Ghazzal, M. N., Wojcieszak, R., Raj, G., & Gaigneaux, E. M. (2014). Study of mesoporous CdS-quantum-dot-sensitized TiO2 films by using X-ray photoelectron spectroscopy and AFM. Beilstein journal of nanotechnology, 5(1), 68-76. https://doi.org/10.3762/bjnano.5.6
Citácia podle Chicago (17th ed.)Ghazzal, Mohamed Nawfal, Robert Wojcieszak, Gijo Raj, a Eric M. Gaigneaux. "Study of Mesoporous CdS-quantum-dot-sensitized TiO2 Films by Using X-ray Photoelectron Spectroscopy and AFM." Beilstein Journal of Nanotechnology 5, no. 1 (2014): 68-76. https://doi.org/10.3762/bjnano.5.6.
Citácia podľa MLA (8th ed.)Ghazzal, Mohamed Nawfal, et al. "Study of Mesoporous CdS-quantum-dot-sensitized TiO2 Films by Using X-ray Photoelectron Spectroscopy and AFM." Beilstein Journal of Nanotechnology, vol. 5, no. 1, 2014, pp. 68-76, https://doi.org/10.3762/bjnano.5.6.