APA (7th ed.) Citation

Yan, A., Li, Z., Cui, J., Huang, Z., Ni, T., Girard, P., & Wen, X. (2023). LDAVPM: A Latch Design and Algorithm-Based Verification Protected Against Multiple-Node-Upsets in Harsh Radiation Environments. IEEE transactions on computer-aided design of integrated circuits and systems, 42(6), 2069-2073. https://doi.org/10.1109/TCAD.2022.3213212

Chicago Style (17th ed.) Citation

Yan, Aibin, Zhixing Li, Jie Cui, Zhengfeng Huang, Tianming Ni, Patrick Girard, and Xiaoqing Wen. "LDAVPM: A Latch Design and Algorithm-Based Verification Protected Against Multiple-Node-Upsets in Harsh Radiation Environments." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems 42, no. 6 (2023): 2069-2073. https://doi.org/10.1109/TCAD.2022.3213212.

MLA (9th ed.) Citation

Yan, Aibin, et al. "LDAVPM: A Latch Design and Algorithm-Based Verification Protected Against Multiple-Node-Upsets in Harsh Radiation Environments." IEEE Transactions on Computer-aided Design of Integrated Circuits and Systems, vol. 42, no. 6, 2023, pp. 2069-2073, https://doi.org/10.1109/TCAD.2022.3213212.