Poisson noise removal from high-resolution STEM images based on periodic block matching

Scanning transmission electron microscopy (STEM) provides sub-ångstrom, atomic resolution images of crystalline structures. However, in many applications, the ability to extract information such as atom positions, from such electron micrographs, is severely obstructed by low signal-to-noise ratios o...

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Vydáno v:	Advanced structural and chemical imaging Ročník 1; číslo 1; s. 1 - 19
Hlavní autoři:	Mevenkamp, Niklas, Binev, Peter, Dahmen, Wolfgang, Voyles, Paul M, Yankovich, Andrew B, Berkels, Benjamin
Médium:	Journal Article
Jazyk:	angličtina
Vydáno:	Cham Springer International Publishing 25.03.2015 Springer Nature B.V
Témata:	Atomic structure Biological Microscopy Characterization and Evaluation of Materials Chemistry and Materials Science Computer simulation Electron micrographs Electrons Filtration Image acquisition Image resolution Image transmission Imaging and Modeling in Electron Microscopy - Recent Advances Inorganic materials Matching Materials Science Noise Noise levels Noise reduction Periodic structures Scanning transmission electron microscopy Spectroscopy/Spectrometry Periodic search Precision Non-local means 3D transform shrinkage Poisson noise Image denoising Block matching STEM
ISSN:	2198-0926, 2198-0926
On-line přístup:	Získat plný text
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