Study of mesoporous CdS-quantum-dot-sensitized TiO2 films by using X-ray photoelectron spectroscopy and AFM
CdS quantum dots were grown on mesoporous TiO 2 films by successive ionic layer adsorption and reaction processes in order to obtain CdS particles of various sizes. AFM analysis shows that the growth of the CdS particles is a two-step process. The first step is the formation of new crystallites at e...
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| Published in: | Beilstein journal of nanotechnology Vol. 5; no. 1; pp. 68 - 76 |
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| Main Authors: | , , , |
| Format: | Journal Article |
| Language: | English |
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Germany
Beilstein-Institut
2014
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| ISSN: | 2190-4286, 2190-4286 |
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| Abstract | CdS quantum dots were grown on mesoporous TiO
2
films by successive ionic layer adsorption and reaction processes in order to obtain CdS particles of various sizes. AFM analysis shows that the growth of the CdS particles is a two-step process. The first step is the formation of new crystallites at each deposition cycle. In the next step the pre-deposited crystallites grow to form larger aggregates. Special attention is paid to the estimation of the CdS particle size by X-ray photoelectron spectroscopy (XPS). Among the classical methods of characterization the XPS model is described in detail. In order to make an attempt to validate the XPS model, the results are compared to those obtained from AFM analysis and to the evolution of the band gap energy of the CdS nanoparticles as obtained by UV–vis spectroscopy. The results showed that XPS technique is a powerful tool in the estimation of the CdS particle size. In conjunction with these results, a very good correlation has been found between the number of deposition cycles and the particle size. |
|---|---|
| AbstractList | CdS quantum dots were grown on mesoporous TiO
2
films by successive ionic layer adsorption and reaction processes in order to obtain CdS particles of various sizes. AFM analysis shows that the growth of the CdS particles is a two-step process. The first step is the formation of new crystallites at each deposition cycle. In the next step the pre-deposited crystallites grow to form larger aggregates. Special attention is paid to the estimation of the CdS particle size by X-ray photoelectron spectroscopy (XPS). Among the classical methods of characterization the XPS model is described in detail. In order to make an attempt to validate the XPS model, the results are compared to those obtained from AFM analysis and to the evolution of the band gap energy of the CdS nanoparticles as obtained by UV–vis spectroscopy. The results showed that XPS technique is a powerful tool in the estimation of the CdS particle size. In conjunction with these results, a very good correlation has been found between the number of deposition cycles and the particle size. CdS quantum dots were grown on mesoporous TiO2 films by successive ionic layer adsorption and reaction processes in order to obtain CdS particles of various sizes. AFM analysis shows that the growth of the CdS particles is a two-step process. The first step is the formation of new crystallites at each deposition cycle. In the next step the pre-deposited crystallites grow to form larger aggregates. Special attention is paid to the estimation of the CdS particle size by X-ray photoelectron spectroscopy (XPS). Among the classical methods of characterization the XPS model is described in detail. In order to make an attempt to validate the XPS model, the results are compared to those obtained from AFM analysis and to the evolution of the band gap energy of the CdS nanoparticles as obtained by UV–vis spectroscopy. The results showed that XPS technique is a powerful tool in the estimation of the CdS particle size. In conjunction with these results, a very good correlation has been found between the number of deposition cycles and the particle size. CdS quantum dots were grown on mesoporous TiO2 films by successive ionic layer adsorption and reaction processes in order to obtain CdS particles of various sizes. AFM analysis shows that the growth of the CdS particles is a two-step process. The first step is the formation of new crystallites at each deposition cycle. In the next step the pre-deposited crystallites grow to form larger aggregates. Special attention is paid to the estimation of the CdS particle size by X-ray photoelectron spectroscopy (XPS). Among the classical methods of characterization the XPS model is described in detail. In order to make an attempt to validate the XPS model, the results are compared to those obtained from AFM analysis and to the evolution of the band gap energy of the CdS nanoparticles as obtained by UV-vis spectroscopy. The results showed that XPS technique is a powerful tool in the estimation of the CdS particle size. In conjunction with these results, a very good correlation has been found between the number of deposition cycles and the particle size.CdS quantum dots were grown on mesoporous TiO2 films by successive ionic layer adsorption and reaction processes in order to obtain CdS particles of various sizes. AFM analysis shows that the growth of the CdS particles is a two-step process. The first step is the formation of new crystallites at each deposition cycle. In the next step the pre-deposited crystallites grow to form larger aggregates. Special attention is paid to the estimation of the CdS particle size by X-ray photoelectron spectroscopy (XPS). Among the classical methods of characterization the XPS model is described in detail. In order to make an attempt to validate the XPS model, the results are compared to those obtained from AFM analysis and to the evolution of the band gap energy of the CdS nanoparticles as obtained by UV-vis spectroscopy. The results showed that XPS technique is a powerful tool in the estimation of the CdS particle size. In conjunction with these results, a very good correlation has been found between the number of deposition cycles and the particle size. |
| Author | Gaigneaux, Eric M Raj, Gijo Wojcieszak, Robert Ghazzal, Mohamed Nawfal |
| AuthorAffiliation | 3 Institute of Chemistry, University of Sao Paulo, USP, São Paulo, 05508-000, SP, Brazil 1 Institute of Condensed Matter and Nanoscience – Molecules, Solids and Reactivity (IMCN/MOST), Université Catholique de Louvain, Croix du Sud 2/17, 1348 Louvain-La-Neuve, Belgium 2 Université de Namur, Technology Transfert Office, rue de Bruxelles 61 - 5000 Namur, Belgique |
| AuthorAffiliation_xml | – name: 2 Université de Namur, Technology Transfert Office, rue de Bruxelles 61 - 5000 Namur, Belgique – name: 3 Institute of Chemistry, University of Sao Paulo, USP, São Paulo, 05508-000, SP, Brazil – name: 1 Institute of Condensed Matter and Nanoscience – Molecules, Solids and Reactivity (IMCN/MOST), Université Catholique de Louvain, Croix du Sud 2/17, 1348 Louvain-La-Neuve, Belgium |
| Author_xml | – sequence: 1 givenname: Mohamed Nawfal surname: Ghazzal fullname: Ghazzal, Mohamed Nawfal – sequence: 2 givenname: Robert surname: Wojcieszak fullname: Wojcieszak, Robert – sequence: 3 givenname: Gijo surname: Raj fullname: Raj, Gijo – sequence: 4 givenname: Eric M surname: Gaigneaux fullname: Gaigneaux, Eric M |
| BackLink | https://www.ncbi.nlm.nih.gov/pubmed/24605274$$D View this record in MEDLINE/PubMed |
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| Cites_doi | 10.1002/adfm.200801173 10.1007/s11051-012-1140-x 10.1103/PhysRevB.39.10935 10.1016/j.tsf.2011.08.097 10.1016/j.jphotochem.2006.03.025 10.1021/j100063a022 10.1021/jp106956w 10.1002/sia.1188 10.1103/PhysRevB.42.7253 10.1021/jp064817b 10.1016/0021-9517(89)90353-9 10.1021/jp1062226 10.1016/S0368-2048(98)00300-4 10.1063/1.453325 10.1016/j.apsusc.2010.02.015 10.1063/1.3253115 10.1021/j100475a011 10.1002/sia.740210302 10.1002/adfm.200900081 10.1021/nl015685v 10.3762/bjnano.4.27 10.1016/j.apsusc.2013.06.122 10.1021/la400055t 10.1002/sia.740200906 10.1039/c2ce06267d 10.1088/0022-3727/14/9/012 10.1016/j.apcatb.2011.12.016 10.1016/0368-2048(76)80015-1 |
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| Keywords | particle size quantum dots CdS heterojunction AFM XPS TiO2 |
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| SubjectTerms | afm cds Full Research Paper heterojunction Nanoscience Nanotechnology particle size quantum dots tio2 xps |
| Title | Study of mesoporous CdS-quantum-dot-sensitized TiO2 films by using X-ray photoelectron spectroscopy and AFM |
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