On the formulation of closest-point projection algorithms in elastoplasticity-part I: The variational structure

We present in this paper the characterization of the variational structure behind the discrete equations defining the closest‐point projection approximation in elastoplasticity. Rate‐independent and viscoplastic formulations are considered in the infinitesimal and the finite deformation range, the l...

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Vydáno v:International journal for numerical methods in engineering Ročník 53; číslo 2; s. 297 - 329
Hlavní autoři: Armero, F., Pérez-Foguet, A.
Médium: Journal Article
Jazyk:angličtina
Vydáno: Chichester, UK John Wiley & Sons, Ltd 20.01.2002
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ISSN:0029-5981, 1097-0207
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Shrnutí:We present in this paper the characterization of the variational structure behind the discrete equations defining the closest‐point projection approximation in elastoplasticity. Rate‐independent and viscoplastic formulations are considered in the infinitesimal and the finite deformation range, the later in the context of isotropic finite‐strain multiplicative plasticity. Primal variational principles in terms of the stresses and stress‐like hardening variables are presented first, followed by the formulation of dual principles incorporating explicitly the plastic multiplier. Augmented Lagrangian extensions are also presented allowing a complete regularization of the problem in the constrained rate‐independent limit. The variational structure identified in this paper leads to the proper framework for the development of new improved numerical algorithms for the integration of the local constitutive equations of plasticity as it is undertaken in Part II of this work. Copyright © 2001 John Wiley & Sons, Ltd.
Bibliografie:Commission for Cultural, Educational and Scientific Exchange, (1999) U.S.A./Spain - No. 99258
ArticleID:NME278
NSF - No. CMS-9703000
ark:/67375/WNG-MP643H73-F
ONR - No. N00014-96-1-0818
Generalitat de Catalunya - No. 1998 BEA1200042
istex:D208475A5EE42B75EC9D3DCF9FCC493E4673B281
On leave from the Departament de Matemàtica Aplicada III, ETSECCPB, UPC, Barcelona, Spain, during the Fall semester 1999.
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ISSN:0029-5981
1097-0207
DOI:10.1002/nme.278