TechMaps: exploring technology relationships through patent information based proximity
Our work provides a novel method for rich information discovery about the evolution of technical fields and company developments through patent relationships. A new exploratory method and graphical tool to discover technology proximity based on patent classification information are introduced. By te...
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| Vydáno v: | Frontiers in research metrics and analytics Ročník 8; s. 1096226 |
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| Médium: | Journal Article |
| Jazyk: | angličtina |
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Frontiers Media S.A
05.07.2023
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| ISSN: | 2504-0537, 2504-0537 |
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| Abstract | Our work provides a novel method for rich information discovery about the evolution of technical fields and company developments through patent relationships. A new exploratory method and graphical tool to discover technology proximity based on patent classification information are introduced. By technology we mean a technical field (defined by an International Patent Classification—IPC—code or a combination of them) or an organization (such as a tech company, research center, or institution). A single data structure is used for characterizing both technical fields and organizations, to visualize them as items of the very same body. This new method generates two graphs: the first graph, the
TechnologyMap
, visualizes technology items in a 2D plot wherein technical fields and companies will appear positioned relative to each other; the. A second graph, the
Focused TechnologyMap
, visualizes technology items with respect to a selected one, the
focus
, which is located in the center of a circle whose radii correspond to the complete set of IPC codes. This article represents the process and algorithms used for production of the graphs, and solidifies the assumptions of validity by presenting two of the many successful test cases to which it was applied. |
|---|---|
| AbstractList | Our work provides a novel method for rich information discovery about the evolution of technical fields and company developments through patent relationships. A new exploratory method and graphical tool to discover technology proximity based on patent classification information are introduced. By technology we mean a technical field (defined by an International Patent Classification—IPC—code or a combination of them) or an organization (such as a tech company, research center, or institution). A single data structure is used for characterizing both technical fields and organizations, to visualize them as items of the very same body. This new method generates two graphs: the first graph, the
TechnologyMap
, visualizes technology items in a 2D plot wherein technical fields and companies will appear positioned relative to each other; the. A second graph, the
Focused TechnologyMap
, visualizes technology items with respect to a selected one, the
focus
, which is located in the center of a circle whose radii correspond to the complete set of IPC codes. This article represents the process and algorithms used for production of the graphs, and solidifies the assumptions of validity by presenting two of the many successful test cases to which it was applied. Our work provides a novel method for rich information discovery about the evolution of technical fields and company developments through patent relationships. A new exploratory method and graphical tool to discover technology proximity based on patent classification information are introduced. By technology we mean a technical field (defined by an International Patent Classification-IPC-code or a combination of them) or an organization (such as a tech company, research center, or institution). A single data structure is used for characterizing both technical fields and organizations, to visualize them as items of the very same body. This new method generates two graphs: the first graph, the , visualizes technology items in a 2D plot wherein technical fields and companies will appear positioned relative to each other; the. A second graph, the , visualizes technology items with respect to a selected one, the , which is located in the center of a circle whose radii correspond to the complete set of IPC codes. This article represents the process and algorithms used for production of the graphs, and solidifies the assumptions of validity by presenting two of the many successful test cases to which it was applied. Our work provides a novel method for rich information discovery about the evolution of technical fields and company developments through patent relationships. A new exploratory method and graphical tool to discover technology proximity based on patent classification information are introduced. By technology we mean a technical field (defined by an International Patent Classification-IPC-code or a combination of them) or an organization (such as a tech company, research center, or institution). A single data structure is used for characterizing both technical fields and organizations, to visualize them as items of the very same body. This new method generates two graphs: the first graph, the TechnologyMap, visualizes technology items in a 2D plot wherein technical fields and companies will appear positioned relative to each other; the. A second graph, the Focused TechnologyMap, visualizes technology items with respect to a selected one, the focus, which is located in the center of a circle whose radii correspond to the complete set of IPC codes. This article represents the process and algorithms used for production of the graphs, and solidifies the assumptions of validity by presenting two of the many successful test cases to which it was applied.Our work provides a novel method for rich information discovery about the evolution of technical fields and company developments through patent relationships. A new exploratory method and graphical tool to discover technology proximity based on patent classification information are introduced. By technology we mean a technical field (defined by an International Patent Classification-IPC-code or a combination of them) or an organization (such as a tech company, research center, or institution). A single data structure is used for characterizing both technical fields and organizations, to visualize them as items of the very same body. This new method generates two graphs: the first graph, the TechnologyMap, visualizes technology items in a 2D plot wherein technical fields and companies will appear positioned relative to each other; the. A second graph, the Focused TechnologyMap, visualizes technology items with respect to a selected one, the focus, which is located in the center of a circle whose radii correspond to the complete set of IPC codes. This article represents the process and algorithms used for production of the graphs, and solidifies the assumptions of validity by presenting two of the many successful test cases to which it was applied. Our work provides a novel method for rich information discovery about the evolution of technical fields and company developments through patent relationships. A new exploratory method and graphical tool to discover technology proximity based on patent classification information are introduced. By technology we mean a technical field (defined by an International Patent Classification—IPC—code or a combination of them) or an organization (such as a tech company, research center, or institution). A single data structure is used for characterizing both technical fields and organizations, to visualize them as items of the very same body. This new method generates two graphs: the first graph, the TechnologyMap, visualizes technology items in a 2D plot wherein technical fields and companies will appear positioned relative to each other; the. A second graph, the Focused TechnologyMap, visualizes technology items with respect to a selected one, the focus, which is located in the center of a circle whose radii correspond to the complete set of IPC codes. This article represents the process and algorithms used for production of the graphs, and solidifies the assumptions of validity by presenting two of the many successful test cases to which it was applied. |
| Author | Loizides, Fernando Perez-Molina, Eduardo |
| AuthorAffiliation | 1 ETSIT, Universidad Politécnica de Madrid , Madrid , Spain 2 School of Computer Science and Informatics, Cardiff University , Cardiff , United Kingdom |
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| Cites_doi | 10.1007/s11192-016-2107-y 10.1007/s10961-011-9207-x 10.1109/VISUAL.2019.8933568 10.5220/0006198505020509 10.1002/asi.23664 10.1016/j.hitech.2003.09.003 10.3386/w1815 10.1016/j.cviu.2010.03.006 10.1007/BF02288916 10.1016/j.techfore.2018.01.019 10.3115/981732.981751 10.1109/TNN.2007.891682 10.1007/s11192-012-0784-8 10.1016/j.respol.2005.08.001 10.1016/j.patrec.2008.05.002 10.1002/asi.23979 10.1109/WMWA.2009.33 10.1109/TKDE.2003.1209005 10.1016/j.patcog.2005.12.005 10.1007/s11192-016-1888-3 10.1186/s12859-019-2780-y 10.1126/science.290.5500.2319 10.1016/0734-189X(85)90055-6 10.13053/cys-18-3-2043 10.1002/asi.10066 |
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| Copyright | Copyright © 2023 Perez-Molina and Loizides. Copyright © 2023 Perez-Molina and Loizides. 2023 Perez-Molina and Loizides |
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| Keywords | technology maps patent databases patent classification technology visualization patent analytics |
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| License | Copyright © 2023 Perez-Molina and Loizides. This is an open-access article distributed under the terms of the Creative Commons Attribution License (CC BY). The use, distribution or reproduction in other forums is permitted, provided the original author(s) and the copyright owner(s) are credited and that the original publication in this journal is cited, in accordance with accepted academic practice. No use, distribution or reproduction is permitted which does not comply with these terms. |
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| Title | TechMaps: exploring technology relationships through patent information based proximity |
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