Discrete Nonhomogeneous Poisson Process Software Reliability Growth Models Based on Test Coverage
To incorporate the effect of test coverage, we proposed two novel discrete nonhomogeneous Poisson process software reliability growth models in this article using failure data and test coverage, which are both regarding the number of executed test cases instead of execution time. Because one of the...
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| Veröffentlicht in: | Quality and reliability engineering international Jg. 29; H. 1; S. 103 - 112 |
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Blackwell Publishing Ltd
01.02.2013
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| Abstract | To incorporate the effect of test coverage, we proposed two novel discrete nonhomogeneous Poisson process software reliability growth models in this article using failure data and test coverage, which are both regarding the number of executed test cases instead of execution time. Because one of the most important factors of the coverage‐based software reliability growth models is the test coverage function (TCF), we first discussed a discrete TCF based on beta function. Then we developed two discrete mean value functions (MVF) integrating test coverage and imperfect debugging. Finally, the proposed discrete TCF and MVFs are evaluated and validated on two actual software reliability data sets. The results of numerical illustration demonstrate that the proposed TCF and the MVFs provide better estimation and fitting under comparisons. Copyright © 2012 John Wiley & Sons, Ltd. |
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| AbstractList | To incorporate the effect of test coverage, we proposed two novel discrete nonhomogeneous Poisson process software reliability growth models in this article using failure data and test coverage, which are both regarding the number of executed test cases instead of execution time. Because one of the most important factors of the coverage‐based software reliability growth models is the test coverage function (TCF), we first discussed a discrete TCF based on beta function. Then we developed two discrete mean value functions (MVF) integrating test coverage and imperfect debugging. Finally, the proposed discrete TCF and MVFs are evaluated and validated on two actual software reliability data sets. The results of numerical illustration demonstrate that the proposed TCF and the MVFs provide better estimation and fitting under comparisons. Copyright © 2012 John Wiley & Sons, Ltd. To incorporate the effect of test coverage, we proposed two novel discrete nonhomogeneous Poisson process software reliability growth models in this article using failure data and test coverage, which are both regarding the number of executed test cases instead of execution time. Because one of the most important factors of the coverage-based software reliability growth models is the test coverage function (TCF), we first discussed a discrete TCF based on beta function. Then we developed two discrete mean value functions (MVF) integrating test coverage and imperfect debugging. Finally, the proposed discrete TCF and MVFs are evaluated and validated on two actual software reliability data sets. The results of numerical illustration demonstrate that the proposed TCF and the MVFs provide better estimation and fitting under comparisons. Copyright [copy 2012 John Wiley & Sons, Ltd. To incorporate the effect of test coverage, we proposed two novel discrete nonhomogeneous Poisson process software reliability growth models in this article using failure data and test coverage, which are both regarding the number of executed test cases instead of execution time. Because one of the most important factors of the coverage-based software reliability growth models is the test coverage function (TCF), we first discussed a discrete TCF based on beta function. Then we developed two discrete mean value functions (MVF) integrating test coverage and imperfect debugging. Finally, the proposed discrete TCF and MVFs are evaluated and validated on two actual software reliability data sets. The results of numerical illustration demonstrate that the proposed TCF and the MVFs provide better estimation and fitting under comparisons. Copyright © 2012 John Wiley & Sons, Ltd. [PUBLICATION ABSTRACT] |
| Author | Lu, Minyan Wang, Shuanqi Li, Haifeng Wu, Yumei |
| Author_xml | – sequence: 1 givenname: Shuanqi surname: Wang fullname: Wang, Shuanqi email: Correspondence to: Shuanqi Wang, School of Reliability and Systems Engineering, Beihang University, Beijing, China., wangshuanqi@163.com organization: School of Reliability and Systems Engineering, Beihang University, Beijing, China – sequence: 2 givenname: Yumei surname: Wu fullname: Wu, Yumei – sequence: 3 givenname: Minyan surname: Lu fullname: Lu, Minyan – sequence: 4 givenname: Haifeng surname: Li fullname: Li, Haifeng |
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| References | Pham H. An imperfect-debugging fault-detection dependent-parameter software. International Journal of Automation and Computing 2007; 4(4):325-328. Park J, Lee G, Park JH. A class of discrete time coverage growth functions for software reliability engineering. The Korean Commuications in Statistics 2007; 15(3):497-506. Pham H, Nordmann L, Zhang X. A general imperfect-software-debugging model with S-Shaped fault-detection rate. IEEE Transactions on Reliability 1999; 48(2):169-175. Goel L. Software Reliability Models: Assumptions, Limitations and Applicability. IEEE Transactions on Software Engineering 1985; 11(12):1411-1423. Malaiya YK, Li MN. Software reliability growth with test coverage. IEEE Transactions on Reliability 2003; 51(4):420-426. Yamada S, Tokuno K, Osaki S. Imperfect debugging models with fault introduction rate for software reliability assessment. International Journal of Systems Science 1992; 23(12):2241-2252. Malaiya YK, Li MN, Bieman JM, Karcich R. Software reliability growth with test coverage. IEEE Transcations on Reliability 2002; 51(4):420-426. Park J, Lee G, Park JH. A class of coverage growth functions and its practical application. Journal of the Korean Statistical Society 2008; 1:1-7. Gokhale SS, Trivedi KS. A time/structure based software reliability model. Annals of Software Engineering 1999; 8(1):85-121. Kapur K, Garg B, Kumar S. Contributions to Hardware and Software Reliability. World Scientific: New York, 1999. Shatnawi O. Discrete time NHPP models for software reliability growth phenomenon. The International Arab Journal of Information Technology 2009; 6(2):124-131. Musa JD, Iannino A, Okumoto K. Software Reliability: measurement, prediction, application. McGraw-Hill: New York, 1987. Li H, Wang X, Li Q, Lu M, Zeng M. Software reliability growth model considering imperfect debugging with Logistic testing coverage function. Journal of Computer Research and Development 2006; 41(Suppl.):450-456 in Chinese). Pham H, Zhang Xuemei. NHPP software reliability and cost models with testing coverage. European Journal of Operational Research 2003; 145(2):445-454. Yamada S, Osaki S. Discrete software reliability growth models. Applied Stochastic Models and Data Analysis 1985; 1(1):65-77. Akaike H. A new look at statistical model identification. IEEE Transactions on Automatic Control 1974; 19:716-723. 1985; 1 2006; 41 2002; 51 1999; 48 1987 2008 2007 1996 1995 2007; 4 2009; 6 2004 1992 1991 2008; 1 1999; 8 1985; 11 2003; 51 2003; 145 1992; 23 1974; 19 2007; 15 1999 e_1_2_6_10_1 Park J (e_1_2_6_9_1) 2008; 1 Li H (e_1_2_6_27_1) 2006; 41 e_1_2_6_19_1 Rivers AT (e_1_2_6_14_1) 1995 e_1_2_6_13_1 e_1_2_6_11_1 e_1_2_6_17_1 e_1_2_6_18_1 e_1_2_6_16_1 Park J (e_1_2_6_5_1) 2007; 15 Shatnawi O (e_1_2_6_6_1) 2009; 6 e_1_2_6_21_1 e_1_2_6_20_1 Fujiwara T (e_1_2_6_15_1) 2007 e_1_2_6_8_1 Musa JD (e_1_2_6_12_1) 1987 e_1_2_6_4_1 e_1_2_6_7_1 e_1_2_6_25_1 e_1_2_6_24_1 e_1_2_6_3_1 e_1_2_6_23_1 e_1_2_6_2_1 e_1_2_6_22_1 e_1_2_6_26_1 |
| References_xml | – reference: Pham H. An imperfect-debugging fault-detection dependent-parameter software. International Journal of Automation and Computing 2007; 4(4):325-328. – reference: Musa JD, Iannino A, Okumoto K. Software Reliability: measurement, prediction, application. McGraw-Hill: New York, 1987. – reference: Goel L. Software Reliability Models: Assumptions, Limitations and Applicability. IEEE Transactions on Software Engineering 1985; 11(12):1411-1423. – reference: Park J, Lee G, Park JH. A class of coverage growth functions and its practical application. Journal of the Korean Statistical Society 2008; 1:1-7. – reference: Pham H, Nordmann L, Zhang X. A general imperfect-software-debugging model with S-Shaped fault-detection rate. IEEE Transactions on Reliability 1999; 48(2):169-175. – reference: Shatnawi O. Discrete time NHPP models for software reliability growth phenomenon. The International Arab Journal of Information Technology 2009; 6(2):124-131. – reference: Malaiya YK, Li MN. Software reliability growth with test coverage. IEEE Transactions on Reliability 2003; 51(4):420-426. – reference: Yamada S, Tokuno K, Osaki S. Imperfect debugging models with fault introduction rate for software reliability assessment. International Journal of Systems Science 1992; 23(12):2241-2252. – reference: Park J, Lee G, Park JH. A class of discrete time coverage growth functions for software reliability engineering. The Korean Commuications in Statistics 2007; 15(3):497-506. – reference: Malaiya YK, Li MN, Bieman JM, Karcich R. Software reliability growth with test coverage. IEEE Transcations on Reliability 2002; 51(4):420-426. – reference: Gokhale SS, Trivedi KS. A time/structure based software reliability model. Annals of Software Engineering 1999; 8(1):85-121. – reference: Kapur K, Garg B, Kumar S. Contributions to Hardware and Software Reliability. World Scientific: New York, 1999. – reference: Akaike H. A new look at statistical model identification. IEEE Transactions on Automatic Control 1974; 19:716-723. – reference: Li H, Wang X, Li Q, Lu M, Zeng M. Software reliability growth model considering imperfect debugging with Logistic testing coverage function. Journal of Computer Research and Development 2006; 41(Suppl.):450-456 in Chinese). – reference: Pham H, Zhang Xuemei. NHPP software reliability and cost models with testing coverage. European Journal of Operational Research 2003; 145(2):445-454. – reference: Yamada S, Osaki S. Discrete software reliability growth models. Applied Stochastic Models and Data Analysis 1985; 1(1):65-77. – start-page: 150 year: 2008 end-page: 157 – start-page: 299 year: 2004 end-page: 303 – start-page: 17 year: 2007 end-page: 26 – volume: 23 start-page: 2241 issue: 12 year: 1992 end-page: 2252 article-title: Imperfect debugging models with fault introduction rate for software reliability assessment publication-title: International Journal of Systems Science – volume: 48 start-page: 169 issue: 2 year: 1999 end-page: 175 article-title: A general imperfect‐software‐debugging model with S‐Shaped fault‐detection rate publication-title: IEEE Transactions on Reliability – year: 1987 – start-page: 183 year: 1991 end-page: 191 – volume: 19 start-page: 716 year: 1974 end-page: 723 article-title: A new look at statistical model identification publication-title: IEEE Transactions on Automatic Control – start-page: 299 year: 1996 end-page: 307 – volume: 1 start-page: 65 issue: 1 year: 1985 end-page: 77 article-title: Discrete software reliability growth models publication-title: Applied Stochastic Models and Data Analysis – volume: 145 start-page: 445 issue: 2 year: 2003 end-page: 454 article-title: NHPP software reliability and cost models with testing coverage publication-title: European Journal of Operational Research – volume: 41 start-page: 450 issue: Suppl. year: 2006 end-page: 456 article-title: Software reliability growth model considering imperfect debugging with Logistic testing coverage function publication-title: Journal of Computer Research and Development – start-page: 111 year: 1995 end-page: 120 – start-page: 385 year: 2007 end-page: 392 – volume: 51 start-page: 420 issue: 4 year: 2002 end-page: 426 article-title: Software reliability growth with test coverage publication-title: IEEE Transcations on Reliability – volume: 6 start-page: 124 issue: 2 year: 2009 end-page: 131 article-title: Discrete time NHPP models for software reliability growth phenomenon publication-title: The International Arab Journal of Information Technology – volume: 4 start-page: 325 issue: 4 year: 2007 end-page: 328 article-title: An imperfect‐debugging fault‐detection dependent‐parameter software publication-title: International Journal of Automation and Computing – start-page: 124 year: 1995 end-page: 132 – volume: 51 start-page: 420 issue: 4 year: 2003 end-page: 426 article-title: Software reliability growth with test coverage publication-title: IEEE Transactions on Reliability – volume: 15 start-page: 497 issue: 3 year: 2007 end-page: 506 article-title: A class of discrete time coverage growth functions for software reliability engineering publication-title: The Korean Commuications in Statistics – volume: 11 start-page: 1411 issue: 12 year: 1985 end-page: 1423 article-title: Software Reliability Models: Assumptions, Limitations and Applicability publication-title: IEEE Transactions on Software Engineering – start-page: 1 year: 2008 end-page: 2 – start-page: 254 year: 1992 end-page: 266 – volume: 8 start-page: 85 issue: 1 year: 1999 end-page: 121 article-title: A time/structure based software reliability model publication-title: Annals of Software Engineering – volume: 1 start-page: 1 year: 2008 end-page: 7 article-title: A class of coverage growth functions and its practical application publication-title: Journal of the Korean Statistical Society – year: 1999 – start-page: 111 volume-title: Proceedings of the 4th Software Engineering Research Forum year: 1995 ident: e_1_2_6_14_1 – ident: e_1_2_6_24_1 doi: 10.1109/24.784276 – ident: e_1_2_6_3_1 doi: 10.1109/SSIRI.2008.21 – ident: e_1_2_6_23_1 doi: 10.1080/00207729208949452 – volume: 15 start-page: 497 issue: 3 year: 2007 ident: e_1_2_6_5_1 article-title: A class of discrete time coverage growth functions for software reliability engineering publication-title: The Korean Commuications in Statistics – volume: 1 start-page: 1 year: 2008 ident: e_1_2_6_9_1 article-title: A class of coverage growth functions and its practical application publication-title: Journal of the Korean Statistical Society – ident: e_1_2_6_7_1 doi: 10.1002/asm.3150010108 – ident: e_1_2_6_26_1 doi: 10.1142/S0218539304001531 – ident: e_1_2_6_18_1 doi: 10.1016/S0377-2217(02)00181-9 – ident: e_1_2_6_4_1 doi: 10.1109/ISSRE.2007.17 – ident: e_1_2_6_17_1 doi: 10.1023/A:1018923329647 – ident: e_1_2_6_20_1 doi: 10.1109/TSE.1985.232177 – volume: 41 start-page: 450 year: 2006 ident: e_1_2_6_27_1 article-title: Software reliability growth model considering imperfect debugging with Logistic testing coverage function publication-title: Journal of Computer Research and Development – ident: e_1_2_6_8_1 doi: 10.1109/ISSRE.2008.51 – ident: e_1_2_6_2_1 – ident: e_1_2_6_13_1 doi: 10.1109/ISSRE.1991.145378 – ident: e_1_2_6_19_1 doi: 10.1109/TR.2002.804489 – ident: e_1_2_6_10_1 – ident: e_1_2_6_21_1 doi: 10.1142/4011 – ident: e_1_2_6_11_1 doi: 10.1109/TR.2002.804489 – volume-title: Software Reliability: measurement, prediction, application year: 1987 ident: e_1_2_6_12_1 – ident: e_1_2_6_22_1 doi: 10.1007/s11633-007-0325-8 – start-page: 385 volume-title: Proceedings of the 5th ACIS International Conference on Software Engineering Research year: 2007 ident: e_1_2_6_15_1 – ident: e_1_2_6_16_1 doi: 10.1109/TAC.1974.1100705 – ident: e_1_2_6_25_1 doi: 10.1109/ISSRE.1996.558886 – volume: 6 start-page: 124 issue: 2 year: 2009 ident: e_1_2_6_6_1 article-title: Discrete time NHPP models for software reliability growth phenomenon publication-title: The International Arab Journal of Information Technology |
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| Title | Discrete Nonhomogeneous Poisson Process Software Reliability Growth Models Based on Test Coverage |
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