Decision support in machine vision system for monitoring of TFT-LCD glass substrates manufacturing

•Making an automatic inspection system for TFT-LCD glass substrates manufacturing.•Using wavelet co-occurrence signature from substrate images for feature extraction.•Comparing the performance of CART, optimized SVM and MLP classifiers using SA as the best classifier for proposed automatic inspectio...

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Vydané v:	Journal of process control Ročník 24; číslo 6; s. 1015 - 1023
Hlavní autori:	Yousefian-Jazi, Ali, Ryu, Jun-Hyung, Yoon, Seongkyu, Liu, J. Jay
Médium:	Journal Article
Jazyk:	English
Vydavateľské údaje:	Elsevier Ltd 01.06.2014
Predmet:	Automatic optical inspection system Imbalanced data Parameter optimization Supervised classification Synthetic Minority Over-sampling TEchnique (SMOTE) TFT-LCD glass substrate Synthetic Minority Over-sampling TEchnique (SMOTE) Imbalanced data TFT-LCD glass substrate Parameter optimization Supervised classification Automatic optical inspection system
ISSN:	0959-1524, 1873-2771
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