Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM

In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under thermal neutron irradiation. The neutron-induced failures were investigated and characterized by event cross-sections, soft-error rate and bitmaps evaluations, leading to an identification of...

Full description

Saved in:
Bibliographic Details
Published in:2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS) pp. 1 - 6
Main Authors: Luza, Lucas Matana, Soderstrom, Daniel, Puchner, Helmut, Alia, Ruben Garcia, Letiche, Manon, Bosio, Alberto, Dilillo, Luigi
Format: Conference Proceeding
Language:English
Published: IEEE 01.04.2020
Subjects:
Diffusion tensor imaging
DRAM
HyperRAM
irradiation
Nanoscale devices
neutron
Neutrons
Radiation effects
Random access memory
SEE
Self-Refresh
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Abstract In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under thermal neutron irradiation. The neutron-induced failures were investigated and characterized by event cross-sections, soft-error rate and bitmaps evaluations, leading to an identification of permanent and temporarily stuck cells, block errors, and single-bit upsets.
AbstractList In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under thermal neutron irradiation. The neutron-induced failures were investigated and characterized by event cross-sections, soft-error rate and bitmaps evaluations, leading to an identification of permanent and temporarily stuck cells, block errors, and single-bit upsets.
Author Bosio, Alberto
Soderstrom, Daniel
Alia, Ruben Garcia
Puchner, Helmut
Dilillo, Luigi
Letiche, Manon
Luza, Lucas Matana
Author_xml – sequence: 1
  givenname: Lucas Matana
  surname: Luza
  fullname: Luza, Lucas Matana
  organization: University of Montpellier,LIRMM,Montpellier,France
– sequence: 2
  givenname: Daniel
  surname: Soderstrom
  fullname: Soderstrom, Daniel
  organization: University of Jyväskylä,Department of Physics,Jyväskylä,Finland
– sequence: 3
  givenname: Helmut
  surname: Puchner
  fullname: Puchner, Helmut
  organization: Cypress Semiconductor,San Jose,USA
– sequence: 4
  givenname: Ruben Garcia
  surname: Alia
  fullname: Alia, Ruben Garcia
  organization: CERN,Engineering Department,Geneva,Switzerland
– sequence: 5
  givenname: Manon
  surname: Letiche
  fullname: Letiche, Manon
  organization: Institut Laue-Langevin,Grenoble,France
– sequence: 6
  givenname: Alberto
  surname: Bosio
  fullname: Bosio, Alberto
  organization: Lyon Institute of Nanotechnology,École Centrale de Lyon,France
– sequence: 7
  givenname: Luigi
  surname: Dilillo
  fullname: Dilillo, Luigi
  organization: University of Montpellier,LIRMM,Montpellier,France
BookMark eNotj81Kw0AURkfQha0-gSDzAolz5_dm4aK0tQaqQhvBXZlM7tBAmsgkLnx7CxY-OGd14Jux637oibFHEDmAKJ5WVbnXaAvMpZAiLwSKAvCKzcBJBKOl_bplz-sYKUwjHyKvjpROvuPv9DOloedlSr5p_dSe_TzP99TFbEcx0Xjkq93i7Y7dRN-NdH_hnH2-rKvla7b92JTLxTYLGnDKSKg6aCO9LETttDRaIDlCBPSNIxVBBpBgyTSNiQpq46zw1sQQpDOEas4e_rstER2-U3vy6fdweaT-AKcURHE
ContentType Conference Proceeding
DBID 6IE
6IL
CBEJK
RIE
RIL
DOI 10.1109/DTIS48698.2020.9080918
DatabaseName IEEE Electronic Library (IEL) Conference Proceedings
IEEE Xplore POP ALL
IEEE Xplore All Conference Proceedings
IEEE Electronic Library (IEL)
IEEE Proceedings Order Plans (POP All) 1998-Present
DatabaseTitleList
Database_xml – sequence: 1
  dbid: RIE
  name: IEEE Xplore
  url: https://ieeexplore.ieee.org/
  sourceTypes: Publisher
DeliveryMethod fulltext_linktorsrc
EISBN 172815426X
9781728154268
EndPage 6
ExternalDocumentID 9080918
Genre orig-research
GroupedDBID 6IE
6IL
CBEJK
RIE
RIL
ID FETCH-LOGICAL-c418t-e03bc452a290b7425408e7e8818ad7e3f12c1216e5dd5f31b5760a65fcc275e83
IEDL.DBID RIE
ISICitedReferencesCount 11
ISICitedReferencesURI http://www.webofscience.com/api/gateway?GWVersion=2&SrcApp=Summon&SrcAuth=ProQuest&DestLinkType=CitingArticles&DestApp=WOS_CPL&KeyUT=000588563400002&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
IngestDate Wed Jul 30 06:12:11 EDT 2025
IsDoiOpenAccess false
IsOpenAccess true
IsPeerReviewed false
IsScholarly false
Language English
LinkModel DirectLink
MergedId FETCHMERGED-LOGICAL-c418t-e03bc452a290b7425408e7e8818ad7e3f12c1216e5dd5f31b5760a65fcc275e83
OpenAccessLink https://cir.nii.ac.jp/crid/1872553967583479040
PageCount 6
ParticipantIDs ieee_primary_9080918
PublicationCentury 2000
PublicationDate 2020-04-01
PublicationDateYYYYMMDD 2020-04-01
PublicationDate_xml – month: 04
  year: 2020
  text: 2020-04-01
  day: 01
PublicationDecade 2020
PublicationTitle 2020 15th Design & Technology of Integrated Systems in Nanoscale Era (DTIS)
PublicationTitleAbbrev DTIS
PublicationYear 2020
Publisher IEEE
Publisher_xml – name: IEEE
Score 1.789636
Snippet In this study, static and dynamic test methods were used to define the response of a self-refresh DRAM under thermal neutron irradiation. The neutron-induced...
SourceID ieee
SourceType Publisher
StartPage 1
SubjectTerms Diffusion tensor imaging
DRAM
HyperRAM
irradiation
Nanoscale devices
neutron
Neutrons
Radiation effects
Random access memory
SEE
Self-Refresh
Title Effects of Thermal Neutron Irradiation on a Self-Refresh DRAM
URI https://ieeexplore.ieee.org/document/9080918
WOSCitedRecordID wos000588563400002&url=https%3A%2F%2Fcvtisr.summon.serialssolutions.com%2F%23%21%2Fsearch%3Fho%3Df%26include.ft.matches%3Dt%26l%3Dnull%26q%3D
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LawIxEB5UeuipLVr6JoceG93sbrLJsdRKPVRELXiTbHZCC6Jl1f7-TtbFUuilkEMIA2FmSL6ZZB4A9x6tl4Uy3BPccDqJyLXSgudWWh0qfkmbVs0mstFIz-dm3ICHQy4MIlbBZ9gN0-ovv1i7XXgq6xkyb4zQTWhmWbbP1aqTfkVkev3ZcJpqZULAVhx1a-JfXVMq0Bic_G-7U-j8ZN-x8QFXzqCBqzbUZYY3bO0ZqZau0yUb4S48ZLNhWYYKA0HEjIZlU1x6PkFPrvQ7608eXzvwNniePb3wuvUBd6nQW45RkrtUxjY2UU7eK9lVGjPUBK-2yDDxInYiFgplUUifiJzchsgq6Z0j8aJOzqG1Wq_wApjTwhGVdjnBcS6sdiaxKjXOS4c-U5fQDqwvPvfVLRY111d_L1_DcZDuPnblBlrbcoe3cOS-th-b8q5SyTfl3417
linkProvider IEEE
linkToHtml http://cvtisr.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwlV1LSwMxEB5qFfSk0opvc_Bo2s1uspscRS0ttktpK_RWstkJCqWVbevvN9kuFcGLkEMIA2FmSL6ZZB4A9xa1FXmsqHVwQ91JRCpjyWimhZa-4pfQvGw2kaSpnE7VsAYPu1wYRCyDz7Dlp-Vffr40G_9U1lbOvFFM7sG-4Dxk22ytKu2XBar9POmNuYyVD9kKg1ZF_qtvSgkbneP_bXgCzZ_8OzLcIcsp1HDRgKrQ8IosLXHKdRfqnKS48U_ZpFcUvsaAFzJxQ5Mxzi0doXXO9Dt5Hj0OmvDWeZk8dWnV_IAazuSaYhBlhotQhyrInP_qLCuJCUoHsDpPMLIsNCxkMYo8FzZimXMcAh0La4wTMMroDOqL5QLPgRjJjKOSJnOAnDEtjYp0zJWxwqBN4gtoeNZnn9v6FrOK68u_l-_gsDsZ9Gf9Xvp6BUde0ttIlmuor4sN3sCB-Vp_rIrbUj3fdNCQwg
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Abook&rft.genre=proceeding&rft.title=2020+15th+Design+%26+Technology+of+Integrated+Systems+in+Nanoscale+Era+%28DTIS%29&rft.atitle=Effects+of+Thermal+Neutron+Irradiation+on+a+Self-Refresh+DRAM&rft.au=Luza%2C+Lucas+Matana&rft.au=Soderstrom%2C+Daniel&rft.au=Puchner%2C+Helmut&rft.au=Alia%2C+Ruben+Garcia&rft.date=2020-04-01&rft.pub=IEEE&rft.spage=1&rft.epage=6&rft_id=info:doi/10.1109%2FDTIS48698.2020.9080918&rft.externalDocID=9080918