity approach and a novel measure of patch structural consistency. Our experimental results on the subjective database show that the proposed model well correlates with subjective judgments and significantly outperforms the existing IQA models for general image fusion. Finally, we demonstrate the potential application of the proposed model by automatically tuning the parameters of MEF algorithms. super(1) The subjective database and the MATLAB code of the proposed model will be made available online. Preliminary results of Section III were presented at the 6th International Workshop on Quality of Multimedia Experience, Singapore, 2014. Multi-exposure image fusion (MEF) is considered an effective quality enhancement technique widely adopted in consumer electronics, but little work has been dedicated to the perceptual quality assessment of multi-exposure fused images. In this paper, we first build an MEF database and carry out a subjective user study to evaluate the quality of images generated by different MEF algorithms. There are several useful findings. First, considerable agreement has been observed among human subjects on the quality of MEF images. Second, no single state-of-the-art MEF algorithm produces the best quality for all test images. Third, the existing objective quality models for general image fusion are very limited in predicting perceived quality of MEF images. Motivated by the lack of appropriate objective models, we propose a novel objective image quality assessment (IQA) algorithm for MEF images based on the principle of the structural similarity approach and a novel measure of patch structural consistency. Our experimental results on the subjective database show that the proposed model well correlates with subjective judgments and significantly outperforms the existing IQA models for general image fusion. Finally, we demonstrate the potential application of the proposed model by automatically tuning the parameters of MEF algorithms. Multi-exposure image fusion (MEF) is considered an effective quality enhancement technique widely adopted in consumer electronics, but little work has been dedicated to the perceptual quality assessment of multi-exposure fused images. In this paper, we first build an MEF database and carry out a subjective user study to evaluate the quality of images generated by different MEF algorithms. There are several useful findings. First, considerable agreement has been observed among human subjects on the quality of MEF images. Second, no single state-of-the-art MEF algorithm produces the best quality for all test images. Third, the existing objective quality models for general image fusion are very limited in predicting perceived quality of MEF images. Motivated by the lack of appropriate objective models, we propose a novel objective image quality assessment (IQA) algorithm for MEF images based on the principle of the structural similarity approach and a novel measure of patch structural consistency. Our experimental results on the subjective database show that the proposed model well correlates with subjective judgments and significantly outperforms the existing IQA models for general image fusion. Finally, we demonstrate the potential application of the proposed model by automatically tuning the parameters of MEF algorithms. 1
Author	Zhou Wang Ma, Kede Kai Zeng
Author_xml	– sequence: 1 givenname: Kede surname: Ma fullname: Ma, Kede email: k29ma@uwaterloo.ca organization: Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada – sequence: 2 surname: Kai Zeng fullname: Kai Zeng email: kzeng@uwaterloo.ca organization: Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada – sequence: 3 surname: Zhou Wang fullname: Zhou Wang email: zhou.wang@uwaterloo.ca organization: Dept. of Electr. & Comput. Eng., Univ. of Waterloo, Waterloo, ON, Canada
BackLink	https://www.ncbi.nlm.nih.gov/pubmed/26068317$$D View this record in MEDLINE/PubMed
BookMark	eNqFkc9LwzAUx4Mozk3vgiAFL14689KkaQ4eRDYdKCrouWTZq1TaZiYpuP_ejE0PO-jlvXf4fN-v75Dsd7ZDQk6BjgGounqdPY8ZBTFmnDPF6B45AsUhpZSz_VhTIVMJXA3I0PsPSoELyA_JgOU0LzKQR-T6GZ3BZeh1k7zEUIdVcuM9et9iF5LKuuSxb0KdTr6W1vcOk1mr3zGZ9r623TE5qHTj8WSbR-RtOnm9vU8fnu5mtzcPqeE8D6mmAgtTQbHglWCcCWaYrEBkqOgCKkSNBgUizXgx56rQXKOSOi5uNC-AZyNyuem7dPazRx_KtvYGm0Z3aHtfglQZkzJe9T-aqwwKKQoR0Ysd9MP2rouHrCnGMik4i9T5lurnLS7Kpatb7Vblzw8jQDeAcdZ7h9UvArRc21RGm8q1TeXWpijJdySmDjrEjwan6-Yv4dlGWCPi7xwJEQKVfQP0aJx7
CODEN	IIPRE4
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crossref_primary_10_1049_ipr2_13110 crossref_primary_10_1049_ipr2_70127 crossref_primary_10_3390_math12081228 crossref_primary_10_1109_TCE_2020_2985742 crossref_primary_10_1109_TIP_2020_2975984 crossref_primary_10_3788_gzxb20235211_1110003 crossref_primary_10_1016_j_inffus_2025_103594 crossref_primary_10_1109_ACCESS_2022_3233546 crossref_primary_10_1007_s00371_023_02986_9 crossref_primary_10_1109_ACCESS_2020_2975896 crossref_primary_10_1016_j_imavis_2024_105344 crossref_primary_10_1109_TNNLS_2021_3071245 crossref_primary_10_1109_TIP_2022_3189805 crossref_primary_10_1016_j_imavis_2025_105645 crossref_primary_10_1016_j_cag_2024_104089 crossref_primary_10_3390_s25154789 crossref_primary_10_1016_j_eswa_2025_128795 crossref_primary_10_1155_2022_9669142 crossref_primary_10_1007_s00138_021_01175_9 crossref_primary_10_1109_TMM_2025_3535342 crossref_primary_10_1016_j_eswa_2023_121363 crossref_primary_10_3390_s20061597 crossref_primary_10_3390_s25082452 crossref_primary_10_1016_j_micpro_2023_104781 crossref_primary_10_1007_s11801_025_4038_4 crossref_primary_10_1109_ACCESS_2021_3090436 crossref_primary_10_3390_app15031604 crossref_primary_10_1016_j_inffus_2022_09_030 crossref_primary_10_1016_j_neucom_2025_131052 crossref_primary_10_1016_j_neucom_2025_131174 crossref_primary_10_3390_app8091543 crossref_primary_10_1016_j_jvcir_2024_104211 crossref_primary_10_1016_j_inffus_2025_103380 crossref_primary_10_1364_PRJ_522370 crossref_primary_10_1109_TIM_2024_3386922 crossref_primary_10_1007_s11263_020_01418_8 crossref_primary_10_1109_JIOT_2024_3513545 crossref_primary_10_1109_TAI_2023_3339092 crossref_primary_10_1016_j_patcog_2024_110799 crossref_primary_10_1007_s11633_023_1448_2 crossref_primary_10_1016_j_inffus_2020_11_009 crossref_primary_10_1109_TIP_2019_2940678 crossref_primary_10_1007_s42423_025_00175_5 crossref_primary_10_1016_j_eswa_2023_122427 crossref_primary_10_1016_j_image_2025_117276 crossref_primary_10_1016_j_image_2025_117274 crossref_primary_10_1007_s11760_021_02051_9 crossref_primary_10_1016_j_optlaseng_2025_109155 crossref_primary_10_1109_TCE_2022_3200707 crossref_primary_10_1109_TCSVT_2024_3351933 crossref_primary_10_1016_j_inffus_2020_05_002 crossref_primary_10_3390_rs15102624 crossref_primary_10_1016_j_jvcir_2025_104402 crossref_primary_10_1007_s00371_020_01888_4 crossref_primary_10_1016_j_image_2021_116466 crossref_primary_10_1117_1_JEI_31_4_041213 crossref_primary_10_1007_s00371_025_04084_4 crossref_primary_10_1109_TIP_2016_2633863 crossref_primary_10_1007_s11263_022_01666_w crossref_primary_10_1016_j_measurement_2022_111968 crossref_primary_10_3390_app15020701 crossref_primary_10_1109_TCSVT_2024_3460172 crossref_primary_10_1109_TIP_2017_2669840 crossref_primary_10_1109_ACCESS_2022_3207299 crossref_primary_10_1109_TIM_2023_3312475 crossref_primary_10_1016_j_eswa_2025_129664 crossref_primary_10_3389_fnbot_2022_846580 crossref_primary_10_1016_j_imavis_2025_105660 crossref_primary_10_1016_j_eswa_2025_129782 crossref_primary_10_1016_j_inffus_2023_02_031 crossref_primary_10_1016_j_cviu_2023_103736 crossref_primary_10_1016_j_jvcir_2023_103780 crossref_primary_10_3390_drones7090543 crossref_primary_10_1016_j_knosys_2023_111226 crossref_primary_10_1007_s00530_024_01298_9 crossref_primary_10_1016_j_inffus_2023_02_027 crossref_primary_10_1016_j_patcog_2024_110650 crossref_primary_10_1137_22M1543161 crossref_primary_10_1007_s11042_020_09044_9 crossref_primary_10_1109_ACCESS_2020_3043048 crossref_primary_10_1109_TCSVT_2021_3049940 crossref_primary_10_1109_TIM_2023_3267525 crossref_primary_10_1109_TMM_2019_2933333 crossref_primary_10_1109_TMM_2023_3326296 crossref_primary_10_1371_journal_pone_0283096 crossref_primary_10_1016_j_infrared_2019_103039 crossref_primary_10_1109_JSEN_2023_3346642 crossref_primary_10_3390_e25010169 crossref_primary_10_1109_ACCESS_2019_2961626 crossref_primary_10_1007_s11042_024_19813_5 crossref_primary_10_1117_1_JEI_33_5_053016 crossref_primary_10_1007_s11042_022_14210_2 crossref_primary_10_1007_s41095_021_0232_x crossref_primary_10_1016_j_ijleo_2023_171251 crossref_primary_10_1016_j_inffus_2023_02_021 crossref_primary_10_1109_TIP_2018_2799331 crossref_primary_10_1007_s11760_023_02927_y crossref_primary_10_1109_TIP_2017_2685941 crossref_primary_10_1007_s00371_024_03636_4 crossref_primary_10_1016_j_inffus_2022_07_016 crossref_primary_10_3390_s22072457 crossref_primary_10_1109_TIM_2024_3522423 crossref_primary_10_1109_TPAMI_2021_3063604 crossref_primary_10_1016_j_eswa_2024_123722 crossref_primary_10_1109_TIP_2020_2999855 crossref_primary_10_1109_TCSVT_2022_3141578 crossref_primary_10_1109_ACCESS_2024_3403452 crossref_primary_10_3390_s23052498 crossref_primary_10_1109_TIP_2023_3343099 crossref_primary_10_3390_jimaging10010028 crossref_primary_10_1007_s11042_022_11976_3 crossref_primary_10_1007_s11276_024_03716_2 crossref_primary_10_1016_j_eswa_2025_127263 crossref_primary_10_1109_TIM_2024_3497140 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crossref_primary_10_3390_s24134056 crossref_primary_10_1109_ACCESS_2022_3226564 crossref_primary_10_1109_LSP_2025_3602001 crossref_primary_10_1016_j_dsp_2023_104256 crossref_primary_10_1109_TNNLS_2025_3566647 crossref_primary_10_1016_j_dsp_2024_104757 crossref_primary_10_1016_j_neunet_2023_11_014 crossref_primary_10_1007_s11760_024_03519_0 crossref_primary_10_1007_s00034_023_02311_8 crossref_primary_10_1016_j_sigpro_2022_108774 crossref_primary_10_4218_etrij_2024_0294 crossref_primary_10_1016_j_jvcir_2023_103978 crossref_primary_10_1007_s11042_019_08027_9 crossref_primary_10_1007_s00371_023_02880_4 crossref_primary_10_1038_s41598_025_93143_w crossref_primary_10_1007_s10489_024_06044_2 crossref_primary_10_1016_j_inffus_2022_11_010 crossref_primary_10_1016_j_knosys_2025_112998 crossref_primary_10_1109_TIP_2023_3263113 crossref_primary_10_1109_LSP_2022_3162145 crossref_primary_10_1007_s11042_025_20869_0 crossref_primary_10_1117_1_JEI_31_4_043050 crossref_primary_10_1016_j_dsp_2024_104666 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Cites_doi	10.1109/ICCV.1993.378222 10.1109/TIP.2011.2157514 10.1109/97.995823 10.1111/j.1467-8659.2008.01171.x 10.1109/ICASSP.2008.4517750 10.1016/j.inffus.2006.09.001 10.1109/MSP.2008.930649 10.1109/TIP.2012.2207396 10.1016/B978-0-12-372529-5.00017-2 10.1117/12.845312 10.1016/j.imavis.2007.12.002 10.1109/TIP.2014.2349432 10.1007/978-3-642-51590-3_2 10.1049/el:20020212 10.1109/TIP.2011.2170079 10.1109/TIP.2011.2109730 10.1109/TPAMI.2011.109 10.1109/TIP.2005.859378 10.1049/el:20060693 10.1109/ICIP.2006.313136 10.1109/TIP.2015.2428051 10.1016/j.inffus.2005.10.001 10.1109/JSTSP.2009.2015374 10.1016/S0141-9382(02)00069-0 10.1016/j.inffus.2005.04.003 10.1016/j.inffus.2005.05.001 10.1117/12.381668 10.1109/ICIP.2003.1247209 10.1109/TIP.2014.2346028 10.1109/TIP.2006.881959 10.1109/TIP.2012.2221725 10.1016/j.imavis.2005.02.004 10.1109/TCE.2012.6227469 10.1109/TIP.2012.2236346 10.1016/j.jvcir.2012.02.009 10.1109/ACSSC.2003.1292216 10.1109/TIP.2013.2244222 10.1049/el:20081754 10.1109/TIP.2010.2092435 10.1109/TIP.2003.819861
ContentType	Journal Article
Copyright	Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Nov 2015
Copyright_xml	– notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Nov 2015
DBID	97E RIA RIE AAYXX CITATION NPM 7SC 7SP 8FD JQ2 L7M L~C L~D 7X8 F28 FR3
DOI	10.1109/TIP.2015.2442920
DatabaseName	IEEE All-Society Periodicals Package (ASPP) 2005–Present IEEE All-Society Periodicals Package (ASPP) 1998–Present IEEE Electronic Library (IEL) CrossRef PubMed Computer and Information Systems Abstracts Electronics & Communications Abstracts Technology Research Database ProQuest Computer Science Collection Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Academic Computer and Information Systems Abstracts Professional MEDLINE - Academic ANTE: Abstracts in New Technology & Engineering Engineering Research Database
DatabaseTitle	CrossRef PubMed Technology Research Database Computer and Information Systems Abstracts – Academic Electronics & Communications Abstracts ProQuest Computer Science Collection Computer and Information Systems Abstracts Advanced Technologies Database with Aerospace Computer and Information Systems Abstracts Professional MEDLINE - Academic Engineering Research Database ANTE: Abstracts in New Technology & Engineering
DatabaseTitleList	MEDLINE - Academic Technology Research Database Technology Research Database PubMed
Database_xml	– sequence: 1 dbid: NPM name: PubMed url: http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed sourceTypes: Index Database – sequence: 2 dbid: RIE name: IEEE/IET Electronic Library (IEL) url: https://ieeexplore.ieee.org/ sourceTypes: Publisher – sequence: 3 dbid: 7X8 name: MEDLINE - Academic url: https://search.proquest.com/medline sourceTypes: Aggregation Database
DeliveryMethod	fulltext_linktorsrc
Discipline	Applied Sciences Engineering
EISSN	1941-0042
EndPage	3356
ExternalDocumentID	3730579061 26068317 10_1109_TIP_2015_2442920 7120119
Genre	orig-research Journal Article
GroupedDBID	--- -~X .DC 0R~ 29I 4.4 53G 5GY 5VS 6IK 97E AAJGR AARMG AASAJ AAWTH ABAZT ABFSI ABQJQ ABVLG ACGFO ACGFS ACIWK AENEX AETIX AGQYO AGSQL AHBIQ AI. AIBXA AKJIK AKQYR ALLEH ALMA_UNASSIGNED_HOLDINGS ASUFR ATWAV BEFXN BFFAM BGNUA BKEBE BPEOZ CS3 DU5 E.L EBS EJD F5P HZ~ H~9 ICLAB IFIPE IFJZH IPLJI JAVBF LAI M43 MS~ O9- OCL P2P RIA RIE RNS TAE TN5 VH1 AAYXX CITATION NPM RIG 7SC 7SP 8FD JQ2 L7M L~C L~D 7X8 F28 FR3
ID	FETCH-LOGICAL-c446t-a05e8cf18d4f524252c27f153e90d1feeaece5ee0348b498a4ae97a149ca48143
IEDL.DBID	RIE
ISICitedReferencesCount	852
ISICitedReferencesURI	http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000357093600001&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN	1057-7149 1941-0042
IngestDate	Mon Sep 29 05:37:18 EDT 2025 Thu Oct 02 06:14:55 EDT 2025 Mon Jun 30 04:36:53 EDT 2025 Mon Jul 21 05:59:32 EDT 2025 Tue Nov 18 22:11:36 EST 2025 Sat Nov 29 03:20:58 EST 2025 Tue Aug 26 16:40:40 EDT 2025
IsPeerReviewed	true
IsScholarly	true
Issue	11
Keywords	structural similarity perceptual image processing image quality assessment luminance consistency subjective evaluations Multi-exposure image fusion (MEF)
Language	English
License	https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
LinkModel	DirectLink
MergedId	FETCHMERGED-LOGICAL-c446t-a05e8cf18d4f524252c27f153e90d1feeaece5ee0348b498a4ae97a149ca48143
Notes	ObjectType-Article-1 SourceType-Scholarly Journals-1 ObjectType-Feature-2 content type line 14 content type line 23
PMID	26068317
PQID	1692237542
PQPubID	85429
PageCount	12
ParticipantIDs	ieee_primary_7120119 crossref_citationtrail_10_1109_TIP_2015_2442920 proquest_miscellaneous_1793277606 proquest_journals_1692237542 crossref_primary_10_1109_TIP_2015_2442920 proquest_miscellaneous_1693187585 pubmed_primary_26068317
PublicationCentury	2000
PublicationDate	2015-Nov. 2015-11-00 2015-Nov 20151101
PublicationDateYYYYMMDD	2015-11-01
PublicationDate_xml	– month: 11 year: 2015 text: 2015-Nov.
PublicationDecade	2010
PublicationPlace	United States
PublicationPlace_xml	– name: United States – name: New York
PublicationTitle	IEEE transactions on image processing
PublicationTitleAbbrev	TIP
PublicationTitleAlternate	IEEE Trans Image Process
PublicationYear	2015
Publisher	IEEE The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml	– name: IEEE – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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References_xml	– ident: ref3 doi: 10.1109/ICCV.1993.378222 – ident: ref7 doi: 10.1109/TIP.2011.2157514 – ident: ref30 doi: 10.1109/97.995823 – ident: ref5 doi: 10.1111/j.1467-8659.2008.01171.x – ident: ref43 doi: 10.1109/ICASSP.2008.4517750 – ident: ref24 doi: 10.1016/j.inffus.2006.09.001 – ident: ref17 doi: 10.1109/MSP.2008.930649 – ident: ref10 doi: 10.1109/TIP.2012.2207396 – ident: ref35 doi: 10.1016/B978-0-12-372529-5.00017-2 – volume: 7527 start-page: 75271l year: 2010 ident: ref48 article-title: Perceptual quality assessment of color images using adaptive signal representation publication-title: Proc SPIE Human Vis Electron Imag doi: 10.1117/12.845312 – year: 2000 ident: ref32 publication-title: Final report from the video quality experts group on the validation of objective models of video quality assessment – ident: ref26 doi: 10.1016/j.imavis.2007.12.002 – ident: ref49 doi: 10.1109/TIP.2014.2349432 – year: 1984 ident: ref2 article-title: The pyramid as a structure for efficient computation publication-title: Multiresolution Image Processing and Analysis doi: 10.1007/978-3-642-51590-3_2 – ident: ref18 doi: 10.1049/el:20020212 – ident: ref8 doi: 10.1109/TIP.2011.2170079 – ident: ref44 doi: 10.1109/TIP.2011.2109730 – volume: 3 start-page: iii-1160 year: 2005 ident: ref41 article-title: An adaptive linear system framework for image distortion analysis publication-title: Proc IEEE Int Conf Image Process – ident: ref29 doi: 10.1109/TPAMI.2011.109 – ident: ref38 doi: 10.1109/TIP.2005.859378 – ident: ref34 doi: 10.1049/el:20060693 – ident: ref45 doi: 10.1109/ICIP.2006.313136 – start-page: 7 year: 2014 ident: ref16 article-title: Perceptual evaluation of multi-exposure image fusion algorithms publication-title: Proc 6th Int Workshop Quality Multimedia Exper – ident: ref50 doi: 10.1109/TIP.2015.2428051 – ident: ref25 doi: 10.1016/j.inffus.2005.10.001 – ident: ref46 doi: 10.1109/JSTSP.2009.2015374 – ident: ref14 doi: 10.1016/S0141-9382(02)00069-0 – ident: ref21 doi: 10.1016/j.inffus.2005.04.003 – ident: ref15 doi: 10.1016/j.inffus.2005.05.001 – volume: 4051 start-page: 89 year: 2000 ident: ref19 article-title: Objective pixel-level image fusion performance measure publication-title: Proc SPIE Sensor Fusion Archit Algorithms Appl IV doi: 10.1117/12.381668 – start-page: 1 year: 2009 ident: ref6 article-title: Bilateral filter based compositing for variable exposure photography publication-title: Proc Eurographics – ident: ref22 doi: 10.1109/ICIP.2003.1247209 – year: 2013 ident: ref37 publication-title: Applied Statistics and Probability for Engineers – ident: ref47 doi: 10.1109/TIP.2014.2346028 – year: 1993 ident: ref31 publication-title: Methodology for the Subjective Assessment of the Quality of Television Pictures – ident: ref36 doi: 10.1109/TIP.2006.881959 – ident: ref40 doi: 10.1109/TIP.2012.2221725 – ident: ref4 doi: 10.1016/j.imavis.2005.02.004 – ident: ref11 doi: 10.1109/TCE.2012.6227469 – volume: 2 start-page: 178 year: 2005 ident: ref23 article-title: A similarity metric for assessment of image fusion algorithms publication-title: Int J Signal Process – ident: ref13 doi: 10.1109/TIP.2012.2236346 – ident: ref9 doi: 10.1016/j.jvcir.2012.02.009 – start-page: 965 year: 2008 ident: ref20 article-title: A novel image fusion metric based on multi-scale analysis publication-title: Proc IEEE 9th Int Conf Signal Process – year: 2010 ident: ref1 publication-title: High Dynamic Range Imaging Acquisition Display and Image-Based Lighting – ident: ref28 doi: 10.1109/ACSSC.2003.1292216 – ident: ref12 doi: 10.1109/TIP.2013.2244222 – ident: ref33 doi: 10.1049/el:20081754 – ident: ref39 doi: 10.1109/TIP.2010.2092435 – ident: ref27 doi: 10.1109/TIP.2003.819861 – start-page: 2213 year: 2009 ident: ref42 article-title: Quantifying color image distortions based on adaptive spatio-chromatic signal decompositions publication-title: Proc 16th IEEE Int Conf Image Process
SSID	ssj0014516
Score	2.6715672
Snippet	Multi-exposure image fusion (MEF) is considered an effective quality enhancement technique widely adopted in consumer electronics, but little work has been...
SourceID	proquest pubmed crossref ieee
SourceType	Aggregation Database Index Database Enrichment Source Publisher
StartPage	3345
SubjectTerms	Algorithms Computational modeling Computer vision Defense industry Image edge detection Image fusion Image processing Image quality image quality assessment Image sequences luminance consistency Mathematical models Matlab Multi-exposure image fusion (MEF) perceptual image processing Prediction algorithms Quality Quality assessment structural similarity subjective evaluations
Title	Perceptual Quality Assessment for Multi-Exposure Image Fusion
URI	https://ieeexplore.ieee.org/document/7120119 https://www.ncbi.nlm.nih.gov/pubmed/26068317 https://www.proquest.com/docview/1692237542 https://www.proquest.com/docview/1693187585 https://www.proquest.com/docview/1793277606
Volume	24
WOSCitedRecordID	wos000357093600001&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText	1
inHoldings	1
isFullTextHit
isPrint
journalDatabaseRights	– providerCode: PRVIEE databaseName: IEEE/IET Electronic Library (IEL) customDbUrl: eissn: 1941-0042 dateEnd: 99991231 omitProxy: false ssIdentifier: ssj0014516 issn: 1057-7149 databaseCode: RIE dateStart: 19920101 isFulltext: true titleUrlDefault: https://ieeexplore.ieee.org/ providerName: IEEE
link	http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3dS8NADA9u-KAPfmx-VOeo4ItgXb-v9yjicCDig8LeyvWagqDb2FbR_97k2lUfVPCt0Dt6TXLJL5dLAnAmi8LXKiPkJnXmhHHkO1kUKidLgjjHkCymMkVc78T9fTIey4c1uGhyYRDRXD7DS340sfx8qks-KhsIj82VbEFLCFHlajURA244ayKbkXAEwf5VSNKVg8fRA9_hii7JlHFzJi4ATLg9CUyXsi9rZNqr_I40jcUZbv9vrTuwVSNL-6oShV1Yw0kHtmuUadd7eNGBzW8lCLtAOtHcbClpalVP48O-aqp12gRpbZOj69y8z6Z8mmiPXkkF2cOSj9n24Gl483h969QtFRxNft_SUW6EiS68JA-LiL0NX_uiIK2H0s29AlGhxgjRDcIkC2WiQoVSKKInVz8nbLUP7cl0godgu36e537GHazykN5kXpTFSAAqKIi4WlkwWJE21XW9cW578ZIav8OVKfElZb6kNV8sOG9mzKpaG3-M7TLNm3E1uS3orbiX1ptxkXqxJBDErX4tOG1e0zbi2Iia4LQ0Y0i7sfP0xxjSZb4Q9HcWHFSS0Xx_JVBHP6_rGDZ49VUSYw_ay3mJJ7Cu35bPi3mf5Hmc9I08fwK9yu2A
linkProvider	IEEE
linkToHtml	http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LT8MwDLZ4ScCB96M8i8QFiW5tl6zNESEmJsbEYUjcqjR1JSTYEFsR_HvstCscAIlbpThqYif25zixAU5VnodGp4TclEk90Zahl0qhvTRutTMUZDG1TeLai_r9-OFB3c3Aef0WBhHt5TNs8KeN5WcjU_BRWTMK2FypWZiXQoRB-VqrjhlwyVkb25SRFxHwnwYlfdUcdO_4FpdskDHj8kycApiQe9yydcq-7JEtsPI71rQ2p7P6v9GuwUqFLd2LcjGswwwON2C1wplutYvHG7D8LQnhJpBWtHdbCupaZtT4cC_qfJ0ugVrXvtL1rt5fRnye6HafSQm5nYIP2rbgvnM1uLz2qqIKniHPb-JpX2Js8iDORC7Z3whNGOWk91D5WZAjajQoEf2WiFOhYi00qkgTPzn_OaGrbZgbjoa4C64fZlkWplzDKhPUkgYybSNBqFZOzDXageaUtYmpMo5z4YunxHoevkpILgnLJank4sBZ3eOlzLbxB-0m87ymq9jtwMFUekm1HcdJ0FYEg7jYrwMndTNtJI6O6CGOCktD-o3dpz9oSJuFUUSzc2CnXBn1_6cLau_ncR3D4vXgtpf0uv2bfVjimZRPGg9gbvJa4CEsmLfJ4_j1yK7qT6YW798
openUrl	ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Perceptual+Quality+Assessment+for+Multi-Exposure+Image+Fusion&rft.jtitle=IEEE+transactions+on+image+processing&rft.date=2015-11-01&rft.pub=The+Institute+of+Electrical+and+Electronics+Engineers%2C+Inc.+%28IEEE%29&rft.issn=1057-7149&rft.eissn=1941-0042&rft.volume=24&rft.issue=11&rft.spage=3345&rft_id=info:doi/10.1109%2FTIP.2015.2442920&rft.externalDBID=NO_FULL_TEXT&rft.externalDocID=3730579061
thumbnail_l	http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1057-7149&client=summon
thumbnail_m	http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1057-7149&client=summon
thumbnail_s	http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1057-7149&client=summon