Decision support in machine vision system for monitoring of TFT-LCD glass substrates manufacturing

•Making an automatic inspection system for TFT-LCD glass substrates manufacturing.•Using wavelet co-occurrence signature from substrate images for feature extraction.•Comparing the performance of CART, optimized SVM and MLP classifiers using SA as the best classifier for proposed automatic inspectio...

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Veröffentlicht in:	Journal of process control Jg. 24; H. 6; S. 1015 - 1023
Hauptverfasser:	Yousefian-Jazi, Ali, Ryu, Jun-Hyung, Yoon, Seongkyu, Liu, J. Jay
Format:	Journal Article
Sprache:	Englisch
Veröffentlicht:	Elsevier Ltd 01.06.2014
Schlagworte:	Automatic optical inspection system Imbalanced data Parameter optimization Supervised classification Synthetic Minority Over-sampling TEchnique (SMOTE) TFT-LCD glass substrate Synthetic Minority Over-sampling TEchnique (SMOTE) Imbalanced data TFT-LCD glass substrate Parameter optimization Supervised classification Automatic optical inspection system
ISSN:	0959-1524, 1873-2771
Online-Zugang:	Volltext
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