Afacan, E., Lourenço, N., Martins, R., & Dündar, G. (2021). Review: Machine learning techniques in analog/RF integrated circuit design, synthesis, layout, and test. Integration (Amsterdam), 77, 113-130. https://doi.org/10.1016/j.vlsi.2020.11.006
Citácia podle Chicago (17th ed.)Afacan, Engin, Nuno Lourenço, Ricardo Martins, a Günhan Dündar. "Review: Machine Learning Techniques in Analog/RF Integrated Circuit Design, Synthesis, Layout, and Test." Integration (Amsterdam) 77 (2021): 113-130. https://doi.org/10.1016/j.vlsi.2020.11.006.
Citácia podľa MLA (8th ed.)Afacan, Engin, et al. "Review: Machine Learning Techniques in Analog/RF Integrated Circuit Design, Synthesis, Layout, and Test." Integration (Amsterdam), vol. 77, 2021, pp. 113-130, https://doi.org/10.1016/j.vlsi.2020.11.006.