Choi, J. E., Seol, D. H., Kim, C. Y., & Hong, S. J. (2023). Generative Adversarial Network-Based Fault Detection in Semiconductor Equipment with Class-Imbalanced Data. Sensors (Basel, Switzerland), 23(4), 1889. https://doi.org/10.3390/s23041889
Citácia podle Chicago (17th ed.)Choi, Jeong Eun, Da Hoon Seol, Chan Young Kim, a Sang Jeen Hong. "Generative Adversarial Network-Based Fault Detection in Semiconductor Equipment with Class-Imbalanced Data." Sensors (Basel, Switzerland) 23, no. 4 (2023): 1889. https://doi.org/10.3390/s23041889.
Citácia podľa MLA (8th ed.)Choi, Jeong Eun, et al. "Generative Adversarial Network-Based Fault Detection in Semiconductor Equipment with Class-Imbalanced Data." Sensors (Basel, Switzerland), vol. 23, no. 4, 2023, p. 1889, https://doi.org/10.3390/s23041889.