A Mass Analyzer Based on a Magnetic Mirror

An ion optical analysis of a static mass analyzer, based on a second-order focusing magnetic mirror, was conducted while accounting for aberrations caused by the movement of ions outside the mean plane of the mass analyzer. As part of this study, an optimization algorithm was developed for the four-...

Celý popis

Uloženo v:
Podrobná bibliografie
Vydáno v:Journal of analytical chemistry (New York, N.Y.) Ročník 79; číslo 13; s. 1985 - 1991
Hlavní autoři: Sachenko, V. D., Antonov, A. S.
Médium: Journal Article
Jazyk:angličtina
Vydáno: Moscow Pleiades Publishing 01.12.2024
Springer
Springer Nature B.V
Témata:
Algorithms
Analysis
Analytical Chemistry
Analytical instruments
Approximation
Chemistry
Chemistry and Materials Science
Electrons
Inverse problems
Ion beams
ions
Magnetic fields
Magnetic mirrors
magnetism
Methods
mirrors
Orbits
Sensors
Russia
mass-spectrograph
mass-spectrometer
acceptance
magnetic mirror
resolution
ISSN:1061-9348, 1608-3199
On-line přístup:Získat plný text
Tagy: Přidat tag
Žádné tagy, Buďte první, kdo vytvoří štítek k tomuto záznamu!
Popis
Shrnutí:An ion optical analysis of a static mass analyzer, based on a second-order focusing magnetic mirror, was conducted while accounting for aberrations caused by the movement of ions outside the mean plane of the mass analyzer. As part of this study, an optimization algorithm was developed for the four-dimensional acceptance of the mass analyzer at a fixed resolution, formulated within the framework of the inverse problem.
Bibliografie:ObjectType-Article-1
SourceType-Scholarly Journals-1
ObjectType-Feature-2
content type line 14
content type line 23
ISSN:1061-9348
1608-3199
DOI:10.1134/S1061934824701144