The power of microscopic nonclassical states to amplify the precision of macroscopic optical metrology

It is well-known that the precision of a phase measurement with a Mach-Zehnder interferometer employing strong classic light can be greatly enhanced with the addition of weak nonclassical light. In the context of quantifying nonclassicality, the amount by which a nonclassical state can enhance preci...

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Bibliographic Details
Published in:npj quantum information Vol. 9; no. 1; pp. 5 - 9
Main Authors: Ge, Wenchao, Jacobs, Kurt, Zubairy, M. Suhail
Format: Journal Article
Language:English
Published: London Nature Publishing Group UK 11.01.2023
Nature Publishing Group
Nature Portfolio
Subjects:
639/766/400/482
639/766/483/1255
639/766/483/481
Classical and Quantum Gravitation
Parameter estimation
Physics
Physics and Astronomy
Power
Quantum Computing
Quantum Field Theories
Quantum Information Technology
Quantum Physics
Relativity Theory
Spintronics
String Theory
ISSN:2056-6387, 2056-6387
Online Access:Get full text
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Summary:It is well-known that the precision of a phase measurement with a Mach-Zehnder interferometer employing strong classic light can be greatly enhanced with the addition of weak nonclassical light. In the context of quantifying nonclassicality, the amount by which a nonclassical state can enhance precision in this way has been termed its ’metrological power’. To-date, the enhancement provided by weak nonclassical states has been calculated only for specific measurement configurations. Here we are able to optimize over all measurement configurations to obtain the maximum enhancement that can be achieved by any single or multi-mode nonclassical state together with strong classical states, for local and distributed quantum metrology employing any linear or nonlinear single-mode unitary transformation. Our analysis reveals that the quantum Fisher information for quadrature-displacement sensing is the sole property that determines the maximum achievable enhancement in all of these different scenarios, providing a unified quantification of the metrological power.
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ISSN:2056-6387
2056-6387
DOI:10.1038/s41534-022-00670-9