Study of mesoporous CdS-quantum-dot-sensitized TiO2 films by using X-ray photoelectron spectroscopy and AFM

CdS quantum dots were grown on mesoporous TiO 2 films by successive ionic layer adsorption and reaction processes in order to obtain CdS particles of various sizes. AFM analysis shows that the growth of the CdS particles is a two-step process. The first step is the formation of new crystallites at e...

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Bibliographic Details
Published in:	Beilstein journal of nanotechnology Vol. 5; no. 1; pp. 68 - 76
Main Authors:	Ghazzal, Mohamed Nawfal, Wojcieszak, Robert, Raj, Gijo, Gaigneaux, Eric M
Format:	Journal Article
Language:	English
Published:	Germany Beilstein-Institut 2014
Subjects:	afm cds Full Research Paper heterojunction Nanoscience Nanotechnology particle size quantum dots tio2 xps particle size quantum dots CdS heterojunction AFM XPS TiO2
ISSN:	2190-4286, 2190-4286
Online Access:	Get full text
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