Efficient Contrast Enhancement Using Adaptive Gamma Correction With Weighting Distribution

This paper proposes an efficient method to modify histograms and enhance contrast in digital images. Enhancement plays a significant role in digital image processing, computer vision, and pattern recognition. We present an automatic transformation technique that improves the brightness of dimmed ima...

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Veröffentlicht in:IEEE transactions on image processing Jg. 22; H. 3; S. 1032 - 1041
Hauptverfasser: Huang, Shih-Chia, Cheng, Fan-Chieh, Chiu, Yi-Sheng
Format: Journal Article
Sprache:Englisch
Veröffentlicht: New York, NY IEEE 01.03.2013
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
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ISSN:1057-7149, 1941-0042, 1941-0042
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Abstract This paper proposes an efficient method to modify histograms and enhance contrast in digital images. Enhancement plays a significant role in digital image processing, computer vision, and pattern recognition. We present an automatic transformation technique that improves the brightness of dimmed images via the gamma correction and probability distribution of luminance pixels. To enhance video, the proposed image-enhancement method uses temporal information regarding the differences between each frame to reduce computational complexity. Experimental results demonstrate that the proposed method produces enhanced images of comparable or higher quality than those produced using previous state-of-the-art methods.
AbstractList This paper proposes an efficient method to modify histograms and enhance contrast in digital images. Enhancement plays a significant role in digital image processing, computer vision, and pattern recognition. We present an automatic transformation technique that improves the brightness of dimmed images via the gamma correction and probability distribution of luminance pixels. To enhance video, the proposed image-enhancement method uses temporal information regarding the differences between each frame to reduce computational complexity. Experimental results demonstrate that the proposed method produces enhanced images of comparable or higher quality than those produced using previous state-of-the-art methods.This paper proposes an efficient method to modify histograms and enhance contrast in digital images. Enhancement plays a significant role in digital image processing, computer vision, and pattern recognition. We present an automatic transformation technique that improves the brightness of dimmed images via the gamma correction and probability distribution of luminance pixels. To enhance video, the proposed image-enhancement method uses temporal information regarding the differences between each frame to reduce computational complexity. Experimental results demonstrate that the proposed method produces enhanced images of comparable or higher quality than those produced using previous state-of-the-art methods.
This paper proposes an efficient method to modify histograms and enhance contrast in digital images. Enhancement plays a significant role in digital image processing, computer vision, and pattern recognition. We present an automatic transformation technique that improves the brightness of dimmed images via the gamma correction and probability distribution of luminance pixels. To enhance video, the proposed image-enhancement method uses temporal information regarding the differences between each frame to reduce computational complexity. Experimental results demonstrate that the proposed method produces enhanced images of comparable or higher quality than those produced using previous state-of-the-art methods.
Author Shih-Chia Huang
Yi-Sheng Chiu
Fan-Chieh Cheng
Author_xml – sequence: 1
  givenname: Shih-Chia
  surname: Huang
  fullname: Huang, Shih-Chia
– sequence: 2
  givenname: Fan-Chieh
  surname: Cheng
  fullname: Cheng, Fan-Chieh
– sequence: 3
  givenname: Yi-Sheng
  surname: Chiu
  fullname: Chiu, Yi-Sheng
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https://www.ncbi.nlm.nih.gov/pubmed/23144035$$D View this record in MEDLINE/PubMed
BookMark eNqN0s9rFDEUB_AgFftD74IgAyJ4mTUvP2eOZV1roaCHloKXIZN5002ZyaxJRvC_N-OuFXpQTwnJ5yUk33dKjvzkkZCXQFcAtH5_ffllxSiwFWNMUaGfkBOoBZSUCnaU51TqUoOoj8lpjPeUgpCgnpFjxkEIyuUJ-brpe2cd-lSsJ5-CianY-K3xFsdl8SY6f1ecd2aX3HcsLsw4mixDQJvc5Itbl7bFLbq7bVrgBxdTcO287D0nT3szRHxxGM_IzcfN9fpTefX54nJ9flVaIXgqVW2hqyuhpADDKbK6tZ1RXYtgW47KVth3-VF9ZUAisKrCWiEoZUS2UvAz8m5_7i5M32aMqRldtDgMxuM0xwY4SE21ZPK_qJLL7_ybsoozzSVf6JtH9H6ag89v_qUEVwxYVq8Pam5H7JpdcKMJP5rfWWTw9gBMtGboQw7BxT9OV7XQUmdH986GKcaA_QMB2ixt0eS2aJa2aA5tkUvUoxLrkllCyom74W-Fr_aFDhEf7lGcqwpq_hP9D8F3
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Cites_doi 10.1109/ICSMC.2011.6084119
10.1016/S0031-3203(99)00096-5
10.1016/0734-189X(89)90166-7
10.1109/30.754419
10.1109/TCE.2006.1706495
10.1109/TCE.2008.4637632
10.1109/JSTSP.2008.2011108
10.1049/iet-ipr:20070198
10.1109/TMI.1987.4307791
10.1109/TIM.2009.2016371
10.1109/JDT.2011.2116767
10.1109/TIP.2011.2162419
10.1109/30.580378
10.1109/TCE.2005.1561863
10.1109/83.826787
10.1109/TIP.2011.2109730
10.1016/j.patrec.2007.02.003
10.1109/TIP.2009.2021548
10.1109/TIP.2011.2157513
10.1587/transinf.E93.D.1773
10.1016/j.displa.2009.03.006
10.1109/TIP.2006.877499
ContentType Journal Article
Copyright 2014 INIST-CNRS
Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Mar 2013
Copyright_xml – notice: 2014 INIST-CNRS
– notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Mar 2013
DBID 97E
RIA
RIE
AAYXX
CITATION
IQODW
CGR
CUY
CVF
ECM
EIF
NPM
7SC
7SP
8FD
JQ2
L7M
L~C
L~D
7X8
F28
FR3
DOI 10.1109/TIP.2012.2226047
DatabaseName IEEE Xplore (IEEE)
IEEE All-Society Periodicals Package (ASPP) 1998–Present
IEEE Electronic Library (IEL)
CrossRef
Pascal-Francis
Medline
MEDLINE
MEDLINE (Ovid)
MEDLINE
MEDLINE
PubMed
Computer and Information Systems Abstracts
Electronics & Communications Abstracts
Technology Research Database
ProQuest Computer Science Collection
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts – Academic
Computer and Information Systems Abstracts Professional
MEDLINE - Academic
ANTE: Abstracts in New Technology & Engineering
Engineering Research Database
DatabaseTitle CrossRef
MEDLINE
Medline Complete
MEDLINE with Full Text
PubMed
MEDLINE (Ovid)
Technology Research Database
Computer and Information Systems Abstracts – Academic
Electronics & Communications Abstracts
ProQuest Computer Science Collection
Computer and Information Systems Abstracts
Advanced Technologies Database with Aerospace
Computer and Information Systems Abstracts Professional
MEDLINE - Academic
Engineering Research Database
ANTE: Abstracts in New Technology & Engineering
DatabaseTitleList MEDLINE - Academic
Technology Research Database
Technology Research Database
MEDLINE

Technology Research Database
Database_xml – sequence: 1
  dbid: NPM
  name: PubMed
  url: http://www.ncbi.nlm.nih.gov/entrez/query.fcgi?db=PubMed
  sourceTypes: Index Database
– sequence: 2
  dbid: RIE
  name: IEEE Electronic Library (IEL)
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
– sequence: 3
  dbid: 7X8
  name: MEDLINE - Academic
  url: https://search.proquest.com/medline
  sourceTypes: Aggregation Database
DeliveryMethod fulltext_linktorsrc
Discipline Applied Sciences
Engineering
EISSN 1941-0042
EndPage 1041
ExternalDocumentID 2880909351
23144035
27894757
10_1109_TIP_2012_2226047
6336819
Genre orig-research
Research Support, Non-U.S. Gov't
Journal Article
GroupedDBID ---
-~X
.DC
0R~
29I
4.4
53G
5GY
5VS
6IK
97E
AAJGR
AARMG
AASAJ
AAWTH
ABAZT
ABFSI
ABQJQ
ABVLG
ACGFO
ACGFS
ACIWK
AENEX
AETIX
AGQYO
AGSQL
AHBIQ
AI.
AIBXA
AKJIK
AKQYR
ALLEH
ALMA_UNASSIGNED_HOLDINGS
ASUFR
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
E.L
EBS
EJD
F5P
HZ~
H~9
ICLAB
IFIPE
IFJZH
IPLJI
JAVBF
LAI
M43
MS~
O9-
OCL
P2P
RIA
RIE
RNS
TAE
TN5
VH1
AAYXX
CITATION
AAYOK
IQODW
RIG
CGR
CUY
CVF
ECM
EIF
NPM
7SC
7SP
8FD
JQ2
L7M
L~C
L~D
7X8
F28
FR3
ID FETCH-LOGICAL-c443t-69c1d9846541a30e29bcda6dbe1cb3e6c8efd941f8a15e1288e96e166a4e29543
IEDL.DBID RIE
ISICitedReferencesCount 858
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000318014300015&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
ISSN 1057-7149
1941-0042
IngestDate Sat Sep 27 20:24:21 EDT 2025
Sun Sep 28 03:14:49 EDT 2025
Thu Oct 02 10:04:40 EDT 2025
Mon Jun 30 10:29:42 EDT 2025
Thu Apr 03 06:53:42 EDT 2025
Wed Apr 02 07:26:15 EDT 2025
Sat Nov 29 03:20:50 EST 2025
Tue Nov 18 22:35:39 EST 2025
Tue Aug 26 16:46:50 EDT 2025
IsPeerReviewed true
IsScholarly true
Issue 3
Keywords Computer vision
State of the art
Histogram
gamma correction
Probabilistic approach
Image processing
Brightness
histogram equalization
Probability distribution
Digital image
Pattern recognition
Equalization
Computational complexity
Image method
Image quality
Luminance
Weighting
histogram modification
Contrast enhancement
Image enhancement
Language English
License https://ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html
CC BY 4.0
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c443t-69c1d9846541a30e29bcda6dbe1cb3e6c8efd941f8a15e1288e96e166a4e29543
Notes ObjectType-Article-2
SourceType-Scholarly Journals-1
ObjectType-Feature-1
content type line 14
ObjectType-Article-1
ObjectType-Feature-2
content type line 23
PMID 23144035
PQID 1283436212
PQPubID 23500
PageCount 10
ParticipantIDs crossref_primary_10_1109_TIP_2012_2226047
crossref_citationtrail_10_1109_TIP_2012_2226047
pubmed_primary_23144035
ieee_primary_6336819
proquest_miscellaneous_1315652314
proquest_miscellaneous_1315707525
pascalfrancis_primary_27894757
proquest_journals_1283436212
proquest_miscellaneous_1283273534
PublicationCentury 2000
PublicationDate 2013-03-01
PublicationDateYYYYMMDD 2013-03-01
PublicationDate_xml – month: 03
  year: 2013
  text: 2013-03-01
  day: 01
PublicationDecade 2010
PublicationPlace New York, NY
PublicationPlace_xml – name: New York, NY
– name: United States
– name: New York
PublicationTitle IEEE transactions on image processing
PublicationTitleAbbrev TIP
PublicationTitleAlternate IEEE Trans Image Process
PublicationYear 2013
Publisher IEEE
Institute of Electrical and Electronics Engineers
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: IEEE
– name: Institute of Electrical and Electronics Engineers
– name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
References ref13
ref12
ref15
ref14
ref20
ref11
ref22
ref10
ref21
ref2
ref1
ref17
ref16
ref19
ref18
ref8
ref7
ref9
ref4
ref3
ref6
ref5
References_xml – ident: ref7
  doi: 10.1109/ICSMC.2011.6084119
– ident: ref3
  doi: 10.1016/S0031-3203(99)00096-5
– ident: ref2
  doi: 10.1016/0734-189X(89)90166-7
– ident: ref9
  doi: 10.1109/30.754419
– ident: ref11
  doi: 10.1109/TCE.2006.1706495
– ident: ref13
  doi: 10.1109/TCE.2008.4637632
– ident: ref4
  doi: 10.1109/JSTSP.2008.2011108
– ident: ref14
  doi: 10.1049/iet-ipr:20070198
– ident: ref5
  doi: 10.1109/TMI.1987.4307791
– ident: ref20
  doi: 10.1109/TIM.2009.2016371
– ident: ref22
  doi: 10.1109/JDT.2011.2116767
– ident: ref18
  doi: 10.1109/TIP.2011.2162419
– ident: ref8
  doi: 10.1109/30.580378
– ident: ref10
  doi: 10.1109/TCE.2005.1561863
– ident: ref6
  doi: 10.1109/83.826787
– ident: ref21
  doi: 10.1109/TIP.2011.2109730
– ident: ref12
  doi: 10.1016/j.patrec.2007.02.003
– ident: ref1
  doi: 10.1109/TIP.2009.2021548
– ident: ref17
  doi: 10.1109/TIP.2011.2157513
– ident: ref16
  doi: 10.1587/transinf.E93.D.1773
– ident: ref15
  doi: 10.1016/j.displa.2009.03.006
– ident: ref19
  doi: 10.1109/TIP.2006.877499
SSID ssj0014516
Score 2.6246483
Snippet This paper proposes an efficient method to modify histograms and enhance contrast in digital images. Enhancement plays a significant role in digital image...
SourceID proquest
pubmed
pascalfrancis
crossref
ieee
SourceType Aggregation Database
Index Database
Enrichment Source
Publisher
StartPage 1032
SubjectTerms Algorithms
Applied sciences
Artificial intelligence
Brightness
Computer science; control theory; systems
Contrast enhancement
Data Interpretation, Statistical
Detection, estimation, filtering, equalization, prediction
Digital
Digital images
Entropy
Equations
Exact sciences and technology
gamma correction
histogram equalization
histogram modification
Histograms
Image color analysis
Image contrast
Image Enhancement - methods
Image Interpretation, Computer-Assisted - methods
Image processing
Information, signal and communications theory
Luminance
Mathematical model
Pattern recognition
Pattern recognition. Digital image processing. Computational geometry
Reproducibility of Results
Sensitivity and Specificity
Signal and communications theory
Signal processing
Signal, noise
State of the art
Statistical Distributions
Telecommunications and information theory
Transformations
Video Recording - methods
Title Efficient Contrast Enhancement Using Adaptive Gamma Correction With Weighting Distribution
URI https://ieeexplore.ieee.org/document/6336819
https://www.ncbi.nlm.nih.gov/pubmed/23144035
https://www.proquest.com/docview/1283436212
https://www.proquest.com/docview/1283273534
https://www.proquest.com/docview/1315652314
https://www.proquest.com/docview/1315707525
Volume 22
WOSCitedRecordID wos000318014300015&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
journalDatabaseRights – providerCode: PRVIEE
  databaseName: IEEE Electronic Library (IEL)
  customDbUrl:
  eissn: 1941-0042
  dateEnd: 99991231
  omitProxy: false
  ssIdentifier: ssj0014516
  issn: 1057-7149
  databaseCode: RIE
  dateStart: 19920101
  isFulltext: true
  titleUrlDefault: https://ieeexplore.ieee.org/
  providerName: IEEE
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV3db9QwDI_GxAM8MNj4KIxTkXhBoru2-WjyOMENkNC0h6GdeKnSxNUmsd5019vfPzvNdSDBSby1qtMmtR07seMfY-9zb4xHM0Dw7U0mGpCZbl2TFahKjdRe5hBQS75Xp6d6PjdnO-zjeBYGAELyGRzRZYjl-4Vb01bZVHGuNNX4fFBVajirNUYMCHA2RDZllVXo9m9CkrmZnn87oxyu8ghtocoF4e6hVyNEHjDe7q1RgFeh5Ei7wv_TDsAW__Y8gwU62fu_vj9lT6KnmR4PovGM7UC3z_ai15lGnV7ts8e_lSQ8YD9noaYEviulwlVLu-rTWXdJskEfSEOKQXrs7Q3Nk-kXe31tkXIZJs5Fl15c9ZfpRdhvJcLPVJc3Qmo9Zz9OZuefvmYRfyFzQvA-U8YV3miquFZYnkNpGuet8g0UruGgnIbWG1G02hYS0NBpMAoKpawACh_yF2y3W3TwiqW-0rZt89wa5wWYEu-caxxvJUiD7RM23fChdrE4OWFk_KrDIiU3NTKxJibWkYkJ-zC2uBkKc2yhPSCGjHSRFwmb_MHq8TmdDhaVxHaHG97XUbVXNY6TCzT7RZmwd-NjVEqKtNgOFuuBBv1CycUWGo5LZ0mCuJ2mQqeulAl7OcjefSejCL_---DesEdlQO6gdLlDttsv1_CWPXS3_dVqOUENmutJ0KA7B2AWVQ
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1Rb9QwDLamgQQ8MNgYFMYIEi9IdNc2Sds8TnBjE8dpD4c28VKlSapNYr3pesfvx05zHUhwEm-t6qRJbddO7PgDeJdYpSyaAYJvr2NROxmXjanjFFWplqWVifOoJZNiOi0vL9X5FnwYzsI453zymTuiSx_Lt3Ozoq2yUc55XlKNz3tS4LqnP601xAwIctbHNmURF-j4r4OSiRrNzs4piys7QmuYJ4KQ99CvwT48ytudPfIAK5QeqTv8Qk0PbfFv39PboJOd_xv9E3gcfE123AvHU9hy7S7sBL-TBa3uduHRb0UJ9-D72FeVwL4Yla5a6G7Jxu0VSQe9gPkkA3Zs9S39KdlnfXOjkXLhf53zll1cL6_Yhd9xJcJPVJk3gGo9g28n49nH0zggMMRGCL6Mc2VSq0qquZZqnrhM1cbq3NYuNTV3uSldY5VIm1Kn0qGpK53KXZrnWjgKIPJ92G7nrXsBzBalbpok0cpY4VSGd8bUhjfSSYXtIxit-VCZUJ6cUDJ-VH6ZkqgKmVgRE6vAxAjeDy1u-9IcG2j3iCEDXeBFBId_sHp4TueDRSGx3cGa91VQ7q7CeXKBhj_NIng7PEa1pFiLbt181dOgZyi52EDDcfEsSRA30xTo1mUygue97N0NMojwy79P7g08OJ19nVSTs-mXV_Aw8zgelDx3ANvLxcq9hvvm5_K6Wxx6PfoFDm0YtA
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=Efficient+Contrast+Enhancement+Using+Adaptive+Gamma+Correction+With+Weighting+Distribution&rft.jtitle=IEEE+transactions+on+image+processing&rft.au=HUANG%2C+Shih-Chia&rft.au=CHENG%2C+Fan-Chieh&rft.au=CHIU%2C+Yi-Sheng&rft.date=2013-03-01&rft.pub=Institute+of+Electrical+and+Electronics+Engineers&rft.issn=1057-7149&rft.volume=22&rft.issue=3-4&rft.spage=1032&rft.epage=1041&rft_id=info:doi/10.1109%2FTIP.2012.2226047&rft.externalDBID=n%2Fa&rft.externalDocID=27894757
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=1057-7149&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=1057-7149&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=1057-7149&client=summon